From DACEL to DACEL 2: present and Dip. Fisica & DEI – Università di Padova D. Bisello

The present: DACEL in 2007 Evaluation of IBM CMOS8 technology for use in the radiation harsh environment of S-LHC – Impact of bias conditions during X-ray exposure (in progress)‏ Goal: realistic as opposed to worst-case lifetime prediction – DC bias (completed)‏ – Pulsed bias (in progress)‏ – Impact of radiation source type on device response X-ray, Protons, Heavy ions… (in progress)‏ – Publications Paper accepted for publication in NIM-A From L. Gonella et al. NIM-A

The present: DACEL in 2007 (2)‏ Evaluation of IBM CMOS8 technology for use in the radiation harsh environment of S-LHC – Long-term reliability of irradiated oxides (in progress)‏ Goal: investigate long-term effects of irradiation through accelerated electrical stress with – Channel Hot Carrier Stress – Fowler-Nordheim Stress (in progress)‏ » Design of dedicated structures (silicon out in June 2007)‏ – Single Event Gate Rupture Goal: investigate permanent effects due to heavy-ion strikes in ultra-thin gate oxides – Design of dedicated structures (silicon out in June 2007)‏ – Publications Abstract accepted for presentation at RADECS 2007 From M. Silvestri et al. RADECS 2007

The future: DACEL in 2008 Continue work on accurate device lifetime prediction – Further investigate annealing effects Dose rate experiments – Develop a model to extrapolate from accelerated experimental data to operating conditions Continue work on long-term reliability of irradiated devices – From single MOSFETs to more complex circuits – Analyze impact of bias conditions during irradiation on subsequent response to electrical stress

The future: DACEL in 2008 Single Event Effects – Evaluate Single Event Transient (SET) in High- speed logic Evaluation of an optimized power distribution inside a new CMS Tracker for SLHC Study of DC-DC and linear regulators to be operated in strong magnetic and radiation fields

Personel & Budget Bisello 20 % Gerardin 30 Gasperin 30 Silvestri 30 Spiazzi FTE Missioni Interne irraggiamenti a LNL 2 ke riunioni 1.5 ke 3.5 Missioni Estere 5 riunioni al CERN 4ke 2 congressi in Europa 3.5 ke 7.5 Consumo dosimetria per AN ke consumo laboratorio 1 ke Supporto Tecnico : D. Pantano (100%)