AGATA Core - upgraded front end electronics Upgraded Charge Sensitive Preamplifier - new frequency compensation for Single & Dual Gain Core Reworked Dual Gain Core, reconfigurable: - either Single or Dual; either LV-CMOS or LVDS Programmable Spectroscopic Pulser - as a tool for self-calibrating energy, time, dead time, time alignment, detector characterization etc.) G. Pascovici for the AGATA Preamplifier and Detector Groups, Uppsala, 09.07.2008
Motivation, going on work… Follow-up on previous AGATA Week presentations: - Wiring and Frequency Compensations, B. Bruyneel and G. Pascovici, Orsay, 2007 - Dual Gain Core (e.g. with 5 MeV and 20 MeV ranges) Dino Bazzacco’s request, Aug. 2007 - ToT Method (calibration and measurements), Francesca Zocca et al, Padova, 2007
Transfer function at high frequency range Dominant pole compensation See presentations of B. Bruyneel & G. Pascovici @ AGATA Week, Orsay, Jan, 2007 Return GND concept for single & triple cryostat Wires – inductivities …
Front-End Electronics & wiring in cryostat Issue: Front-End Electronics & wiring in cryostat Cold part Warm part Core return GND Cold part Warm part
AGATA Single & Dual Gain Core reworked frequency compensations tested with AGATA_Dummy-3D internal network compensation Lead comp. (1. OpAmp) Cryostat wiring as part of the front-end electronics external network compensation - minimum Miller effect (min.) - lead compensation (min.) - lead-lag compensation (adj.) - dominant pole compensation (adj.) AGATA Dummy 3D capsule + wiring
AGATA Single & Dual Gain Core reworked frequency compensations internal network compensation Lead comp. (1. OpAmp) Cryostat wiring as part of the front-end electronics external network compensation - minimum Miller effect (min.) - lead compensation (min.) - lead-lag compensation (adj.) - dominant pole compensation (adj.)
AGATA Single and Dual Core frequency compensations tr ~ 30-40 ns Multiple frequency compensations: - minimum Miller effect - lead compensation - lead-lag compensation - dominant pole compensation * without dominant pole & lead-lag compensation networks * implemented dominant pole & lead-lag compensation network Comments: Stability criteria not only oscillations, rather it is circuit performance as exhibited by peaking and ringing the method of compensation depends on the equivalent op amp type and feedback, source and load networks tr ~ 25 - 30 ns a HF rejection with almost no extra “price” paid for rise time !
(cold) tr ~ 26.8 ns Ch.1 @ ~ 800 mV tr ~ 29.2 ns Ch.1 @ ~ 220 mV Dual Core in ‘GP - Cryostat’ (cold) Dual Core in ‘GP - Cryostat’ (cold) cryostat equipped with AGATA cold parts and wiring (only 1.8 Ohm, no 48.5 Ohm!) tr ~ 26.8 ns Ch.1 @ ~ 800 mV ~ 25.6 ns Ch.2 @ ~ 220 mV Equivalent resolutions (if cold Cf ~1pF) Ch1 ~ 1.15 keV @ ~ 150 keV Ch2 ~ 1.25 keV @ ~ 150 keV (6 µs shaping time Ortec 671 & IKP-MCA) rise time ~ 26 -29 ns (+/- 2ns 10mV-1V) no overshoots & undershoots NB: flat top of ~ 500 ns (PSA peaking) tr ~ 29.2 ns Ch.1 @ ~ 220 mV ~ 29.2 ns Ch.2 @ ~ 60 mV
Single / Dual Gain Core Final Specifications AGATA Single / Dual Gain Core Final Specifications news - core front-end Single or Dual Gain Extended range ~180 MeV (both single and dual gain) LV-CMOS or LV-DS for the INH-Ch1, INH-Ch2 and Pulser Trigger-In LV-CMOS for SHDN and Pulser DAC CNTRL lines Up-dated frequency compensation for cryostat wiring (dominant pole comp)
