Built-In Self-Test for 3 rd - Generation Mobile Users John Sunwoo Electrical and Computer Engineering Department Auburn University, AL.

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Presentation transcript:

Built-In Self-Test for 3 rd - Generation Mobile Users John Sunwoo Electrical and Computer Engineering Department Auburn University, AL

2 Smart Phones Smart Phones ► Download mp3 files and listen. ► Online shopping ► Online gaming ► GPS ► Mobile pay ► Wireless Key ► Start the car

3 Paying School Tuition Are you sure you are paying $5,000, not $50,000?

4 Near future

5 Objective ► Extensive usage of data transmissions via mobile devices  Tx/Rx of critical data ► Make sure your mobile phone has no fault  Users need to have access to high-level functional test  The testing operation should be easy ► BIST for users

6 History of mobile communications - 2G has limited data capability

7 Cellular network - Base station is located each cell - Base station has physical connection to phone/data line - One user connect to other users via base stations

8 TDMA vs CDMA ► TDMA: Time Division Multiple Access  Allows a number of users to access RF channel without interference by allocating unique time slots to each user within each channel ► CDMA: Code Division Multiple Access  Every communicator will be allocated the entire channel all the time by having different code than the others

9 2G to 3G… Test challenges? ► 3G testing are related to the fact that it is fundamentally different than testing 2G networks ► Adjustment with just a power meter. (2G) ► Scan multiple neighboring base stations for interference that may affect network performance. (3G)

10 Case Study

11 Model ► Samsung SPH-I500 PDA Phone ► $500 ~ $600 ► CDMA 800Mhz/1900Mhz ► Built-in memory 32MB

12 USB Interface

13 Inside ► CDMA Processor ► Base band-to-radio frequency transmit processor ► IF-to-base band processor ► RF-to-IF processor

14 My BIST Approach ► Test control: Via USB ► TPG: CDMA processor ► ORA: CDMA processor ► DUT: Transceiver circuitry  RFT3100 -> Power amplifier -> RFR3300 -> IFR3300

15 Plan -BIST start -No need of additional hardware within certain assumptions. (Making assumptions means the design is could be very vague) -Is it an effective test? (Diagnostic resolution)

16 How did others tested RF device? ► Dr. Chatterjee  Test point insertion algorithm for determining the best nodes for sensor insertion  Sensors outputs can predict system and module specifications  Area overhead < 15%

17 Dr. Dabrowski (Sweden)

18 Drawbacks ► John have never took RF classes. (Major) ► Qualcomm never responds my for asking the actual data sheet of the MSM5100 modem.

19 Conclusions ► The applicability of the presented BIST has only for the higher-level model  Mainly useful for hard faults such as spot defects rather than parametric faults.  Only applicable in a stable production process or after the production. ► Exactly what consumer want

20 Good and Bad ► Avoids affecting the internal RF parts to noise or external disturbances. ► Fault diagnosis is not possible.

21 Future work ► Bluetooth Testing  2.4GHz  No published paper on Bluetooth BIST