Spring 08, Jan 31.. ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Timing Simulation and STA Vishwani D. Agrawal.

Slides:



Advertisements
Similar presentations
Spring 08, Mar 11 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Zero - Skew Clock Routing Vishwani D. Agrawal.
Advertisements

Mar. 23, 2001VLSI Test: Bushnell-Agrawal/Lecture 201 Lecture 20 Delay Test n Delay test definition n Circuit delays and event propagation n Path-delay.
ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES Logic Simulation.
Copyright Agrawal & Srivaths, 2007 Low-Power Design and Test, Lecture 3 1 Low-Power Design and Test Logic-Level Power Estimation Vishwani D. Agrawal Auburn.
Fall 06, Sep 19, 21 ELEC / Lecture 6 1 ELEC / (Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic.
1 Lecture 20 Delay Test n Delay test definition n Circuit delays and event propagation n Path-delay tests  Non-robust test  Robust test  Five-valued.
Copyright 2001, Agrawal & BushnellDay-1 PM Lecture 4a1 Design for Testability Theory and Practice Lecture 4a: Simulation n What is simulation? n Design.
Spring 07, Feb 13 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Binary Decision Diagrams Vishwani D. Agrawal James.
Design of Variable Input Delay Gates for Low Dynamic Power Circuits
Spring 08, Apr 1 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Testability Measures Vishwani D. Agrawal James.
Spring 08, Jan 15 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Introduction Vishwani D. Agrawal James J. Danaher.
8/19/04ELEC / ELEC / Advanced Topics in Electrical Engineering Designing VLSI for Low-Power and Self-Test Fall 2004 Vishwani.
Spring 07, Jan 16 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Introduction Vishwani D. Agrawal James J. Danaher.
Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 3 1 ELEC 5270/6270 Fall 2007 Low-Power Design of Electronic Circuits Logic-Level Power Estimation Vishwani.
9/20/05ELEC / Lecture 81 ELEC / (Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits.
Spring 08, Feb 28 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Retiming Vishwani D. Agrawal James J. Danaher.
5/7/2007VTS'071 Delay Test Quality Evaluation Using Bounded Gate Delays Soumitra Bose Intel Corporation, Design Technology, Folsom, CA Vishwani D.
8/18/05ELEC / Lecture 11 ELEC / (Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits.
11/2-4/04ELEC / ELEC / (Fall 2004) Advanced Topics in Electrical Engineering Designing VLSI for Low-Power and Self-Test.
Spring 08, Mar 27 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Fault Simulation Vishwani D. Agrawal James J.
Spring 07, Mar 8 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Timing Verification and Optimization Vishwani D.
Vishwani D. Agrawal James J. Danaher Professor
10/11/05ELEC / Lecture 121 ELEC / (Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits.
9/29/05ELEC / Lecture 101 ELEC / (Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits.
January 16, '02Agrawal: Delay testing1 Delay Testing of Digital Circuits Vishwani D. Agrawal Agere Systems, Murray Hill, NJ USA
Fall 2006, Oct. 17 ELEC / Lecture 9 1 ELEC / (Fall 2006) Low-Power Design of Electronic Circuits Power Analysis: Logic Level.
Fall 2006, Sep. 26, Oct. 3 ELEC / Lecture 7 1 ELEC / (Fall 2006) Low-Power Design of Electronic Circuits Dynamic Power:
Spring 07, Mar 20 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 A Linear Programming Solution to Clock Constraint.
Spring 07, Apr 5 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Retiming Vishwani D. Agrawal James J. Danaher Professor.
