Evaluated Surface Drainage Problems with Data Charles Ellis Kent Shannon Ag Engineering Extension Specialists
Yield Map Interpretation Man Made Variables –Variety –Planting date –Tillage –Compaction Natural Variability –Soil fertility –Soil type –Drainage
Data Sources Yield Data Aerial Photos EC Data Soils
Man Made Variables Varieties Tillage Planting Date Compaction Chemical Applications Fertilizer Applications
Man Made Variables Varieties Tillage Planting Date Compaction Chemical Applications Fertilizer Applications
Natural Variables Soils Drainage Soils
Man Made Variables Fertility Field History
Aerial Photos Man made variables –Compaction –Drainage Natural Variability Drainage
Aerial Photos
Image Obtain Aerial Photos Terraserver FSA Show history of field
Soil EC Readings
Surface Drainage
Surface Drainage Affects Tillage Planting Date Seeding Depth Emergence Leaching Harvesting
97 beans
99 Beans
2003 Beans
Multiple Years of Yield Data Combining Multiply Years Using MapCalc Excel
3 yr average bean yield
Combine Elevation
Elevation RTK
Combine and RTK Elevation
Yield and Topography Pond
Possible Solutions Drain Pond Remove Berm Around Pond Drain Field After Pond Removal Tillage to help drainage
2004 corn Yield variability has diminished. What are the causes?
Bu/A 1997 Corn Grain Yield - ASEQ Field 1; Centralia, MO
Ranking of Yield Variability and Ease of Remedy Adapted from Larry Lotz, “Yield Monitors and Maps: Making Decisions”, Ohio State Univ. Cause of Yield Variation Least likely Most likely Ease of Remedy Easy Difficult Mechanical/ Equipment Problems Nitrogen (corn) Traffic Problems Hybrid Variety Field Border Characteristics Organic matter Disease Planter color Seed Depth Tillage P & K Compaction Drainage Past history Weather Soil type Insects Weeds Plant date pH Population
Bu/A Topsoil variation Low soil P and K End-row compaction Soil pH Historically managed less intensively Treeline and endrow compaction Greater weed pressure Nearly flat, ponding 1997 Corn Grain Yield - ASEQ Field 1; Centralia, MO
RTK GPS Elevation Map 1997 Corn Yield Map
Multiple Years of Point Yield Maps 1998 Beans1999 Corn
Multiple Years of Point Yield Maps 2000 Beans2001 Corn
RTK GPS Elevation Map 1997 Corn Yield Map
Multiple Years of Interpolated Yield Maps 1998 Beans1999 Corn
Multiple Years of Interpolated Yield Maps 2000 Beans2001 Corn
Using MapCalc Software to Better Visualize Elevation Difference with Yield Data
Equipment Used for RTK GPS Data Collection Use a PocketPC computer running GPS data collection software
RTK Base Station
Possible Solution with a PTO-Ditchers