Design and Performance of the 6 GS/s Waveform Digitizing Chip DRS4 Stefan Ritt Paul Scherrer Institute, Switzerland at 40 mW per channel.

Slides:



Advertisements
Similar presentations
TDC130: High performance Time to Digital Converter in 130 nm
Advertisements

Paul Scherrer Institute
April 28th, 2011Timing Workshop, Chicago Paul Scherrer Institute Limiting factors in Switched Capacitor Arrays Sampling speed, Timing accuracy, Readout.
Paul Scherrer Institute
A NEW TIMING CALIBRATION METHOD FOR SWITCHED CAPACITOR ARRAY CHIPS TO ACHIEVE SUB-PICOSECOND RESOLUTIONS 13 March 2014Workshop on Picosecond Photon Sensors,
20/Oct./2000 CF IEEE NSS 2000 at Lyon,France 1 An MWPC Readout Chip for High Rate Environment Introduction ASIC Structure & Fabrication ASIC Evaluation.
Multiplexed vs. Simultaneous Data Acquisition Using USB Devices Presented by: Rene Messier Company: Data Translation Company: Data Translation.
Application of the DRS Chip for Fast Waveform Digitizing Stefan Ritt Paul Scherrer Institute, Switzerland.
January 28th, 2010Clermont Ferrand, Paul Scherrer Institut DRS Chip Developments Stefan Ritt.
A scalable DAQ system using the DRS4 sampling chip H.Friederich 1, G.Davatz 1, U.Hartmann 2, A.Howard 1, H.Meyer 1, D.Murer 1, S.Ritt 2, N.Schlumpf 2 1.
Ultrafast 16-channel ADC for NICA-MPD Forward Detectors A.V. Shchipunov Join Institute for Nuclear Research Dubna, Russia
11 Nov. 2014NSS Refresher Course, Seattle, Paul Scherrer Institute, Switzerland Fast Wave-form Sampling Front-end Electronics Stefan Ritt.
DEVELOPMENT OF A READOUT SYSTEM FOR LARGE SCALE TIME OF FLIGHT SYSTEMS WITH PICOSECOND RESOLUTION Considerations and designs for a system of tdc’s with.
Large Area, High Speed Photo-detectors Readout Jean-Francois Genat + On behalf and with the help of Herve Grabas +, Samuel Meehan +, Eric Oberla +, Fukun.
Y. Karadzhov MICE Video Conference Thu April 9 Slide 1 Absolute Time Calibration Method General description of the TOF DAQ setup For the TOF Data Acquisition.
Effective Bits. An ideal model of a digital waveform recorder OffsetGain Sampling Timebase oscillator Fs ADC Waveform Memory Address counter Compute Engine.
Ph. Farthouat CERN ELEC 2002 ADC 1 Analog to Digital Conversion  Introduction  Main characteristics –Resolution –Dynamic range –Bandwidth –Conversion.
Low Cost TDC Using FPGA Logic Cell Delay Jinyuan Wu, Z. Shi For CKM Collaboration Jan
Development of a 20 GS/s Sampling Chip in 130nm CMOS Technology Jean-Francois Genat On behalf of Mircea Bogdan 1, Henry J. Frisch 1, Herve Grabas 3, Mary.
1 DAQ Update. 2 DAQ Status DAQ was running successfully and stably in ’07 beam time Trigger bus scheme has proven to be very flexible – Added additional.
TOF Electronics Qi An Fast Electronics Lab, USTC Sept. 16~17, 2002.
Fast Waveform Digitizing in Radiation Detection using Switched Capacitor Arrays Stefan Ritt Paul Scherrer Institute, Switzerland.
Preliminary Design of Calorimeter Electronics Shudi Gu June 2002.
Performance of SPIROC chips in SKIROC mode
Jan. 24th, 2013HAP Topic 4, Karlsruhe, Paul Scherrer Institute Applications and future of Switched Capacitor Arrays (SCA) for ultrafast waveform digitizing.
Electronics for PS and LHC transformers Grzegorz Kasprowicz Supervisor: David Belohrad AB-BDI-PI Technical student report.
A 4-Channel Waveform Sampling ASIC in 130 nm CMOS E. Oberla, H. Grabas, J.F. Genat, H. Frisch Enrico Fermi Institute, University of Chicago K. Nishimura,
The GANDALF Multi-Channel Time-to-Digital Converter (TDC)  GANDALF module  TDC concepts  TDC implementation in the FPGA  measurements.
The Trigger Prototype Board Status Marco Grassi INFN - Pisa On behalf of trigger group D. Nicolò F. Morsani S. Galeotti M. Grassi.
