ISPC 2003 June 22 - 27, 2003 Consequences of Long Term Transients in Large Area High Density Plasma Processing: A 3-Dimensional Computational Investigation*

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ISPC 2003 June , 2003 Consequences of Long Term Transients in Large Area High Density Plasma Processing: A 3-Dimensional Computational Investigation* Pramod Subramonium** and Mark J Kushner*** **Dept of Chemical and Biomolecular Engineering ***Dept of Electrical and Computer Engineering University of Illinois Urbana, IL 61801, USA *Work supported by SRC and NSF

AGENDA Introduction Description of 3-dimensional parallel hybrid model Consequences of asymmetric pumping Pulsed operation of ICPs Summary University of Illinois Optical and Discharge Physics Pramod_ispc_02

300MM WAFER PROCESSING: CHALLENGES Side-to-side asymmetries in plasma properties become more critical as wafer size increases. Side pumping and side gas injection are common in industrial reactors and can lead to asymmetries in species densities, fluxes and temperatures. Flow asymmetries become pronounced when feedback through plasma conductivity make the inductive fields and power deposition non-uniform. In this work, we investigate the effect of long term transients such as during pulsed operation of ICPs on flow induced asymmetries. University of Illinois Optical and Discharge Physics Pramod_ispc_03

HYBRID PLASMA EQUIPMENT MODEL (HPEM-3D) University of Illinois Optical and Discharge Physics Hybrid Plasma Equipment Model (HPEM-3D) is a modular simulator to address low temperature plasmas. Pramod_ispc_04

GOVERNING EQUATIONS IN HPEM-3D University of Illinois Optical and Discharge Physics Continuity (heavy species) : Momentum (heavy species) : Energy (heavy species) : Drift-diffusion (electron) : Pramod_ispc_05

GOVERNING EQUATIONS IN HPEM-3D University of Illinois Optical and Discharge Physics Electron energy: Wave equation : Poisson’s equation : Electron energy transport is addressed by solving the electron energy equation coupled with a solution of Boltzmann’s equation for transport coefficients. Pramod_ispc_06

REACTOR GEOMETRY AND SIMULATION CONDITIONS 2-turn symmetric coil, showerhead and an asymmetric pump port Base case conditions: Power: 600 W, 10 MHz Flow rate: 160 sccm Pressure: 5 mTorr Ar, C 2 F 6 /CF 4 University of Illinois Optical and Discharge Physics Pramod_ispc_07 Height-A Height-B Top View: Height-A Height-A: Densities, Temperatures, Fluxes Height-B: ICP power, Conductivity, Sources

SYMMETRIC CASE: PLASMA PROPERTIES Power is deposited beneath the coils within the skin depth. T e peaks in the skin depth due to positive power deposition from inductive fields. Electron density peaks off-center in the bulk of the plasma. University of Illinois Optical and Discharge Physics [Cl] ICP POWER[E]TeTe C 2 F 6 /CF 4 (40/60), 600 W, 5 mTorr, 160 sccm Pramod_ispc_08

University of Illinois Optical and Discharge Physics CONTINUOUS WAVE (CW) OPERATION OF ICPS Flow induced non-uniformities in reaction sources make ion density non-uniform. Non-uniform plasma conductivity make the inductive fields and power deposition non-uniform even with symmetric coils. Non-uniform power deposition reinforces the asymmetries in reaction sources. This feedback loop during CW operation strengthens flow induced asymmetries. Electron, Ion density CW Operation Plasma Conductivity Asymmetric Flow Neutral density ICP Power Reaction sources Pramod_ispc_09

University of Illinois Optical and Discharge Physics PLASMA CONDUCTIVITY AND POWER DEPOSITION As a result of asymmetric pumping, the plasma conductivity is azimuthally asymmetric even at the plane below the showerhead. Reaction sources are non-uniform with a maximum away from the pump port. Pramod_ispc_10

University of Illinois Optical and Discharge Physics ASYMMETRIC ELECTRON AND RADICAL DENSITIES [F] Larger reaction sources result in larger ion and radical densities opposite to the pump port. Wall recombination results in a virtual asymmetric source of CF 2. Pramod_ispc_11

University of Illinois Optical and Discharge Physics PULSED OPERATION OF ICPS Pum p Port Pramod_ispc_12 CW Operation of ICPPulsed Operation of ICP Can pulsed operation of ICP improve azimuthal uniformity?