Spring 07, Mar 1, 6 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Timing Simulation and STA Vishwani D. Agrawal.
Spring 08, Feb 26 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Clock Skew Problem Vishwani D. Agrawal James J.
Spring 08, Feb 6 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Timing Verification and Optimization Vishwani D.
Spring 2010, Feb 10...ELEC 7770: Advanced VLSI Design (Agrawal)1 ELEC 7770 Advanced VLSI Design Spring 2010 Constraint Graph and Retiming Solution Vishwani.
10/14/2015 Based on text by S. Mourad "Priciples of Electronic Systems" Digital Testing: Testability Measures.
ELEC 7770 Advanced VLSI Design Spring 2014 Timing Simulation and STA Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University,
Spring 2014, Feb 14...ELEC 7770: Advanced VLSI Design (Agrawal)1 ELEC 7770 Advanced VLSI Design Spring 2014 Constraint Graph and Retiming Solution Vishwani.
Spring 2010, Mar 10ELEC 7770: Advanced VLSI Design (Agrawal)1 ELEC 7770 Advanced VLSI Design Spring 2010 Gate Sizing Vishwani D. Agrawal James J. Danaher.
Spring 2014, Mar 17...ELEC 7770: Advanced VLSI Design (Agrawal)1 ELEC 7770 Advanced VLSI Design Spring 2014 Zero - Skew Clock Routing Vishwani D. Agrawal.
Static Timing Analysis
Copyright Agrawal, 2007Lectures 5, 6, 7: Power Analysis1 CSV881: Low-Power Design Gate-Level Power Analysis Vishwani D. Agrawal James J. Danaher Professor.
Power Problems in VLSI Circuit Testing Keynote Talk Vishwani D. Agrawal James J. Danaher Professor Electrical and Computer Engineering Auburn University,
Circuit Delay Performance Estimation Most digital designs have multiple signal paths and the slowest one of these paths is called the critical path Timing.
ELEC Digital Logic Circuits Fall 2015 Delay and Power Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering.
ELEC Digital Logic Circuits Fall 2014 Delay and Power Vishwani D. Agrawal James J. Danaher Professor Department of Electrical and Computer Engineering.
Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 61 Lecture 6 Logic Simulation n What is simulation? n Design verification n Circuit modeling n True-value.
ELEC 7770 Advanced VLSI Design Spring Gate Delay and Circuit Timing
ELEC 7770 Advanced VLSI Design Spring 2016 Introduction
VLSI Testing Lecture 5: Logic Simulation
VLSI Testing Lecture 5: Logic Simulation
Vishwani D. Agrawal James J. Danaher Professor
Vishwani D. Agrawal Department of ECE, Auburn University
ELEC 7770 Advanced VLSI Design Spring 2014 Introduction
ELEC 7770 Advanced VLSI Design Spring 2016 Clock Skew Problem
ELEC 7770 Advanced VLSI Design Spring 2016 Zero-Skew Clock Routing
ELEC 7770 Advanced VLSI Design Spring 2012 Clock Skew Problem
ELEC 7770 Advanced VLSI Design Spring 2014 Clock Skew Problem
ELEC 7770 Advanced VLSI Design Spring 2012 Retiming
ELEC 7770 Advanced VLSI Design Spring 2012 Introduction
ELEC 7770 Advanced VLSI Design Spring 2010 Introduction
Vishwani D. Agrawal James J. Danaher Professor
ELEC 7770 Advanced VLSI Design Spring 2014 Technology Mapping
ELEC 7770 Advanced VLSI Design Spring 2016 Technology Mapping
Vishwani D. Agrawal James J. Danaher Professor
Vishwani D. Agrawal James J. Danaher Professor
VLSI Testing Lecture 9: Delay Test
ELEC 7770 Advanced VLSI Design Spring 2016 Retiming
VLSI Testing Lecture 7: Delay Test
VLSI Testing Lecture 4: Testability Analysis
ELEC 7770 Advanced VLSI Design Spring 2012 Timing Simulation and STA
ELEC 7770 Advanced VLSI Design Spring 2010 Zero-Skew Clock Routing
Presentation transcript:

Spring 08, Jan 31.. ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Timing Simulation and STA Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University, Auburn, AL

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)2 Digital Circuit Timing Inputs Outputs time Transient region Clock period Comb. logic Output Observation instant Input Signal changes Synchronized With clock

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)3 Timing Analysis and Optimization  Timing analysis  Dynamic analysis: Simulation.  Static timing analysis (STA): Vector-less topological analysis of circuit.  Timing optimization  Performance  Clock design  Other forms of design optimization  Chip area  Testability  Power

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)4 Circuit Delays  Switching or inertial delay is the interval between input change and output change of a gate:  Depends on input capacitance, device (transistor) characteristics and output capacitance of gate.  Also depends on input rise or fall times and states of other inputs (second-order effects).  Approximation: fixed rise and fall delays (or min-max delay range, or single fixed delay) for gate output.  Propagation or interconnect delay is the time a transition takes to travel between gates:  Depends on transmission line effects (distributed R, L, C parameters, length and loading) of routing paths.  Approximation: modeled as lumped delays for gate inputs.

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)5 Spice  Circuit/device level analysis  Circuit modeled as network of transistors, capacitors, resistors and voltage/current sources.  Node current equations using Kirchhoff’s current law.  Analysis is accurate but expensive  Used to characterize parts of a larger circuit.  Original references:  L. W. Nagel and D. O. Pederson, “SPICE – Simulation Program With Integrated Circuit Emphasis,” Memo ERL- M382, EECS Dept., University of California, Berkeley, Apr  L. W. Nagel, SPICE 2, A Computer program to Simulate Semiconductor Circuits, PhD Dissertation, University of California, Berkeley, May 1975.

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)6 CaCa Logic Model of MOS Circuit CcCc CbCb V DD a b c pMOS FETs nMOS FETs C a, C b, C c and C d are node capacitances DcDc DaDa c a b D a and D b are interconnect or propagation delays D c is inertial delay of gate DbDb CdCd

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)7 Spice Characterization Input data pattern Delay (ps) Dynamic energy (pJ) a = b = 0 → 1 a = b = 0 → a = 1, b = 0 → 1 a = 1, b = 0 → a = 0 → 1, b = 1 a = 0 → 1, b = a = b = 1 → a = 1, b = 1 → a = 1 → 0, b =

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)8 Spice Characterization (Cont.) Input data pattern Static power (pW) a = b = 0 a = b = a = 0, b = 1 a = 0, b = a = 1, b = a = b =

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)9 Complex Gates: Switch-Level Partitions  Circuit partitioned into channel-connected components for Spice characterization.  Reference: R. E. Bryant, “A Switch-Level Model and Simulator for MOS Digital Systems,” IEEE Trans. Computers, vol. C-33, no. 2, pp , Feb G1G1 G2G2 G3G3 Internal switching nodes not seen by logic simulator

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)10 Interconnect Delay: Elmore Delay Model  W. Elmore, “The Transient Response of Damped Linear Networks with Particular Regard to Wideband Amplifiers,” J. Appl. Phys., vol. 19, no.1, pp , Jan s R1 R2 R3 R4 R5 C1 C2 C3 C5 C4 Shared resistance: R45 = R1 + R3 R15 = R1 R34 = R1 + R3

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)11 Elmore Delay Formula N Delay at node k= 0.69Σ Cj × Rjk j=1 where N = number of capacitive nodes in the network Example: Delay at node 5= 0.69[R1 C1 + R1 C2 + (R1+R3)C3 + (R1+R3)C4 (R1+R3+R5)C5]

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)12 Event Propagation Delays Path P1 P2 P3 Single lumped inertial delay modeled for each gate PI transitions assumed to occur without time skew

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)13 Circuit Outputs  Each path can potentially produce one signal transition at the output.  The location of an output transition in time is determined by the delay of the path. Initial value Final value Clock period Fast transitions Slow transitions time

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)14 Delay and Discrete-Event Simulation (NAND gate) b a c (CMOS) Time units 0 5 c (zero delay) c (unit delay) c (multiple delay) c (minmax delay) Inputs Logic simulation min =2, max =5 rise=5, fall=5 Transient region Unknown (X) X

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)15 Event-Driven Simulation (Example) a =1 b =1 c =1→0 d = 0 e =1 f =0 g =1 Time, t 0 48 g t = Scheduled events c = 0 d = 1, e = 0 g = 0 f = 1 g = 1 Activity list d, e f, g g Time stack

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)16 Time Wheel (Circular Stack) t= max Current time pointer Event link-list

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)17 Timing Design and Delay Test  Timing simulation:  Critical paths are identified by static (vector-less) timing analysis tools like Primetime (Synopsys).  Timing or circuit-level simulation using designer- generated functional vectors verifies the design.  Layout optimization: Critical path data are used in placement and routing. Delay parameter extraction, timing simulation and layout are repeated for iterative improvement.  Testing: Some form of at-speed test is necessary. Critical paths and all gate transition delays are tested.