Leo Greiner IPHC meeting HFT PIXEL DAQ Prototype Testing.
QIE10 Issues Tom Zimmerman Fermilab Oct. 28,
Tackling the search for Lepton Flavor Violation with GHz waveform digitizing using the DRS chip Stefan Ritt Paul Scherrer Institute, Switzerland.
Prediction W. Buchmueller (DESY) arXiv:hep-ph/ (1999)
Development of high speed waveform sampling ASICs Stefan Ritt - Paul Scherrer Institute, Switzerland NSNI – 2010, Mumbai, India.
March 6, INST02, Novosibirsk1 Electronics for the  e  experiment at PSI Short introduction Trigger electronics DAQ electronics Slow Control For the.
Features of the new Alibava firmware: 1. Universal for laboratory use (readout of stand-alone detector via USB interface) and for the telescope readout.
The DRS2 Chip: A 4.5 GHz Waveform Digitizing Chip for the MEG Experiment Stefan Ritt Paul Scherrer Institute, Switzerland.
1 DAQ Update MEG Review Meeting, Feb. 17 th 2010.
First results from the DRS4 waveform digitizing chip
BI day /12/00 1 PIPOS Project (TT2 & TT10) (Beam performances) G. Vismara  Present situation  Proposals  Beam parameters  Technical solution.
Domino Ring Sampler (DRS) Readout Shift Register
Front-End Electronics for G-APDs Stefan Ritt Paul Scherrer Institute, Switzerland.
PSI - 11 Feb Status of the electronic systems of the MEG Experiment.
Jean-François Genat Fast Timing Workshop June 8-10th 2015 FZU Prague Timing Methods with Fast Integrated Technologies 1.
J. Ye SMU Joint ATLAS-CMS Opto-electronics working group, April 10-11, 2008 CERN 1 Test Results on LOC1 and Design considerations for LOC2 LOC1 test results:
Mitglied der Helmholtz-Gemeinschaft Hardware characterization of ADC based DAQ-System for PANDA STT A. Erven, L. Jokhovets, P.Kulessa, H.Ohm,
May 23rd, th Pisa Meeting, Elba, Paul Scherrer Institute Gigahertz Waveform Sampling: An Overview and Outlook Stefan Ritt.
THE WaveDAQ SYSTEM FOR THE MEG II UPGRADE … read out by MIDAS Stefan Ritt, Paul Scherrer Institute, Switzerland 15 July 2015MIDAS Workshop, TRIUMF Paul.
CMOS Analog Design Using All-Region MOSFET Modeling
Application of the 5 GS/s Waveform Digitizing Chip DRS4 Stefan Ritt Paul Scherrer Institute, Switzerland UMC 0.25  m rad. hard 9 chn. each 1024 bins,
G.F. Tassielli - SuperB Workshop XI LNF1/11 02/12/2009 Status report on CLUster COUnting activities G. F. Tassielli on behalf of CLUCOU group SuperB Workshop.
PHOTOTUBE SCANNING SETUP AT THE UNIVERSITY OF MARYLAND Doug Roberts U of Maryland, College Park.
1 D. BRETON 1, L.LETERRIER 2, V.TOCUT 1, Ph. VALLERAND 2 (1) LAL ORSAY - France (2) LPC CAEN - France Super Nemo Absolute Time Stamper A high resolution.
C.Beigbeder, D.Breton, M.El Berni, J.Maalmi, V.Tocut – LAL/In2p3/CNRS L.Leterrier, S. Drouet - LPC/In2p3/CNRS P. Vallerand - GANIL/CNRS/CEA SuperB -Collaboration.
DAQ ACQUISITION FOR THE dE/dX DETECTOR
Jinfan Chang Experimental Physics Center , IHEP Feb 18 , 2011
Timing and fast analog memories in Saclay
96-channel, 10-bit, 20 MSPS ADC board with Gb Ethernet optical output
王进红,赵雷,封长青,刘树彬,安琪 核探测与核电子学国家重点实验室
The WaveDAQ System for the MEG II Upgrade
Ongoing R&D in Orsay/Saclay on ps time measurement: a USB-powered 2-channel 3.2GS/s 12-bit digitizer D.Breton (LAL Orsay), E.Delagnes (CEA/IRFU) Séminaire.
Hellenic Open University
Application of the 5 GS/s Waveform Digitizing Chip DRS4
Possible Upgrades ToF readout Trigger Forward tracking
BESIII EMC electronics
Stefan Ritt Paul Scherrer Institute, Switzerland
TOF read-out for high resolution timing
Ongoing R&D in Orsay/Saclay on ps time measurement: status of the USB-powered 2-channel 3.2GS/s 12-bit digitizer D.Breton & J.Maalmi (LAL Orsay), E.Delagnes.
Synchronization and trigger management
The Ohio State University USCMS EMU Meeting, FNAL, Oct. 29, 2004
Presentation transcript:

