A. BobbioBertinoro, March 10-14, Dependability Theory and Methods Part 4: Fault-tree analysis Andrea Bobbio Dipartimento di Informatica Università del Piemonte Orientale, “A. Avogadro” Alessandria (Italy) - Bertinoro, March 10-14, 2003
Elements of logic algebra
Logic algebra and Venn diagrams
Events are binary events (working/non-working); Events are statistically independent; Relationships between events and causes are represented by logical AND and OR (Boolean) gates; The root of the FT is the catastrophic undesired event called the Top Event (TE). Fundamental assumptions for FTA
A. BobbioBertinoro, March 10-14, Case study: a PLC architecture
A. BobbioBertinoro, March 10-14, Case study: a PLC architecture The considered failure rates for the elementary blocks are reported in the Table.
A. BobbioBertinoro, March 10-14, PLC architecture: FTA
A. BobbioBertinoro, March 10-14, Safety and dependability measures Safety assessment of the control system according to IEC (Functional safety of electrical/electronic/ programmable electronic safety-related systems) SIL requirements (IEC 61508); Unreliability versus time; Safe Mission Time (SMT); Mean Time To Failure; Critical failure path (mcs).
A. BobbioBertinoro, March 10-14, FT Critical cuts The FT has 59 MCS, one of order 1 (the voter) and the remaining 58 of order 2.