ELEC7250: VLSI Testing Spring 2004 Experimental Analysis of Fault Collapsing Methods Dixit, Ayoush M.

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Presentation transcript:

ELEC7250: VLSI Testing Spring 2004 Experimental Analysis of Fault Collapsing Methods Dixit, Ayoush M

Testing - Processing defects due to fabrication technology need to be addressed - Defects in devices cause faults to exist. Why? How do we go about testing devices? Fault Models Structural testing allows designers to develop algorithms to detect faults present in the system with the help of Fault Models. How? -Collapsing is done based on different criteria. -Possible ways to collapse faults are dominance collapsing, equivalent collapsing, functional collapsing, etc.

Dominance Fault Collapsing If all tests of F1 detect another fault F2, then F2 is said to dominate F1.

Checkpoint Theorem & Algorithm Used Dominance collapsing was performed as follows: - n+1 SSFs for n-input gates (basic gates). - AND/NAND s-a-1 faults in all inputs & s-a-0 fault on any one input is retained. - OR/NOR s-a-0 faults in all inputs & s-a-1 fault on any one input is retained. - The set of checkpoints consists of the primary inputs and all the fanout branches - In fanout-free circuit, the set of checkpoints consists of the primary inputs alone - The Theorem says that any test set which detects all single stuck-at faults on check points will detect all single stuck faults.

Getting fault list Primary inputs fanning out 1.Model both SF on the input and the fanouts Primary inputs Gate type 1.Model s-a-1 on all inputs of AND/NAND & s-a-0 fault on any one input 2.Model s-a-0 on all inputs of OR/NOR & s-a-1 fault on any one input 3.Model both SF on not and buffers Others 1.When the output of a gate fans out then on the fanouts model both SF. 2.Equivalent collapsing was done where ever possible. The program reads the netlist file and parses and writes it into understandable format, which is then opened to perform all the fault collapsing

Results and Conclusion CircuitFaultsDetected Faults CoverageCollapse Ratio C17.bench (Equivalence) /57 = C17.bench (Dominance) /54 = bench (Equivalence) /676 = bench (Dominance) /676 = Results For some reason there are 9 undetected faults in my implementation.

Results and Conclusion Lessons Learned It was evident from the implementation and results that the collapse ratio is higher in circuits with fanouts. From the results it was found that for the smaller circuits the fault coverage and the collapse ratio remains fairly the same in both Equivalent and Dominance collapsing methods. In larger circuits dominance fault collapsing can collapse more faults than equivalence fault collapsing method. Although that is the case, fault coverage seems to be better in equivalence fault collapsing method, which is intuitive because of presence of more faults Time management Suggestions: Try to get some knowledge of output format of software being used. It may seem redundant, develop algorithm implementation flow chart. If possible do hand analysis on smaller circuits before testing bigger circuits.

Results and Conclusion Demonstration Hitec Commands: 1.Do_hitec 2.Level 3.Faultlist 4.Equiv 5.Dominators 6.Testgen Modified Commands: 1.dominance 2.Conv (converts my fault list in hitec understandable format) 3.Dominators 4.Testgen Two level macro Proofs: 1.Remove TEST.run file 2.do_proofs 3.Faultsim

Results and Conclusion Discussions Comments and questions can also be directed to Thank you for your time. C is buggy while reading a file. If the end of line is found right after the end of the token read strtok puts that with the last read token. This creates problem when the comparison vector is not the last file token read from another file. Even though the strings are equal, strcmp cannot do anything. So, since I knew that the naming file ends right after the second vector, add in "\n" to the vector read from the fault file.