Design and Performance of the 6 GS/s Waveform Digitizing Chip DRS4 Stefan Ritt Paul Scherrer Institute, Switzerland at 40 mW per channel

Oct. 21st, 2008IEEE/NSS Dresden2 Switched Capacitor Array Cons No continuous acquisition No precise timing External (commercial) ADC needed Pros High speed (6 GHz) high resolution (11.5 bit resol.) High channel density (9 channels on 5x5 mm 2 ) Low power (10-40 mW / channel) Low cost (~ 10$ / channel) tt tt tt tt tt

Oct. 21st, 2008IEEE/NSS Dresden3 DRS4 Fabricated in 0.25  m 1P5M MMC process (UMC), 5 x 5 mm 2, radiation hard 8+1 ch. each 1024 cells Differential inputs, differential outputs Sampling speed 500 MHz … 6 GHz, PLL stabilized Readout speed 30 MHz, multiplexed or in parallel

Oct. 21st, 2008IEEE/NSS Dresden4 ROI readout mode readout shift register Trigger stop normal trigger stop after latency Delay delayed trigger stop Patent pending! 33 MHz e.g MHz  3 us dead time (2.5 ns / 12 channels)

Oct. 21st, 2008IEEE/NSS Dresden5 Daisy-chaining of channels Channel 0 – 1024 cells Channel 1 – 1024 cells Channel 2 – 1024 cells Channel 3 – 1024 cells Channel 4 – 1024 cells Channel 5 – 1024 cells Channel 6 – 1024 cells Channel 7 – 1024 cells Domino Wave Generation Deeper Sampling Depth can be reached by multiplexing channels

Oct. 21st, 2008IEEE/NSS Dresden6 Daisy-chaining of channels Channel 0 Channel 1 Channel 2 Channel 3 Channel 4 Channel 5 Channel 6 Channel 7 Domino Wave 1 clock enable input enable input Channel 0 Channel 1 Channel 2 Channel 3 Channel 4 Channel 5 Channel 6 Channel 7 Domino Wave 1 clock enable input enable input

Oct. 21st, 2008IEEE/NSS Dresden7 Single Channel Channel 0 Channel 1 Channel 2 Channel 3 Channel 4 Channel 5 Channel 6 Channel 7 Domino Wave 0 clock Channel 0Channel 1 1 Channel 2 1 Channel 3 1 Channel 4 1 Channel 5 1 Channel 6 1 Channel 7 1 DRS4 Connect channels externally to keep high bandwidth limited by bond wires (PCB or analog switches) DRS4 can be partitioned in: 8x1024, 4x2048, 2x4096, 1x8192 cells

Oct. 21st, 2008IEEE/NSS Dresden8 Chip Daisy Chaining DRS4 SROUT SRIN DRS4 SROUT SRIN DRS4 SROUT SRIN Virtually unlimited sampling depth

Oct. 21st, 2008IEEE/NSS Dresden9 Simultaneous Write/Read Channel 0 Channel 1 Channel 2 Channel 3 Channel 4 Channel 5 Channel 6 Channel 7 0 FPGA Channel 0Channel 1 1 Channel 0 readout 8-fold analog multi-event buffer Channel 2 1 Channel 1 0 Expected crosstalk ~few mV

