Optimised CCD Anti-Reflection Coating Graded thickness AR coating (for fixed-format spectroscopy) Andrew Kelt, Andrew Harris and Paul Jorden E2V Technologies,

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Optimised CCD Anti-Reflection Coating Graded thickness AR coating (for fixed-format spectroscopy) Andrew Kelt, Andrew Harris and Paul Jorden E2V Technologies, 106, Waterhouse Lane, Chelmsford, Essex, CM1 2QU, United Kingdom Simon Tulloch Isaac Newton Group, Apartado De Correos 321, Santa Cruz de La Palma, Islas Canarias, SPAIN Backthinned CCDs normally use a single wavelength antireflection coating to maximise QE E2v designed custom evaporation technique to allow a graded AR coating Test results – Optimised spectral response from nm along 60mm length of the sensor. Reduction of fringes when minimum reflection matches illuminated wavelength. Results of spectral response, reflectivity, and fringe amplitudes are presented.

This side of CCD is optimised for the blue This side of CCD is optimised for the red Sample CCD44-82 with graded coating Optimised CCD Anti-Reflection Coating

SUMMARY Low reflectivity = High QE Optimises QE across full wavelength range. Low reflectivity in the red = Low fringingReduced fringes at red wavelengths AR coat can be matched to spectrograph output. Ideal choice for Fixed Format Spectrographs. Optimised spectral response cf fixed wavelength AR coat [Curves are for deep depletion CCD] Please see poster for all the other data. Thanks! Optimised CCD Anti-Reflection Coating