Alexei O. Orlov Department of Electrical Engineering University of Notre Dame, IN, USA Temperature dependence of locked mode in a Single-Electron Latch.

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Presentation transcript:

Alexei O. Orlov Department of Electrical Engineering University of Notre Dame, IN, USA Temperature dependence of locked mode in a Single-Electron Latch

Notre Dame research team Experiment: – Dr. Ravi Kummamuru – Prof. Greg Snider – Prof. Gary Bernstein Theory – Mo Liu – Prof. Craig Lent Supported by DARPA, NSF, ONR, and W. Keck Foundation

Outline of presentation  Introduction  Power Gain in nanodevices  Clocked single-electron devices  Bistability for memory  Experiment and simulations  Temperature dependence of bistability and hysteresis loop size  Summary and conclusions

Problems shrinking the current-switch Electromechanical relay Vacuum tubes Solid-state transistors CMOS IC New idea Valve shrinks also – hard to get good on/off Current becomes small - resistance becomes high Hard to turn next switch Charge becomes quantized Power dissipation threatens to melt the chip! Quantum Dots

How to make a power amplifier using quantum wells? energy x Clock Small Input Applied Clock Applied Input Removed but Information is preserved! 0 Keyes and Landauer, IBM Journal of Res. Dev. 14, 152, 1970

Quantum-dot Cellular Automata A cell with 4 dots Tunneling between dots Polarization P = +1 Bit value “1” 2 extra electrons Polarization P = -1 Bit value “0” Neighboring cells tend to align. Coulomb coupling Current switch Charge configuration Old Paradigm New Paradigm

Clocking for single-electron logic: Quantum-dot Cellular Automata and Parametrons  Clocked QCA : Lent et al., Physics and Computation Conference, Nov  Parametron: Likharev and Korotkov, Science 273, 763, 1996 Metallic or molecular dots (parametron): Clocking achieved by modulating energy of third state directly P= +1P= –1Null State Semiconductor dots (QCA): Clocking achieved by modulating barriers between dots

NanoDevices Group 1 st evaporation 2 nd evaporation Resulting Pattern Oxidation Metal “dot” fabrication process Aluminum Tunnel junction technology combining E beam lithography with a suspended mask technique and double angle evaporation Oxide layer between two layers of Aluminum forms tunnel junctions.

Ultra-sensitive electrometers for QCA  Sub-electron charge detection is needed  Single-electron transistors are the best choice SET electrometers can detect «1% of elementary charge.

Single-Electron Latch: a Building Block Layout And Measurement Setup +V IN ~ A VgVg SEM Micrograph of SE latch MTJ D3 D1 D2 +V IN 1m1m Electrometer MTJ=multiple tunnel junction The third, middle dot acts as an adjustable barrier for tunneling

(0,0,0) neutral Animated three-dot SE latch operation + (0,0,0)  (0,-1,1) switch to “1” - V CLK - V IN + V IN V CLK =0 (0,-1,1) storage of “1”(0,0,0)  (0,-1,1) back to neutral D1D1 D3D3 D2D2 - V IN =0 + V IN =0  Clock signal >> Input signal  Clock supplies energy, input defines direction of switching  Three states of SE latch: “0”, “1” and “neutral” Bit can be detected

Experiment: Single-Electron Latch in Action  Weak input signal sets the direction of switching  Clock drives the switching  Bistable Switch + Inverter demonstrated  Memory Function demonstrated D1 D2 D3 E1 +V IN -V IN V CLK Latch SET electrometer Switch to “1” Hold “1” Switch to “neutral” Switch to “0” Hold “0” Switch to “neutral” Input Clock “High” T=100 mK

How temperature affects bistability? region suitable for latch operation Binary “1” Binary “0” 2 level switch with memory = there must be a Hysteresis SEL operates T=100 mK Charging energy consideration E C ≥10 kT, E C =0.8 meV (9.3 K) What is the highest operating temperature? Zero K calculations were performed before –Korotkov et al. (1998) –Toth et al. (1999)

Sweeping input bias ECEC -e  V 0 eVeV ECEC ECEC ECEC 0 eVeV ECEC ECEC 0 eVeV ECEC ECEC -e 2  C in 0  e 2  C in ECEC V IN (mV) V D1 (mV) Equilibrium Border V CLK =0 V IN - V IN + D1 ECEC -0 0 00 ECEC -e  V 0 eVeV ECEC ECEC ECEC 0 eVeV ECEC ECEC 0 eVeV ECEC ECEC -e 2  C in 0  e 2  C in ECEC Assume Coulomb barrier is the same for hops between adjacent dots

How bistabile behavior scales with temperature? Thermal energy surmounts Coulomb barrier Hysteresis loop shrinks and then disappears ECEC e×(-  V) 0 e×(+  V) ECEC kT

Hysteresis loop change with Temperature T=90 mK T=160 mK T=320 mK Calculations performed using time dependent master equation for orthodox theory of Coulomb blockade

Bistability area vs kT Relative loop size  V/V 0 Calculations represent ensemble averaging = averaging over multiple scans At T >300 mK no bistability is observed Bistability disappears for kT ~ W/30, where W is Coulomb barrier At T=>0 (  V/V 0 )>1, it means that system becomes multistable V0V0 VV

Summary & Conclusions  Temperature dependence of bistable switching in Single- Electron Latch is studied experimentally  Theoretical calculations using time-dependent master equation are performed  Hysteresis loop size vs temperature is studied  Bistability disappears as kT reaches E C /30  For 300K operation W ~ 30 kT≈1 eV  The real world applications can be implemented using “molecular assembly line” once technology becomes available VcVc Metal-dot Single-Electron Latch Molecular Single-Electron Latch

Measured and calculated charging diagrams Charging diagram is a 3D plot (gray scale map) of dot potential vs input and clock bias White is positive, black is negative Calculated data are superimposed with measured

Single-Electron Latch in Action Two electrometers are used Both are connected to end dots