ELEC 7250 Term Project Presentation Khushboo Sheth Department of Electrical and Computer Engineering Auburn University, Auburn, AL.

Slides:



Advertisements
Similar presentations
16/04/20151 Hardware Descriptive Languages these notes are taken from Mano’s book It can represent: Truth Table Boolean Expression Diagrams of gates and.
Advertisements

10/28/2009VLSI Design & Test Seminar1 Diagnostic Tests and Full- Response Fault Dictionary Vishwani D. Agrawal ECE Dept., Auburn University Auburn, AL.
4/28/05Ray: ELEC Fault Diagnosis Using Fault Dictionaries and Probability Adam Ray April 28, 2005.
ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES Logic Simulation.
Compaction of Diagnostic Test Set for a Full-Response Dictionary Mohammed Ashfaq Shukoor Vishwani D. Agrawal 18th IEEE North Atlantic Test Workshop, 2009.
4/20/2006 ELEC7250 Project: Grimes 1 Logic Simulator for Hierarchical Bench Hillary Grimes III – Term Project ELEC 7250 – Spring 2006.
Copyright 2001, Agrawal & BushnellDay-1 PM Lecture 4a1 Design for Testability Theory and Practice Lecture 4a: Simulation n What is simulation? n Design.
Parallel Pattern Single Fault Propagation for Combinational Circuits VLSI Testing (ELEC 7250) Submitted by Blessil George, Jyothi Chimakurthy and Malinky.
Dominance Fault Collapsing - Alok Doshi ELEC 7250 Spring 2004.
Concurrent Test Generation Auburn University, Department of Electrical and Computer Engineering Auburn, AL 36849, USA Vishwani D. Agrawal Alok S. Doshi.
4/27/2006 ELEC7250: White 1 ELEC7250 VLSI Testing: Final Project Andrew White.
4/26/05Han: ELEC72501 Department of Electrical and Computer Engineering Auburn University, AL K.Han Development of Parallel Distributed Computing System.
4/25/2006 ELEC7250: Hill 1 Brad Hill ELEC 7250 Logic Simulator.
4/20/2006ELEC7250: Alexander 1 LOGIC SIMULATION AND FAULT DIAGNOSIS BY JINS DAVIS ALEXANDER ELEC 7250 PRESENTATION.
VLSI Testing Term Project Presentation Daniel Milton.
Feb 2, '06, updated Mar 23, '06ELEC Project, Presentation, Paper 1 ELEC VLSI Testing Spring 2006 Class Project Class Presentation Term.
Spring 08, Mar 27 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Fault Simulation Vishwani D. Agrawal James J.
04/25/2006 ELEC 7250 Final Project: Jie Qin 1 Logic Simulator for Combinational Circuit Jie Qin Dept. of Electrical and Computer Engineering Auburn University,
Evaluation of Branch Predictors Using High-density-branch Programs Fang Pang MEng. Lei Zhu MEng. Electrical and Computer Engineering Department University.
May 13, 2005Sandireddy & Agrawal: Hierarchy in Fault Collapsing 1 Use of Hierarchy in Fault Collapsing Raja K. K. R. Sandireddy Intel Corporation Hillsboro,
Dominance Fault Collapsing of Combinational Circuits By Kalpesh Shetye & Kapil Gore ELEC 7250, Spring 2004.
مرتضي صاحب الزماني  The registers are master-slave flip-flops (a.k.a. edge-triggered) –At the beginning of each cycle, propagate values from primary inputs.
4/26/05Cheng: ELEC72501 A New Method for Diagnosing Multiple Stuck- at-Faults using Multiple and Single Fault Simulations An-jen Cheng ECE Dept. Auburn.
Diagnostic and Detection Fault Collapsing for Multiple Output Circuits Raja K. K. R. Sandireddy and Vishwani D. Agrawal Dept. Of Electrical and Computer.
Logic simulator and fault diagnosis Fan Wang Dept. of Electrical & Computer Engineering Auburn University ELEC7250 Term Project Spring 06’
Introduction to Basys 2. Switches Slide switchesPush button switches.
Digital Logic Lecture 08 By Amr Al-Awamry. Combinational Logic 1 A combinational circuit consists of an interconnection of logic gates. Combinational.
Logic gates & Boolean Algebra. Introduction Certain components (called logic elements) of the computer combine electric pulses using a set of rules. Electric.
ECE 2372 Modern Digital System Design
Logic Simulation 한양대학교 신현철 교수
TOPIC : Types of fault simulation
ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES Logic Modeling.
What is an And Gate? It is a digital circuit that produce logical operations The logical operations are call Boolean logical Boolean operation consist.
The George Washington University School of Engineering and Applied Science Department of Electrical and Computer Engineering ECE122 – Lab 6 Multiplexers,
What does C store? >>A = [1 2 3] >>B = [1 1] >>[C,D]=meshgrid(A,B) c) a) d) b)
Linear Algebra. Circuits The circuits in computers and other input devices have inputs, each of which is either a 0 or 1, the output is also 0s and 1s.
1 Ethics of Computing MONT 113G, Spring 2012 Session 5 Binary Addition.
Lecture 26: Reusable Methods: Enviable Sloth. Creating Function M-files User defined functions are stored as M- files To use them, they must be in the.
Digital Logic Structures: Chapter 3 COMP 2610 Dr. James Money COMP
EE3A1 Computer Hardware and Digital Design Worked Examples 3 Test and testability (1)
04/26/20031 ECE 551: Digital System Design & Synthesis Lecture Set : Introduction to VHDL 12.2: VHDL versus Verilog (Separate File)
A New ATPG Algorithm for 21 st Century: The wojoRithm John Sunwoo Electrical & Computer Engineering Auburn University, AL.
The George Washington University School of Engineering and Applied Science Department of Electrical and Computer Engineering ECE122 – Lab 6 Multiplexers,
Copyright 2001, Agrawal & BushnellLecture 6:Fault Simulation1 VLSI Testing Lecture 6: Fault Simulation Dr. Vishwani D. Agrawal James J. Danaher Professor.
Fault Models, Fault Simulation and Test Generation Vishwani D. Agrawal Department of ECE, Auburn University Auburn, AL 36849, USA
On the Relation Between Simulation-based and SAT-based Diagnosis CMPE 58Q Giray Kömürcü Boğaziçi University.
Speaker: Nansen Huang VLSI Design and Test Seminar (ELEC ) March 9, 2016 Simulation-Based Equivalence Checking.
Combinational Design, Part 2: Procedure. 2 Topics Positive vs. negative logic Design procedure.
Appendix C Basics of Logic Design. Appendix C — Logic Basic — 2 Logic Design Basics §4.2 Logic Design Conventions Objective: To understand how to build.
VLSI Testing Lecture 5: Logic Simulation
VLSI Testing Lecture 5: Logic Simulation
Vishwani D. Agrawal Department of ECE, Auburn University
Verilog-HDL-3 by Dr. Amin Danial Asham.
VLSI Testing Lecture 6: Fault Simulation
Microsoft Visual Basic 2005 BASICS
VLSI Testing Lecture 6: Fault Simulation
ELEC Digital Logic Circuits Fall 2014 Logic Testing (Chapter 12)
3.4 Computer systems Boolean logic Lesson 2.
For OCR GCSE Computing Unit 1 - Theory
Vishwani D. Agrawal James J. Danaher Professor
Hardware Descriptive Languages these notes are taken from Mano’s book
A New ATPG Algorithm for 21st Century: The wojoRithm
Garimella Srinivas Gottiparthy Ramraj Vippa Prakash
Floating Point Hardware and Algorithms
DIGITAL ELECTRONICS B.SC FY
Veeraraghavan Ramamurthy
Combinational Circuits
XOR Function Logic Symbol  Description  Truth Table 
ELEC Digital Logic Circuits Fall 2015 Logic Testing (Chapter 12)
Adder, Subtructer, Encoder, Decoder, Multiplexer, Demultiplexer
Presentation transcript:

