Calibration of the VA2 B Pal, R Mountain, M Artuso 6/29/2010 Goal: get an absolute calibration of a VA2 channel to measure diamond charge collection.

Slides:



Advertisements
Similar presentations
Hans Henschel 12-Feb-06FCAL Meeting Cracov 1 FLC-PHY3 Frontend Chip Channels18 Gain values16 (adjustable - 300mv/pC … 5V/pC) 1:1, 1:10 (dynamically selectable.
Advertisements

Study of Cross-talk on the MAPMT-to-Hybrid cable.
MPPC readout electoronics
Same Channel Same Satellite. Channel 3B N18 Channel 3B N18 Channel 3B N19 Channel 3B N19 Channel 3B M2 Channel 3B M2 A0 vs A1A0 vs A2A1 vs A2.
Data analysis BTF 23 e 24 mag 05 T1 T2 500MeV electrons Repetition Rate 50 Hz Pulse Duration 1-10 ns Current/pulse 1 to 8 particles σ XY ~2mm Max Electronic.
100[ch] 0.28[ps/ch] 200[ch] 0.54[ps/ch] TDC-calibration.
With Real Detector: The MIP Apollo Go, NCU Taiwan Ped:  ADC cnts MIP: 39.0  12.6 ADC cnts S/N should be better with 3 time samples, better.
Specific requirements for analog electronics of a high counting rate TRD Vasile Catanescu NIHAM - Bucharest CBM 10th Collaboration Meeting Sept 25 – 28,
The NO A APD Readout Chip Tom Zimmerman Fermilab May 19, 2006.
1 Summary on the Wednesday access of BBC FEM 07/28/05 Kazuhisa Yamaura Koutaro Kijima Daisuke Watanabe Misaki Ouchida.
Ryan Badman, M. Artuso, J. Wang, Z. Xing July 7 th, 2010 TIMEPIX Characterization with test pulses with the Syracuse test stand.
LABORATORY 3 Transient Thermal Behavior with Work and Heat Loss.
BTeV RICH HV System. The RICH HV System Power One 24V – 1.2A TNG Matsusada HVPS HPD.
August SGSS front end, Summary August 2008 Edwin Spencer, SCIPP1 SGST Preview SCIPP, UC Santa Cruz Andrey Martchovsky Gregory Horn Edwin Spencer.
FPIX0 Electronic Test Marina Artuso Paul Gelling Jianchun Wang  The system works fine with charge injection calibration  Gain curve, threshold, and noise.
Jianchun Wang Syracuse University 10/16/99 CLEO Meeting Outline DAQ problems solved Recent results Status of DAQ Work to be done.
AR2FL/S and No/Lo Gain followup Campion Anton Mitch.
Time over Threshold Electronics for Neutrino Telescopy George Bourlis + multiplicity.
Lecture 3: Bridge Circuits
Oct, 2000CMS Tracker Electronics1 APV25s1 STATUS Testing started beginning September 1 wafer cut, others left for probing 10 chips mounted on test boards.
Performance test of STS demonstrators Anton Lymanets 15 th CBM collaboration meeting, April 12 th, 2010.
Tests with JT0623 & JT0947 at Indiana University Nagoya PMT database test results for JT0623 at 3220V: This tube has somewhat higher than usual gain. 5×10.
NINO RO chip qualification with the laser test system Sakari and Fadmar.
FCAL R&D in Minsk Group: Sensors and Electronics FCAL Collaboration MPI Munich October 17, 2006, Munich, Germany Presented by Igor Emeliantchik.
Birmingham Irradiations and Charge Collection Measurements Anthony Affolder, Paul Dervan The University of Liverpool, UK ATLAS12 Sensor Testing Meeting.
First results from PADI-2 Mircea Ciobanu CBM Collaboration Meeting March 10 –13, 2009 GSI-Darmstadt FEE1.
Progress on STS CSA chip development E. Atkin Department of Electronics, MEPhI A.Voronin SINP, MSU.
Qualification Test of UFE Board  Schematic diagram of UFE  Board types and current status  Qualification test procedures  VA & UFE test setup 
QGP France sept 2010Sanjoy Pal Performances of the tracking Chambers of the ALICE MUON Spectrometer 1.
MPPC Measurements at LSU Brandon Hartfiel LSU Hardware Group Thomas Kutter, Jessica Brinson, Jason Goon, Jinmeng Liu, Jaroslaw Nowak Sam Reid January 2009.
ScECAL BeamTest Analysis Asian ScECAL Meeting Jan 14 th, 2010 Adil, Satoru Uozumi, DongHee Kim.
Hold signal Variable Gain Preamp. Variable Slow Shaper S&H Bipolar Fast Shaper 64Trigger outputs Gain correction (6 bits/channel) discriminator threshold.