Time over Threshold (ToT) method See Francesca Zocca, AGATA Week, Padova, Nov. 2007; FreeDAC Workshop, Ljubljana, Mai, 2008
Fast Reset as tool to implement the “TOT” method Analog Mode + DT1 Active Reset – OFF Fast Reset circuitry ToT ~ DT2 Active Reset – ON very fast recovery from TOT mode of operation fast comparator LT1719 (+/- 6V) factory adj. threshold + zero crossing LV-CMOS (opt) LVDS by default
Dual Gain Core - the upgraded features and its structure Linear Range: 2keV -180 MeV (far beyond the ADC limit !) Two modes of operations: a) Pulse Amplitude b) Time Over Threshold (ToT) (0-5 MeV); (0-20 MeV) (5-180 MeV); (20-180 MeV) cold part warm part Ch 1 ~ 200 mV / MeV C-Ch1 /C-Ch1 INH1 SDHN1 Pole /Zero Adj. Fast Reset (Ch1) Differential Buffer (Ch1) Common Charge Sensitive Loop + Pulser Wiring 36_fold segmented HP-Ge detector + cold jFET one MDR 10m cable Ch 2 ~ 50mV / MeV C-Ch2 /C-Ch2 INH2 SDHN2 Pole /Zero Adj. Fast Reset (Ch2) Differential Buffer (Ch2) Single Core or Dual Core wiring FADC Programmable Spectroscopic Pulser Pulser CNTRL
Time over Threshold [ToT] method F. Zocca, AGATA Week Padova, Nov., 2007 Time over Threshold Analog Core Ch.1 Core Ch.1 Reset Threshold Ch.1 Analog Time over Threshold Core Ch.2 Core Ch.2 Reset Threshold Ch.2 5 MeV 20 MeV 180 MeV
keeping INH-C as LV-CMOS digital signal Issue: INH-C1 and Core Ch2 X-talk on the transmission line due to INH-C1 return GND … X-talk ~ 9 mV (~ slow signals) keeping INH-C as LV-CMOS digital signal Advantage: - simple upgrade of the single gain core to dual gain core Disadvantage: - relative large crosstalk INH-C1 and 2.nd core signal INH-C1 Core_Ch2 X-talk ~ 15 mV (~ fast signals)
AGATA Dual Core crosstalk test measurements AGATA Dual_Core LVDS transmission of digital INH and Pulser_In signals AGATA Dual Core crosstalk test measurements Ch2 (analog signal) vs. LVDS-INH-C1 (bellow & above threshold) Core amplitude just below the INH threshold Core amplitude just above the INH threshold Ch1 @ INH_Threshold - (~ 4mV) Ch1 @ INH_Threshold + (~ 4mV) Ch2 @ INH_Threshold + (~ 1mV) Ch2 @ INH_Threshold + (- 1mV) LV_CMOS LV_CMOS INH_Ch1/-/ tr ~ 1.65 ns INH_Ch1/+/ INH_Ch1/+/ tf ~ 2.45 ns INH_Ch1/-/ (1) Core_Ch1, (2) Core_Ch2, (3) INH_Ch1(LVDS/-/, (4) INH_Ch1(LVDS/+/) G.Pascovici, Dual_Core IReS Test Box, warm jFET, Feb.23, 2008
Dual Core in ‘GP-Cryostat’ (cold) 5 & 10 m LVDS transmission line Trigger tin ~ 1.0 ns tr ~ 26.8 ns Ch.1 @ ~ 800 mV ~ 25.6 ns Ch.2 @ ~ 220 mV 5m cable tr, tf ~ 1.5 ns 10 m cable tr, tf ~ 1.5 ns ~ 22ns / 5m Resolutions: Ch1 ~ 1.15 keV @ ~ 150 keV Ch2 ~ 1.25 keV @ ~ 150 keV (6 µs shaping time Ortec 671 & IKP-MCA) Rise time ~ 26-29 ns NO overshoots & undershoots Pulse shape: flat top of ~ 500 ns tr ~ 29.2 ns Ch.1 @ ~ 220 mV ~ 29.2 ns Ch.2 @ ~ 60 mV
Rework to be done in the FADCs LV-CMOS to LVDS LVDS to LV-CMOS tin ~ 1.0 ns tr, tf ~ 1.5 ns 10m cable + 1.22V Tiny converter PCBs to be installed in the FADCs LVDS- TX LVDS- RX (2x)
Dual Gain Core - the upgraded features and its structure Linear Range: 2keV -180 MeV (far beyond the ADC limit !) Two modes of operations: a) Pulse Amplitude b) Time Over Threshold (ToT) (0-5 MeV); (0-20 MeV) (5-180 MeV); (20-180 MeV) cold part warm part Ch 1 ~ 100 mV / MeV C-Ch1 /C-Ch1 INH1 SDHN1 Pole /Zero Adj. Fast Reset (Ch1) Differential Buffer (Ch1) Common Charge Sensitive Loop + Pulser Wiring 36_fold segmented HP-Ge detector + cold jFET one MDR 10m cable N.B. The dual gain core can be configured also as a Single Core with LV-CMOS digital signals Ch 2 ~ 50mV / MeV C-Ch2 /C-Ch2 INH2 SDHN2 Pole /Zero Adj. Fast Reset (Ch2) Differential Buffer (Ch2) Single Core or Dual Core wiring FADC Programmable Spectroscopic Pulser Pulser CNTRL
