Semiconductor Materials and Device Characterization

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Semiconductor Materials and Device Characterization

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Semiconductor Materials and Device Characterization 半導體量測技術 Semiconductor Materials and Device Characterization Topic 7: time-of-flight technique and carrier mobility Instructor: Dr. Yi-Mu Lee Department of Electronic Engineering National United University

Review and new topics: Charge pumping method (p. 379) Haynes-Shockley experiment (time of flight) Photoelectric effect (time of flight) Introduction to mobility Presentation: 12/29 = 3 students 01/05 = 5 students Final exam: (3:00pm~5:30pm)

Time-of-flight (drift mobility)

QA

Mobility MOSFET mobility Effective mobility Field-effect mobility Time-of-flight or drift mobility Mobility and carrier velocity at high E-field

D. K. Schroder, p. 540

D. K. Schroder, p. 541

D. K. Schroder, p. 541

D. K. Schroder, p. 541

D. K. Schroder, p. 542~543

D. K. Schroder, p. 541 Continue to study p. 545

D. K. Schroder, p. 547

D. K. Schroder, p. 548

D. K. Schroder, p. 549

D. K. Schroder, p. 549

Continue to study p. 551 D. K. Schroder, p. 550

Review suggested 8.4 8.5 8.6 8.8 (in D. K. Schroder) 8.4 8.5 8.6 8.8 (in D. K. Schroder) *You are welcome to submit the above homework to get extra bonus for your semester grade!! **These questions are still in the range of final exam!!