October, 2001CMS Tracker Electronics1 Module studies at IC OUTLINE laboratory setup description, APV I2C settings pulse shape studies (dependence on ISHA,
Development of the Readout ASIC for Muon Chambers E. Atkin, I. Bulbalkov, A. Voronin, V. Ivanov, P. Ivanov, E. Malankin, D. Normanov, V. Samsonov, V. Shumikhin,
P. Aspell PACE 3 design meeting 10,11/10/02 Thursday Analog : Morning : DELTA : Delta architecture, project status..... Paul Front-end design
Valerio Re, Massimo Manghisoni Università di Bergamo and INFN, Pavia, Italy Jim Hoff, Abderrezak Mekkaoui, Raymond Yarema Fermi National Accelerator Laboratory.
PMT Readout and Floor Triggering Charge estimation using the times over the thresholds Event Building and Triggering + multiplicity George Bourlis.
Forward Calorimeter Layer Sum Boards Phase I Upgrade LAr Internal Review J. Rutherfoord 29 May 2015.
Lecture 3: Bridge Circuits
Calibration of the gain and measurement of the noise for the apv25 electronics K. Gnanvo, N. Liyanage, C.Gu, K. Saenboonruang From INFN Italy: E. Cisbani,
1 Calorimeters LED control LHCb CALO meeting Anatoli Konoplyannikov /ITEP/ Status of the calorimeters LV power supply and ECS control Status of.
1 Characterization of the PCA16 CERN, 14 th July 2008 M. Mager, L. Musa.
MPPC mass check Hidetoshi OTONO. Change point ADC Gate width : 6ns => 35ns Gain mesurement without LED.
1 LHCb CALO commissioning meeting Anatoli Konoplyannikov /ITEP/ XCAL commissioning with LED Outline Scan data collected on HCAL and ECAL during.
F Don Lincoln, Fermilab f Fermilab/Boeing Test Results for HiSTE-VI Don Lincoln Fermi National Accelerator Laboratory.
SRS Calibration Michael Phipps, Bob Azmoun, Craig Woody 1.
Status at Glasgow. Pre-qualification Last Thursday pre-qualified 2 modules M-O-040 and M-O-044 Time table to qualification –Visual Inspection and conformation.
US ALCT / AFEB Analog Test Results N.Bondar, T.Ferguson, N.Terentiev* EMU Meeting UCLA 01/10/2003.
1 ECAL/PRS quality check with LED system Outline  Introduction, how to use LED time scan data for a detector quality check;  Last collected data of the.
HT-7 The Calibration factors of ECE in HT-7 Exp2006(Spring) 微波组.
H.Mathez– VLSI-FPGA-PCB Lyon– June , 2012 CSA avec reset pour s-CMS, bruit en temporel (Up-Grade TRACKER) (Asic R&D Version 1)
Diamond Sensor Tests for the CMS BCM Alexandr Ignatenko FCAL collaboration meeting May 7, 2008.
Front End. Charge pre-amp and detector Voltage regulator. TOP side. Detector linear voltage regulator BOTTOM side. Charge pre-amp.
KLOE II Inner Tracker FEE
Acceptance test at Duke
Ch 6.6 Solving Absolute-Value Equations
Michael Lupberger Dorothea Pfeiffer
Setup for measurements with SCT128 in Ljubljana: SCTA128VG chip
Hellenic Open University
UCSB Testing 3 Stereo Modules Tested 1 SS6 Module Tested
مفاهیم بهره وري.
Calorimeter calibrations with Flight Software.
Eric oberla Herve grabas
Classic Linear Design Process
MEG II実験 液体キセノン検出器の建設状況
Series 5300 Lithium Cell Formation System
BUCKEYE has internal shift register which controls calibration
The Ohio State University USCMS EMU Meeting, FNAL, Oct. 29, 2004
Rate of Interest.
Verify chip performance
Presentation transcript:

Calibration of the VA2 B Pal, R Mountain, M Artuso 6/29/2010 Goal: get an absolute calibration of a VA2 channel to measure diamond charge collection

Calibration fixture is replaced by single channel fixture

Single channel fixture schematic 1.0 pF

Channel Gain Channel 141 previously used in diamond measurements

Input Bias Nominal gain from specs is 30 mV/fC, which is ½ of the gain we measured in ch 141. Nominal value value Used Vfp-0.2 to 0.5 V-0.4 V Vfs700 mV Pre_Bias100 mV99.8 mV Sha_Bias22 mV22.3 mV i_buf14 mV13.8 mV

Gain vs. I_buf

To do Calibrate the ADC (have adc/fC now), Check the gain after ADC calibration, Fix the diamond holder, Start studies of “unusual” diamond behavior.