Microelectronics Processing Course J. Salzman Fall Microelectronics Processing Course Introduction
Microelectronics Processing Course J. Salzman Fall
3 Conductivity in solids Resistivity [ cm] Conductivity [ cm] Ag Cu Al Glass Pure Diamond Quartz Si Semiconductors Conductors Insulators GaAs
Microelectronics Processing Course J. Salzman Fall History 1904 Vaacum Tube 1925 Concept of Field Effect Transistor 1947 Bipolar Transistor 1958 Bipolar IC 1959 MOS Transistor 1961 IC-MOS Technology 1972 MOS Microprocessor
Microelectronics Processing Course J. Salzman Fall
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7 Moore Law (Gordon Moore 1965) The number of transistors in a chip will be doubled every 18 months
Microelectronics Processing Course J. Salzman Fall
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Microelectronics Processing Course J. Salzman Fall MOS Transistor Source Drain Gate
Microelectronics Processing Course J. Salzman Fall MOS Transistor Source Drain Gate Electrons in inversion layer
Microelectronics Processing Course J. Salzman Fall Drain Gate Source W L t ox Substrate Metal contact Schottky contact Si 2 O
Microelectronics Processing Course J. Salzman Fall Optical Measurements Photometric Interferometric Polarization Spectroscopic
Microelectronics Processing Course J. Salzman Fall Basic Optical Instruments Microscope Reflectometer (Nanospec) Ellipsometer
Microelectronics Processing Course J. Salzman Fall
Microelectronics Processing Course J. Salzman Fall
Microelectronics Processing Course J. Salzman Fall
Microelectronics Processing Course J. Salzman Fall
Microelectronics Processing Course J. Salzman Fall
Microelectronics Processing Course J. Salzman Fall
Microelectronics Processing Course J. Salzman Fall
Microelectronics Processing Course J. Salzman Fall