ELEC 7250 Term Project Presentation Khushboo Sheth Department of Electrical and Computer Engineering Auburn University, Auburn, AL

Problem 1 Problem statement: Develop a compiler for the hierarchical format with 2 options for the user : Default option and Hierarchical option Algorithm used: User is asked for the circuit and the option Hierarchical Option: –Hierarchical file read line by line and HierSim file having the Hierarchical simulation table is given to the user. Default Option: –The different Hierarchical blocks are stored as an element in the block array and as the hierarchical netlist is read the blocks are flattened and stored in the Object file having the flat netlist. –This Object file is then read to create the Flat simulation table in FlatSim file.

Problem 2 Problem Statement: Develop a logic Simulator for combinational circuits consisting of zero-delay Boolean gates with hierarchical bench format netlist input and fully specified input vectors and expected responses. Algorithm used: Firstly, given circuit is fed to the levelizer where the unlevelized circuit is levelized. Levelized circuit simulated by reading the given netlist line by line and performing the specified operations.

Problem 3 Problem Statement: Introduce a design error in the netlist and have the simulator list the failing vectors and POs where errors are observed. Algorithm used: The circuit netlist and the fully specified input vectors and the expected responses is taken from the user. Simulator reads the input vectors from the given input file and operates with those vectors, the calculated responses are then compared with the expected responses. If the circuit is faulty the list of failing vectors and POs where the errors are observed is then given to the user.

Problem 4 Problem Statement: Attempt to diagnose the design error. Algorithm used: Once again, the circuit netlist and fully specified input vectors and the expected responses is taken from the user. The circuit is levelized by the levelizer The circuit is then diagnosed for faults The simulator compares the calculated responses of the given vectors with the expected responses. The comparison with the true circuit and the back trace from the primary failing output is used for the diagnosis.

Results of the Simulation of 4-bit adder circuit

Results of the Simulation of ISCAS`85 circuits

Conclusion Execution time increases with the number of gates and number of input vectors Diagnosis Algorithm can be improved for better results.

Thank You !!!