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)18 Static Timing Analysis (STA)  Finds maximum and minimum delays between all clocked flip-flops. Combinational circuit Flip-flops

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)19 Early References  T. I. Kirkpatrick and N. R. Clark, “PERT as an Aid to Logic Design,” IBM J. Res. Dev., vol. 10, no. 2, pp , March  R. B. Hitchcock, Sr., “Timing Verification and the Timing Analysis Program,” Proc. 19 th Design Automation Conf., 1982, pp  V. D. Agrawal, “Synchronous Path Analysis in MOS Circuit Simulator,” Proc. 19 th Design Automation Conf., 1982, pp

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)20 Basic Ideas  Adopted from project management  Frederick W. Taylor ( )  Henry Gantt ( )  PERT – Program Evaluation and Review Technique  CPM – Critical Path Method

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)21 A Gantt Chart in Microsoft Excel

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)22 Using a Gantt Chart  Track progress of subtasks and project.  Assess resource needs as a function of time.

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)23 Pert Chart

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)24 Example: Thesis Research Begin Problem selected Background study completed Program and Experiment completed Analysis completed Thesis Draft done Defense done Thesis submitted 2, 4, 6 weeks 3, 4, 5 4, 5, 6 5, 7, 9 4, 4, 4 2, 3, 4 2, 2, 2 minimum average maximum

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)25 Critical Path Begin Problem selected Background study completed Program and Experiment completed Analysis completed Thesis Draft done Defense done Thesis submitted 2, 4, 6 weeks 3, 4, 5 4, 5, 6 5, 7, 9 4, 4, 4 2, 3, 4 2, 2, 2 minimum average maximum Critical path is path of maximum average delay (24 weeks).

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)26 A Basic Timing Analysis Algorithm  Combinational logic.  Circuit represented as an acyclic directed graph (DAG).  Gates characterized by delays.

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)27 Example A1A1 B3B3 D2D2 E1E1 F1F1 J1J1 G2G2 H3H Levelize graph. Initialized arrival times at primary inputs. Level C1C1

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)28 Example (Cont.) A1A1 B3B3 C1C1 D2D2 E1E1 F1F1 J1J1 G2G2 H3H Determine output arrival time when all input arrival times are known Level

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)29 Example (Cont.) A1A1 B3B3 C1C1 D2D2 E1E1 F1F1 J1J1 G2G2 H3H Trace critical path from the output with longest arrival time Level

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)30 Finding Earliest and Longest Times A1A1 B3B3 C1C1 D2D2 E1E1 F1F1 J1J1 G2G2 H3H ,1 3,3 1,1 2,2 2,4 3,5 4,7 4,10 4,8 Level

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)31 Shortest and Longest Paths A1A1 B3B3 C1C1 D2D2 F1F1 J1J1 G2G2 H3H ,1 3,3 1,1 2,2 2,4 3,5 4,7 4,10 4,8 E1E1

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)32 Characteristics of STA  Linear time analysis, Complexity is O(n), n is number of gates and interconnects.  Variations:  Find k longest paths:  S. Kundu, “An Incremental Algorithm for Identification of Longest (Shortest) Paths,” Integration, the VLSI Journal, vol. 17, no. 1, pp , August  Find worst-case delays from an input to all outputs.  Linear programming methods.

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)33 Algorithms for Directed Acyclic Graphs (DAG)  Graph size: n = |V| + |E|, for |V| vertices and |E| edges.  Levelization: O(n) (linear-time) algorithm finds the maximum (or minimum) depth.  Path counting: O(n 2 ) algorithm. Number of paths can be exponential in n.  Finding all paths: Exponential-time algorithm.  Shortest (or longest) path between two nodes:  Dijkstra’s algorithm: O(n 2 )  Bellman-Ford algorithm: O(n 3 )

Spring 08, Jan 31..ELEC 7770: Advanced VLSI Design (Agrawal)34 References  Delay modeling, simulation and testing:  M. L. Bushnell and V. D. Agrawal, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, Springer,  Analysis and Design:  G. De Micheli, Synthesis and Optimization of Digital Circuits, McGraw-Hill,  N. Maheshwari and S. S. Sapatnekar, Timing Analysis and Optimization of Sequential Circuits, Springer,  PrimeTime (Static timing analysis tool):  H. Bhatnagar, Advanced ASIC Chip Synthesis, Second Edition, Springer, 2002