EE 235 Presentation 2 Brian Lambson X-PEEM and its applications.

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Presentation transcript:

EE 235 Presentation 2 Brian Lambson X-PEEM and its applications

Key Terms Photoelectron Emission Microscopy (PEEM)

Key Terms Photoelectron Emission Microscopy (PEEM) X-ray Magnetic Circular Dichroism (XMCD)

Key Terms Photoelectron Emission Microscopy (PEEM) X-ray Magnetic Circular Dichroism (XMCD)

Examples of X-PEEM Nolting, F., A. Scholl, et al. (2000). "Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins." Nature 405(6788): Young, A. T., A. Bartelt, et al. (2007). "An Ultrafast X-ray Detection System for the Study of Magnetization Dynamics." AIP Conference Proceedings 879(1):

Element Selectivity Strong absorption peaks allow for element-selective imaging Of particular interest, X-PEEM can image multiple layers of a 3D structure LaFeO3 (antiferromagnet) Cobalt (ferromagnet)

Imaging Exchange Bias Nolting, F., A. Scholl, et al. (2000). "Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins." Nature 405(6788): nm Co / 40nm LaFeO3 grown on SrTiO3 (001) substrate

Time Resolved Images Pump-probe technique is used to image magnetization dynamics The time-resolution is limited by the convoluted length or rise times of both laser and X-ray pulses

Ultrafast Imaging via Streak Camera Young, A. T., A. Bartelt, et al. (2007). "An Ultrafast X-ray Detection System for the Study of Magnetization Dynamics." AIP Conference Proceedings 879(1):

Conclusions X-PEEM is a useful tool for exploring the static and dynamic behavior of magnetic materials Resolution of < 20nm allows for nanoscale applications Element selectivity makes it possible to study interactions between multiple magnetic layers Time resolution on the order of 1-10 ps allows for ultrafast dynamic studies