S. Reda EN160 SP’07 Design and Implementation of VLSI Systems (EN0160) Lecture 31: Array Subsystems (SRAM) Prof. Sherief Reda Division of Engineering,

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S. Reda EN160 SP’07 Design and Implementation of VLSI Systems (EN0160) Lecture 31: Array Subsystems (SRAM) Prof. Sherief Reda Division of Engineering, Brown University Spring 2007 [sources: Weste/Addison Wesley – Rabaey/Pearson]

S. Reda EN160 SP’07 Array subsystems SRAM DRAM ROM

S. Reda EN160 SP’07 Array architecture Word 0 Word 1 Word 2 WordN - 2 N - 1 Storage cell 2m2m bits N words S 0 S 1 S 2 S N - 2 S N - 1 Input-Output (M bits) Intuitive architecture for N x 2 m memory Too many select signals: N words == N select signals Problem: ASPECT RATIO or HEIGHT >> WIDTH

S. Reda EN160 SP’07 Array architecture 2 n words of 2 m bits each If n >> m, fold by 2 k into fewer rows of more columns Good regularity – easy to design Very high density if good cells are used 1. core 2. 3.

S. Reda EN160 SP’07 1. Core. 12T SRAM Cell Basic building block: SRAM Cell –Holds one bit of information, like a latch –Must be read and written 12-transistor (12T) SRAM cell –Use a simple latch connected to bitline –46 x 75 λ unit cell

S. Reda EN160 SP’07 6T SRAM Cell Cell size accounts for most of array size –Reduce cell size at expense of complexity 6T SRAM Cell –Used in most commercial chips –Data stored in cross-coupled inverters Read: –Precharge bit, bit_b –Raise wordline Write: –Drive data onto bit, bit_b –Raise wordline Size 26 x 45 λ

S. Reda EN160 SP’07 SRAM Read Precharge both bitlines high Then turn on wordline One of the two bitlines will be pulled down by the cell Ex: A = 0, A_b = 1 –bit discharges, bit_b stays high –But A bumps up slightly Read stability –A must not flip N1 stronger than N2 (N1 has lower resistance)

S. Reda EN160 SP’07 Reading within the context of a column

S. Reda EN160 SP’07 SRAM Write Drive one bitline high, the other low Then turn on wordline Bitlines overpower cell with new value Ex: A = 0, A_b = 1, bit = 1, bit_b = 0 –Force A_b low, then A rises high Writability –Must overpower feedback inverter N4 stronger than P2 (N4 has lower resistance)

S. Reda EN160 SP’07 SRAM Column Example

S. Reda EN160 SP’07 2. Decoders n:2 n decoder consists of 2 n n-input AND gates –One needed for each row of memory –Build AND from NAND or NOR gates Static CMOS

S. Reda EN160 SP’07 Large decoders For n > 4, NAND gates become slow –Break large gates into multiple smaller gates

S. Reda EN160 SP’07 Predecoding Many of these gates are redundant –Factor out common gates into predecoder –Saves area –Same path effort

S. Reda EN160 SP’07 3. Column circuitry Some circuitry is required for each column –Bitline conditioning –Sense amplifiers –Column multiplexing

S. Reda EN160 SP’07 Bit preconditioning and sense amplifiers Precharge bitlines high before reads Many words in memory  bit capacitance is huge  slow reading (large memory access time) Sense amplifiers are triggered on small voltage swing (reduce  V)

S. Reda EN160 SP’07 Column multiplexing Recall that array may be folded for good aspect ratio Ex: 2 kword x 16 folded into 256 rows x 128 columns –Must select 16 output bits from the 128 columns –Requires 16 8:1 column multiplexers