NeSSI AND ANALYZERS NeSSI AND ANALYZERS ISSUES AND DISCUSSION REGARDING THE SAM CONCEPT FROM THE ANALYZER SUPPLIERS PERSPECTIVE

NESSI GENERATION I b LIMITED PASSIVE COMPONENTS b LIMITED ACTIVE / SENSOR COMPONENTS b VIRTUALLY NO SMART COMPONENTS

NeSSI GENERATION I b COMPONENTS BASED ON SEMICONDUCTOR AVAILABILITY b GENERAL PURPOSE b PREMIUM $ b PURE GASES b LIQUID SERVICE COMPATIBILITY b SENSOR I/O GENERALLY LIMITED TO ANALOG HARDWARE WHERE HAZARDOUS AREA CLASS IS APPLICABLE b PRESSURE XMITTER b TEMPERATURE XMITTER b FLOW XMITTER

NeSSI GENERATION I b AT-LINE VAPOR SAMPLE VALIDATION SYSTEM b SOLID SUBSTRATE b SEMICON COMPONENTS b INDUSTRIAL SENSORS b ANALOG b LIBERTIES TAKEN - DIV 2

NeSSI GENERATION II b INDUSTRIAL - CENTRIC COMPONENTS NOW AVAILABLE AND NUMBERS GROWING b MODULAR SUBSTRATES b DISCUSSION OF BUS BASED SENSORS b CONCEPTS ON SENSOR INTELLIGENCE BEING DEVELOPED b INTERFACE? HOW? WHERE? WHY? WHEN?

NeSSI GENERATION II b SAM b DEVICENET / SDS / OTHERS b ETHERNET IP b INDUSTRIAL GRADE b HAZARDOUS LOCATION - ZONE/DIVISION I b HEATING b ELECTRO / MECHANICAL DEVICES

NeSSI GENERATION II b HOW? b AT THE GII LEVEL, FLEXIBILITY WILL BE THE KEY b AVAILABLE SENSORS MAY BE MIXED MODE b ANALOG HAZARDOUS LOCATION b ANALOG I.S. b DEVICENET b CAN OPEN

NeSSI GENERATION II b HOW? b THE SAM WILL LIKELY NEED CAPABLE OF INTERFACING MIXED MODE SENSORS INTO ANY CUSTOMER COMMUNICATION PROTOCOL TRANSMITTED TO NUMEROUS HMI DEVICES AND DISTRIBUTED CONTROL SYSTEM PROTOCOLS

NeSSI GENERATION II b WHERE? b LOCAL INTERFACE FOR TROUBLESHOOTING b REMOTE FOR MONITORING AND DATA ARCHIVAL

NeSSI GENERATION II b WHY? b TO MONITOR SHS FUNCTION b TO ARCHIVE SHS OPERATIONAL DATA b TO ADJUST SHS ACTIVE SENSORS IF APPLICABLE

NeSSI GENERATION II b WHY? b MAINTAINABILITY b MAINTENANCE EFFICIENCY b PROVE THE TECHNOLOGY b STUDY COST TO BENEFIT ISSUES

NeSSI GENERATIONS II & III b ANALYZER TYPES b TRANSMITTER / SENSOR b SIMPLE ANALYSIS b HIGHER LEVEL

NeSSI GENERATIONS II & III b ANALYZER INTEGRATION b Most transmitter and simple analyzers do not feature the horsepower to support external SAM issues b Higher level analyzers are manufacturer optimized for their primary goal - providing a solid compositional measurement b This is a market driven definition

NeSSI GENERATIONS II & III b Addition of a flexible sensor interface to the higher level analyzer will mean $$$$ b Sample systems have personalities b Additional Hardware = Additional Space

NeSSI GENERATION II & III b I/O is already on the market b I/O already has a developed base b I/O offers the flexibility on INPUT and OUTPUT requirements for our customers b I/O can meet the requirements for the area in which it is installed b I/O can offer intelligence for active sensors via single loop controllers where needed

NeSSI GENERATION II & III b From the analyzer manufacturers perspective, the market will need to prove the cost to benefit issues regarding internal flexible I/O and control b Reinvent the wheel? b The solution needs to be engineered on the basis of the goal: Data b Future? Control… Intelligence… Reliability!