RF Reconfiguration and Testing Rashad Ramzan and Jerzy Dabrowski Linköping University Dept. of Electrical Engineering SE Linköping, Sweden

2 Linkoping, OCT 4, 2006 Outline Testable LNA RF-DC Detector Offset-Loopback Summary, Future Planes

3 Linkoping, OCT 4, 2006 Recent Chip: RF Sampling Frontend A 1.4V, 25mW Wideband Testable LNA in 0.13  m CMOS

4 Linkoping, OCT 4, 2006

5 Recent Chip: RF Sampling Frontend

6 Linkoping, OCT 4, 2006 Resent Chip: RF Sampling Frontend  Due to “PCB” we are not able to measure NF at high frequencies?  Traces are not even.  FR4 not good for >1GHz  Connector Pad parasitics & impedance discontinuities  Remedy: We are working on it ……..  New PCB with Rogers not FR4 or Thin Film Technology  TRL calibration

7 Linkoping, OCT 4, 2006 RF Testing- RF to DC Detector  Idea! Only from DC measurements.  All catastrophic faults can be detected.  Some of parametric faults.  Performance parameter like Gain, 1dB CP  And may be NF & IP3  Calibration of Detectors with DC/Low voltage signals only

8 Linkoping, OCT 4, 2006 RF Testing- Offset Loopback Base Band Processor LPF DAC LPF LNA LO Amp T r a n s m i t t e r R e c e i v e r (zero-IF) TA Test x test ADC I Q 90 0 IQ I Q IQ offset mixer IQ test signal QPSK is the simplest implementation but others can be used as well Test setup using IQ offset mixer for shared LO f ff Tx band Rx band f Tx f Rx

9 Linkoping, OCT 4, 2006 RF Testing- Offset Loopback Test setup using IQ offset mixer for shared LO  = 16 0  =5 0 (skew) Tx I Tx Q Rx Q Rx I

10 Linkoping, OCT 4, 2006 Future Planes New board for complete Chip measurements. Test for Transceivers with polar modulator (shared LO) multistandard Transceivers. (with Phillips)  On-Chip phase noise measurements