Potential use of PSP for self-calibrating Parameter Potential Use / Applications Pulse amplitude Energy, Calibration, Stability Pulse Form Transfer Function in time (rise time, fall time) domain, ringing (PSA) Detector Bulk Capacities Crosstalk input data (also for Dummy Capacities) (Detector characterization) Pulse Form TOT Method (PSA) Repetition Rate (c.p.s.) Dead Time (Efficiency meas.) (with periodical or statistical distribution) Time alignment Correlated time spectra Segments calibration points Low energy calibration points Alignment of segment signals
Pulser Mode of operation Exponential Rectangular Advantage: Good DC Level Advantage: Same P/Z good PSA Disadvantage: Different P/Z for Signal & Pulser PSA! - Bipolar Signals ( + & - ) Advantage / Disadvantage Base line OK (good P/Z), but two DC levels from pulser duty cycle, respectively Pulser Specs and Measurements Dynamic range: - Core 0 to ~ 180 MeV (opt. ~ 90 MeV) - Segments 0 to ~3 MeV (opt. ~ 1 MeV) Rise Time Range: 20 ns - 60 ns (by default ~45 ns) Fall Time Range: 100 µs - 1000 µs (by default ~150 µs) Long Term Stability: < 10 / 24 h - 4
Measurements: GSI Single Cryostat (Detector S001) Portable 16k channels MCA (IKP) Resolution (acquisition time 12-14h): - core 1.08 keV Pulser (Detector) - cold dummy (V3): 0.850 keV - segment Pulser: < 0.90 keV - core @ 59.5 keV: 1.10 keV - core @ 122.06 keV: 1.15 keV
Conclusions A very low noise, very wide dynamic range charge-sensitive pre-amplifier has been developed and tested to be used with a highly segmented and encapsulated HP-Ge AGATA Detector Furthermore its wide spectroscopic range has been successfully extended by more than one order of magnitude, by switching (below the maximum of the ADC range) from the standard amplitude spectroscopic method to the new TOT technique - two modes of operations four sub-ranges, namely: 0-5 (20) MeV and 5(20)-180 MeV A very clean transfer function at very high counting rates and adverse cryostat wiring (useful set of 2D & 3D “Dummy - detectors”) An accurate Programmable Spectroscopic Pulser has been developed and imple- mented in the AGATA front-end electronics
Conclusions A very low noise, very wide dynamic range Single Core Dual Core A very low noise, very wide dynamic range charge-sensitive pre-amplifier has been developed and tested to be used with a highly segmented and encapsulated HP-Ge AGATA Detector Furthermore its wide spectroscopic range has been successfully extended by more than one order of magnitude, by switching (below the maximum of the ADC range) from the standard amplitude spectroscopic method to the new TOT technique - two modes of operations four sub-ranges, namely: 0-5 (20) MeV and 5(20)-180 MeV A very clean transfer function at very high counting rates and adverse cryostat wiring (useful set of 2D & 3D “Dummy - detectors”) An accurate Programmable Spectroscopic Pulser has been developed and imple- mented in the AGATA front-end electronics Floating motherboard Floating motherboard Triple Ganil Triple Milano Floating motherboard Floating motherboard Triple Cryostat, one set of 12+1 warm CSPs