Yu Zhang Vishwani D. Agrawal Auburn University, Auburn, Alabama 36849 5/13/2010 NATW 10 1 A Diagnostic Test Generation System.

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Presentation transcript:

Yu Zhang Vishwani D. Agrawal Auburn University, Auburn, Alabama /13/2010 NATW 10 1 A Diagnostic Test Generation System

Outline 5/13/2010 NATW 10 2 Introduction: Diagnostic ATPG problem Define diagnostic coverage A diagnostic ATPG system Exclusive test Diagnostic fault simulation Experimental results Conclusion

Diagnostic ATPG Problem 5/13/2010 NATW 10 3 Given a combinational circuit and a fault model, find: Test vectors to distinguish between all, or most, fault-pairs. Measure diagnostic coverage of vectors. Present contributions: Define a diagnostic coverage metric. A diagnostic ATPG system using conventional fault- detection tools.

Fault Detection and Diagnosis 5/13/2010 NATW 10 4 Fault detection: Need at least one vector that detects a target fault. Fault diagnosis: Need at least one vector that produced different responses for every pair of faults. CUT DDDD Fault

Coverage 5/13/2010 NATW 10 5 Fault coverage: Number of detected faults FC =──────────────── Number of total faults Diagnostic coverage: Number of groups of detected faults DC =─────────────────────── Number of total faults Where faults in a group produce the same test outputs.

A Diagnostic Test Generation System 5/13/2010 NATW 10 6

Exclusive Test 5/13/2010 NATW 10 7 Given a fault pair, find a vector that either detects only one fault or detects them both at different outputs. Previous work: T. Grüning, U. Mahlstedt, and H. Koopmeiners, “DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits,” Proc. IEEE/ACM Intl. Conf. Computer-Aided Design, pp , Nov V. D. Agrawal and K. K. Saluja, “Antitest, Exclusive Test and Concurrent Test,” Unpublished 2002 manuscript, V. D. Agrawal, D. H. Baik, Y. C. Kim, and K. K. Saluja, “Exclusive Test and its Applications to Fault Diagnosis,” Proc. 16th International Conf. VLSI Design, Jan. 2003, pp. 143–148. A. Veneris, R. Chang, M. S. Abadir, and M. Amiri, “Fault Equivalence and Diagnostic Test Generation using ATPG,” Proc. Int. Symp. Circuits and Systems, 2004, pp. 221–224. Other papers.

Exclusive Test ATPG 5/13/2010 NATW 10 8 Use conventional single-fault ATPG and an ATPG model derived from Boolean difference analysis. A test for a single stuck-at fault on this line is an exclusive test for the fault pair. CUT S-a-1 S-a-0 CUT

Diagnostic Fault Simulator (Example) 5/13/2010 NATW 10 9 Y. Zhang and V. D. Agrawal, “Diagnostic Fault Simulation,” Proc. 11 th IEEE Latin American Test Workshop, March 28-31, 2010.

Experiment results 5/13/2010 NATW Simulation results for c432:

ISCAS85 Benchmark Results 5/13/2010 NATW * Intel Core 2 Duo 2.66GHz, 3GB RAM

Conclusion 5/13/2010 NATW A diagnostic coverage metric is defined. Diagnostic fault simulation uses conventional simulation and incorporates fault dropping. Diagnostic test generation is no more complex than ATPG for single fault. Need efficient fault equivalence checking; similar to redundancy checking by single fault detection ATPG.