Oct. 21st, 2008IEEE/NSS Dresden10 Trigger an DAQ on same board Using a multiplexer in DRS3, input signals can simultaneously digitized at 65 MHz and sampled in the DRS FPGA can make local trigger (or global one) and stop DRS upon a trigger DRS readout (6 GHz samples) though same 8-channel FADCs analog front end DRS FADC 12 bit 65 MHz MUX FPGA trigger LVDS SRAM DRS4 global trigger bus “Free” local trigger capability without additional hardware

DRS4 Test Results

Oct. 21st, 2008IEEE/NSS Dresden12 On-chip PLL Reference Clock f clk = f samp / 2048 V speed PLL jitter « 100 ps (Spartan-3 jitter 150 ps) “Dead Band” free Does not lock on higher harmonics PLL jitter « 100 ps (Spartan-3 jitter 150 ps) “Dead Band” free Does not lock on higher harmonics loop filter DRS4 Simulation Measurement Phase detector up down

Oct. 21st, 2008IEEE/NSS Dresden13 Bandwidth Bandwidth is determined by bond wire and internal bus resistance/capacitance: 850 MHz (QFP), 950 MHz (QFN), ??? (flip-chip) 850 MHz (-3dB) QFP package final bus width Simulation Measurement

Oct. 21st, 2008IEEE/NSS Dresden14 Timing jitter t1t1 t2t2 t3t3 t4t4 t5t5 Inverter chain has transistor variations   t i between samples differ  “Fixed pattern aperture jitter” “Differential temporal nonlinearity” TD i =  t i –  t nominal “Integral temporal nonlinearity” TI i =  t i – i  t nominal “Random aperture jitter” = variation of  t i between measurements Inverter chain has transistor variations   t i between samples differ  “Fixed pattern aperture jitter” “Differential temporal nonlinearity” TD i =  t i –  t nominal “Integral temporal nonlinearity” TI i =  t i – i  t nominal “Random aperture jitter” = variation of  t i between measurements TD 1 TI 5

Oct. 21st, 2008IEEE/NSS Dresden15 Fixed jitter calibration Fixed jitter is constant over time, can be measured and corrected for Several methods are commonly used Most use sine wave with random phase and correct for TD i on a statistical basis Fixed jitter is constant over time, can be measured and corrected for Several methods are commonly used Most use sine wave with random phase and correct for TD i on a statistical basis

Oct. 21st, 2008IEEE/NSS Dresden16 Fixed Pattern Jitter Results TD i typically ~50 ps 5 GHz TI i goes up to ~600 ps Inter-channel variation on same chip is very small since all channels are driven by the same domino wave

Oct. 21st, 2008IEEE/NSS Dresden17 Random Jitter Results Sine curve frequency fitted for each measurement (PLL jitter compensation) Encouraging result for DRS3: 2.7 ps RMS (best channel) 3.9 ps RMS (worst channel) Differential measurement t1 – t2 adds a  2, needs to be verified by measurement Measurement of n points on a rising edge of a signal improves by  n Sine curve frequency fitted for each measurement (PLL jitter compensation) Encouraging result for DRS3: 2.7 ps RMS (best channel) 3.9 ps RMS (worst channel) Differential measurement t1 – t2 adds a  2, needs to be verified by measurement Measurement of n points on a rising edge of a signal improves by  n Measurements for DRS4 currently going on, expected to be slightly better

Oct. 21st, 2008IEEE/NSS Dresden18 Experiments using DRS chip MAGIC-II 1200 channels DRS2 MEG 3000 channels DRS2 BPM for 1000 channels DRS4 (planned) MACE (India) 400 channels DRS4 (planned)

Oct. 21st, 2008IEEE/NSS Dresden19 Availability DRS4 will become available in larger quantities in November 2008 Chip can be obtained from PSI on a “non-profit” basis Delivery “as-is” Reference design (schematics) from PSI Costs ~ 10-15$/channel VME boards from industry in channel 65 MHz/12bit digitizer “boosted” by DRS4 chip to 6 GHz 64-channel 65 MHz/12bit digitizer “boosted” by DRS4 chip to 6 GHz Input USB 2.0 ext. Trigger DRS4

