DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 1 Report on FEE for PID o Reminder o TOF o EMCAL o Summary Jean-Sebastien Graulich, Geneva.

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Presentation transcript:

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 1 Report on FEE for PID o Reminder o TOF o EMCAL o Summary Jean-Sebastien Graulich, Geneva

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 2 Reminder  TOF 110 Pmt Channels Baseline: CAEN V1290 TDC No charge measurement Discriminator not yet chosen  EMCAL 240 Pmt Channels Baseline: none My Proposal: Use 200 MHz Flash ADC combined with a stretcher to measure both the charge and the time with ~1 ns resolution  CKOV will use the same as EMCAL

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 3 TOF  Preliminary results from BTF Choice of Discriminator has small effect on time resolution Internal resolution of V1290 is not as good as for V767, but still good enough for 70 ps time resolution  Discriminator based on NINO chip is not yet tested

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 4 EMCAL  Flash ADC tested with rapid Pmt (R4998)  Original idea from last DAQ WS 2 ns rise time Shaper V thr t thr >30 ns rise time If we can fit the rising edge, time resolution can be much higher than the 5 ns of the sampling rate.

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 5 Preliminary Cosmics Results Time (sample #) Amplitude fit = p4 – p0 (  0 / (  0 -  ) ) [ ( e -(t-t 0 )/  -e -(t-t 0 )/  0 ) + (t-t0) /  e -(t-t 0 )/  ] 0 =0 =  = = t0 =t0 =

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 6 Test with Cosmics Pos 1 Pmt 1Pmt 2 Shaper ch01 ch02

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 7 Preliminary cosmics results = 700 ps t 0;left – t 0;right (sample) ~22 cm

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 8 Test Beam Data  Data from BTF not analyzed yet Problem with the shape of the signal The formula is valid only for exponential signal Not valid because of Long cable Passive splitter Special base (voltage divider) for differential output  Energy resolution should be evaluated

DAQ WS03 Sept 2006Jean-Sébastien GraulichSlide 9 Summary  FEE choice for TOF baseline (no charge measurement) *is* validated NINO chip needs to be tested  FEE choice for EMCAL Flash ADC + shaper principle is demonstrated Work in progress, promising preliminary results