University of Illinois Optical and Discharge Physics PULSED INDUCTIVELY COUPLED PLASMAS Pulsed plasmas Plasma etching with better uniformity and anisotropy Improved etch selectivity by modifying the ratio of chemical species Reduce charge buildup on wafers and suppress notching Current models for investigating pulsed operation are typically global or 1-dimensional. Difficult to resolve long-term transients in multi-dimensional plasma equipment models. Moderately parallel algorithms for 2-D and 3-D hybrid models were developed to investigate long term transients. Pramod_ispc_13

DESCRIPTION OF PARALLEL HYBRID MODEL The HPEM, a modular simulator, was parallelized by employing a shared memory programming paradigm on a Symmetric Multi- Processor (SMP) machine. The Electromagnetics, Electron Monte Carlo and Fluid-kinetics Modules are simultaneously executed on three processors. The variables updated in different modules are immediately made available through shared memory for use by other modules. University of Illinois Optical and Discharge Physics Pramod_ispc_14

University of Illinois Optical and Discharge Physics PULSED OPERATION OF ICPS Pulsed plasma is a rf discharge in which the ICP power is pulse- square wave modulated. Flow asymmetries also become pronounced when feedback through plasma conductivity make power deposition non- uniform. Pulsed operation of ICPs may aid in reducing these asymmetries. Pramod_ispc_15 Diffusion smoothens density in afterglow Electron, Ion density Pulsed Operation Plasma Conductivity Asymmetric Flow Neutral density ICP Power Reaction sources ON OFF ON: Activeglow OFF: Afterglow

TEMPORAL DYNAMICS OF PULSED PLASMAS As the duty cycle increases, the reactor average electron density in the activeglow increases. Electron density in the activeglow increases with decrease in 5 KHz as the ICP power is ON for longer duration. University of Illinois Optical and Discharge Physics Pramod_ispc_16 Ar, 600 W, 5 mTorr, 160 sccm, PRF: 10 kHz, 50%

University of Illinois Optical and Discharge Physics PULSED ICPS: SYMMETRIC PUMPING Utilizing the plane of symmetry, the simulations need to be performed only for 180 o. With symmetric pumping, the plasma properties are azimuthally symmetric. Ar + density peaks in the center of the discharge. The power deposition is also symmetric. [Ar + ] S-Ar + POWER Animation slide Pramod_ispc_17

University of Illinois Optical and Discharge Physics PULSED ICPS: ASYMMETRIC PUMPING At the wafer plane, density and source function of Ar + ions are asymmetric during CW operation. By pulsing, asymmetries at the wafer plane are reduced. During the afterglow, diffusion smoothens the plasma density profile. In pulsed ICPs, feedback between non-uniform densities and power deposition is reduced. [Ar + ] [S-Ar + ] Pump Port Pump Port Animation slide Pramod_ispc_18

University of Illinois Optical and Discharge Physics PULSED ICPS: ASYMMETRIC PUMPING During CW operation, though the coils are symmetric, ICP power deposition is non uniform. ICP power peaks at regions of larger plasma conductivity owing to a larger electron density. With 50% duty cycle, ICP power is off during 50% of the pulse period. In the absence of non-uniform sources, the plasma becomes more uniform in the afterglow. Animation slide Pramod_ispc_19 ICP POWER Pump Port Pump Port [Ar + ]

University of Illinois Optical and Discharge Physics EFFECT OF DUTYCYCLE: Ar + DENSITY As the duty cycle decreases, the ICP power is OFF for longer duration. Hence the reduced feedback and increased diffusion make the time averaged ion density more uniform. Radial plasma uniformity is better at a duty cycle of 70% compared to 30%. Pramod_ispc_21 30% 70% Pump Port Pump Port

University of Illinois Optical and Discharge Physics TIME AVERAGED PLASMA PROPERTIES The pulsed operation of ICP makes the power deposition more uniform compared to CW. On a time average basis, the ion density is more uniform. The flux of ions impinging the wafer will be more symmetric. Hence the etch or deposition profiles will be more uniform at different azimuths on the wafer. CWPulsed ICP POWER [Ar + ] Pramod_ispc_22

University of Illinois Optical and Discharge Physics SUMMARY Pramod_ispc_23 A new 3-D parallel hybrid model was developed to address transients based on moderate computational parallelism. Reactor scale asymmetries can result in non-uniform trench evolution during fluorocarbon etching at different azimuthal locations. During pulsed operation, diffusion smoothens the plasma density profile in the afterglow, providing a more uniform set of initial conditions for the next power pulse. The feedback between non-uniform densities and power deposition is also reduced. The flux of ions impinging the wafer will be more symmetric during pulsed operation.