1 Secondary Emission Beam Profile Monitor H. Haseroth, CERN.

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Presentation transcript:

1 Secondary Emission Beam Profile Monitor H. Haseroth, CERN

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, SEM (Secondary Emission Monitor)-grids

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28,

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28,

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, “SEM-fils”

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28,

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28,

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28,

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, With in/out movement

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28,

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, With in/out movement

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, Shielding

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, micro m diameter W Sensitivity: 10e7 to 10e13 protons / pulse integrated over one turn (1 bunch to several) Integration time >> one turn Price: 40 to 50 kCHF for existing step size (0.5 mm) (16 to 32 channels) (If lower step wanted: can be mounted with an angle) No movement Specifications:

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, Width 80 mm aperture Fixed installation Could be borrowed (?) for 2 x 32 channels No Hg wanted! + 20 kCHF if movement needed (in/out) Every 0.5 mm one amplifier/integrator: 160 channels: expensive!

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, Signal output

H. Haseroth Targetry Collaboratio9n Meeting May 27 – 28, Thank you