45 th ICFA Beam Dynamic Workshop June 8–12, 2009, Cornell University, Ithaca New York Jim Crittenden Cornell Laboratory for Accelerator-Based Sciences.

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45 th ICFA Beam Dynamic Workshop June 8–12, 2009, Cornell University, Ithaca New York Jim Crittenden Cornell Laboratory for Accelerator-Based Sciences.

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Presentation transcript:

45 th ICFA Beam Dynamic Workshop June 8–12, 2009, Cornell University, Ithaca New York Jim Crittenden Cornell Laboratory for Accelerator-Based Sciences and Education CesrTA General Meeting 1 October 2010 All material for this talk may be obtained at The measurements of 3/27/2010 are described here: https ://webdb.lepp.cornell.edu/elog/CTA+MS/551 The measurements of 5/17/2010 are described here: https ://webdb.lepp.cornell.edu/elog/CTA+MS/629 See also previous talks in the electron cloud meetings on simulations for the shielded button data on 4/21, 4/28, 5/12, 7/7, 7/14, 8/4, 9/2010 Shielded Button Measurement/ECLOUD Simulation Comparison for the Cloud Lifetime Study Using Witness Bunch Data Context A primary purpose of the shielded pickup project (time-resolved measurements vs RFA) is to measure the cloud lifetime. This lifetime is sensitive to the secondary yield for low-energy cloud particles hitting the vacuum chamber wall. This presentation shows the first results on the sensitivity to the parameter d 0 using witness bunch data.

1 October 2010 Shielded Button Measurement/ECLOUD Simulation Comparison for the Cloud Lifetime Study using Witness Bunch Data/ J.A.Crittenden 2 / 6 John Sikora's cloud lifetime study on 3/27 using 5 mA/bunch e+ data at 15E (TiN)

1 October 2010 Shielded Button Measurement/ECLOUD Simulation Comparison for the Cloud Lifetime Study using Witness Bunch Data/ J.A.Crittenden 3 / 6 ECLOUD simulation for the cloud lifetime study using 5 mA/bunch e+ data at 15E (TiN) Secondary Yield Model True secondary yield: 0.9 True secondary peak energy: 400 eV Rediffused yield: 0.1 Elastic yield d 0 : 0.55 Simulated cloud lifetime too long: reduce elastic yield? Two 5-mA bunch spaced by 14, 28, 42, 56, 70, 84 ns. ECLOUD statistical errors are shown. The measured button signals are shown as smooth dotted lines. The measured signals are scaled by an arbitrary factor of 7.

1 October 2010 Shielded Button Measurement/ECLOUD Simulation Comparison for the Cloud Lifetime Study using Witness Bunch Data/ J.A.Crittenden 4 / 6 ECLOUD cloud lifetime sensitivity to elastic yield d 0 The optimal value for d 0 (0.15) is lower than has been generally assumed ( ). Note that not only the simulated peak signal value for witness bunch signals is better, but also the width. Could such a low elastic yield be a characteristic of TiN coating? Our tune shift simulations gave reasonable cloud decay times with a value of 0.5 for uncoated aluminum chambers. d 0 =1.05 d 0 =0.95 d 0 =0.55 d 0 =0.35 d 0 =0.75 d 0 =0.15

1 October 2010 Shielded Button Measurement/ECLOUD Simulation Comparison for the Cloud Lifetime Study using Witness Bunch Data/ J.A.Crittenden 5 / 6 Next project Bare aluminum chamber with 4 ns spacing 5/17/2010 NB: nonmonotonic! The narrower spacing gives sensitivity to the cloud buildup and motion. Will we find the higher value for d 0 (about 0.5) which was found to be compatible with our tune shift simulations?

1 October 2010 Shielded Button Measurement/ECLOUD Simulation Comparison for the Cloud Lifetime Study using Witness Bunch Data/ J.A.Crittenden 6 / 6 YES d 0 is much higher for aluminum than for TiN Many systematic checks remain before a value for d 0 can be precisely given, but the sensitivity is obvious. This study was difficult because an unexpected extreme sensitivity to the photoelectron energy distribution had to be discovered. The simulation for the 4- and 8-ns spaced bunches still needs work. d 0 =0.95 d 0 =0.75 d 0 =0.35 d 0 =0.15 d 0 =0.55 d 0 =0.05