CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen1 ATLAS MDT-ASD Integrated Circuit Production And Testing Plan E. Hazen – Boston University.

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Presentation transcript:

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen1 ATLAS MDT-ASD Integrated Circuit Production And Testing Plan E. Hazen – Boston University

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen2 Chip Production Plan Overview Packaged devices purchased through MOSIS No wafer/die level testing Packaged devices tested by us on custom-made automatic tester Database of key parameters kept; devices serialized Generous (15%) spares allotment kept in storage indefinitely (dry N 2 ) for repair/replacement

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen3 Chip Production Plan Wafer Layout Agilent AMOS14TB process (0.5  m) Die size 3.2 x 3.9 mm 5 x 4 die per field 45 fields / 900 die per wafer 6 inch wafers

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen4 Chip Production Plan Wafer/Chip Yield Wafer Yield –25 wafers started per lot –15 good wafers guaranteed per lot –MOSIS expects to ship 20 wafers Our estimates based on 15 wafers are likely quite conservative Die yield –90% based on test of 100+ devices –Others’ experience with this process is similar We use 80% yield to be conservative

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen5 Chip Production Plan Estimate of Quantity Required

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen6 Chip Production Plan Fabrication Steps GDS File sent to MOSIS (identical to final prototype file) MOSIS arranges production: –Layout of reticle site with 20 identical chips –Manufacturing of mask set –Wafer fabrication at Agilent –Wafer qualification using test structures –Shipping of finished wafers to packaging vendor Delivery of packaged ICs to us

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen7 Chip Production Plan Post-Production Processing Receive parts in sealed bags / trays Unpack and serialize (barcode labels) Test in automatic tester –Assume throughput of 3 chips/minute (3-5 sec test) Total test time about 10 man-weeks –Record all parameters in database –Categorize: Not Functional, Partially Functional Fully Functional; several “Quality Grades” Store in dry nitrogen before assembly Seal in moisture-proof bags for shipment to assembly house

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen8 Chip Production Plan Automatic Tester Automatic Test Station –Custom designed for MDT-ASD –Full AC/DC Test in 3-5 sec –All parameters recorded directly in database More details to follow!

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen9 Chip Production Plan Schedule

CERN 30 Aug 2002ATLAS MDT-ASD PRR -- E. Hazen10 Chip Production Plan Preliminary Quotation (Previous estimate was $335,000 total)