Oct. 21st, 2008IEEE/NSS Dresden20 Conclusions Fast waveform digitizing with SCA chips will have a big impact on experiments in the next future DRS4 chip solves all known issues of DRS3 and adds more flexibility DRS4 has 6 GHz, 1024 sampling cells per channel, 9 channels per chip, 11.5 bit vertical resolution, 3 ps timing resolution ~4000 DRS channels already used in several experiments, hope that other experiments can benefit from this technology

Oct. 21st, 2008IEEE/NSS Dresden22 A bit of history… DRS2 DRS3 DRS1 MEG Experiment searching for  e  down to MEG Experiment searching for  e  down to DRS Channels with GHz sampling 3000 Channels with GHz sampling

Oct. 21st, 2008IEEE/NSS Dresden23 DRS4 packaging DRS3 DRS4 9 mm 18 mm 4.2 mm DRS4 flip-chip

Oct. 21st, 2008IEEE/NSS Dresden24 “Residual charge” problem R “Ghost pulse” 2 GHz “Ghost pulse” 2 GHz After sampling a pulse, some residual charge remains in the capacitors on the next turn and can mimic wrong pulses Solution: Clear before write write clear Implemented in DRS4 Implemented in DRS4

Oct. 21st, 2008IEEE/NSS Dresden25 Sine Curve Fit Method S. Lehner, B. Keil, PSI i j y ji : i-th sample of measurement j a j f j  j o j : sine wave parameters  i : phase error  fixed jitter “Iterative global fit”: Determine rough sine wave parameters for each measurement by fit Determine  i using all measurements where sample “i” is near zero crossing Make several iterations “Iterative global fit”: Determine rough sine wave parameters for each measurement by fit Determine  i using all measurements where sample “i” is near zero crossing Make several iterations

Oct. 21st, 2008IEEE/NSS Dresden26 Signal-to-noise ratio (DRS3!) “Fixed pattern” offset error of 5 mV RMS can be reduced to 0.35 mV by offset correction in FPGA SNR: 1 V linear range / 0.35 mV = 69 dB (11.5 bits) “Fixed pattern” offset error of 5 mV RMS can be reduced to 0.35 mV by offset correction in FPGA SNR: 1 V linear range / 0.35 mV = 69 dB (11.5 bits) Offset Correction

Oct. 21st, 2008IEEE/NSS Dresden27 Global Timing Clock signal 20 MHz Reference clock PMT hit Domino stops after trigger latency 8 inputs shift register Reference clock domino wave MUX PLL jitter O(100ps)  Timing difference between signals sampled by different chips need a global reference clock

Oct. 21st, 2008IEEE/NSS Dresden28 Datasheet

Oct. 21st, 2008IEEE/NSS Dresden29 Interleaved sampling delays (200ps/8 = 25ps) G. Varner et al., Nucl.Instrum.Meth. A583, 447 (2007) 6 GSPS * 8 = 48 GSPS Possible with DRS4 if delay is implemented on PCB

Oct. 21st, 2008IEEE/NSS Dresden30 Comparison with other chips MATACQ D. Breton LABRADOR G. Varner DRS4 Bandwidth (-3db) 300 MHz> 1000 MHz950 MHz Sampling frequency 1 or 2 GHz10 MHz … 3.5 GHz500 MHz … 6 GHz Full scale range ±0.5 V+0.4 …2.1 V+0.1 … 1.1V Effective #bits 12 bit10 bit12 bit Sample points 1 x x 2569 x 1024 Channel per board 4N/A64 Digitization 5 MHzN/A30 MHz Readout dead time 650  s150  s3  s – 370  s Integral nonlinearity ± 0.1 % ± 0.05% Radiation hard No Yes (chip) Board V1729 (CAEN)-planned (CAEN)

Oct. 21st, 2008IEEE/NSS Dresden31 On-line waveform display click template fit pedestal histo  848 PMTs “virtual oscilloscope”

Oct. 21st, 2008IEEE/NSS Dresden32 Latch Constant Fraction Discr. Latch 12 bit Clock  + + MULT Latch 00 & <0 Delayed signal Inverted signal Sum