ATLAS TRT R. Van Berg, Sept. 2, ASDBLR & DTMROC Testing Production Run Completion Rick Van Berg for Gabe Hare, Mike Reilly

ATLAS TRT R. Van Berg, Sept. 2, DTMROC Tests Analog (PMU): –I DD –DAC outputs –Sense inputs (Temp/Voltage) –Test pulse outputs Digital: –Complete Verilog test suite from Vladimir Analog and Digital tests have been integrated

ATLAS TRT R. Van Berg, Sept. 2, DTMROC Status Production Testing Completed 8/25/04 –Production Test cuts very stringent –Will want to rerun after sorting to pick up additional good chips Expect about 30+% of “Bad” chips to pass on a second pass Sorting Files Assembled –Sort as needed or as possible

ATLAS TRT R. Van Berg, Sept. 2, DTMROC Status II 36,338 Chips Tested. 24,912 Passed 12,731 Failed 66% Pass Rate –Will add at least 10% with a second pass –Need to test some remaining pre-prod chips TRT Requires about 33k (with PP etc.) –May want to package a few more wafers

ATLAS TRT R. Van Berg, Sept. 2, DTM Loss Statistics Total Tested35,753 Total Passed24,912 Failed Digital7,537 Failed TP Amp60 Failed TP Delay4,331 Failed Sense488

ATLAS TRT R. Van Berg, Sept. 2, ASDBLR Testing Status 139,058 ASDBLR have been tested. –Includes LHCb wafers (~20% of total) –TRT owns about 59k ”good” chips after DC and parametric cuts. –Retesting of ”bad” chips should yield some additional (small) gain TRT Requirement (A/B/C/Barrel + ~20% spares) is 64k chips

ATLAS TRT R. Van Berg, Sept. 2, ASDBLR Tests Analog (PMU): –Power Supplies I CC, I EE –A/B Input Voltages & Resistances –Tracking, Transition Threshold I/V –Data Output Switching (I A, I B in On & Off States) Parametric: –50% Efficiency Thresholds Tracking at: 0 fC, 3 fC, 5 fC Transition at: 30 fC, 50 fC

ATLAS TRT R. Van Berg, Sept. 2, Input Resistance Cuts 4,273 had at least one input outside of the input Resistance limits of 10,000 – 50,000 Ohms Nominal = 38 kOhms

ATLAS TRT R. Van Berg, Sept. 2, Power Supply Cuts 10,744 were outside of the P power supply current limits of ,480 were outside of the N power supply current limits of ,881 failed BOTH P power supply and N power supply

ATLAS TRT R. Van Berg, Sept. 2, Input Diode Cuts 9,898 had at least one input outside of the input Diode voltage limits of V

ATLAS TRT R. Van Berg, Sept. 2, Ternary Output Drive Current

ATLAS TRT R. Van Berg, Sept. 2, Sequential Losses Preliminary Tests 4,273 : Of All Chips Failed Input Resistance Tests 10,406 : Remaining Chips Failed Power Supply Tests 519 : Remaining Chips Failed Input Diode Voltage Tests 1,300 : Remaining Chips Failed Threshold Current Tests 838 : Remaining Chips Failed Output Current Sum Tests 11,760 : Remaining Chips Failed Output Switching Tests 19,684 : Remaining Chips Failed Half Efficiency Point Search

ATLAS TRT R. Van Berg, Sept. 2, Preliminary Test Co-Variances 0 : any Input Resistor and P power supply 2382 : any Input Resistor and N power supply 572 : any Input Resistor and BLR of power supply 3115 : any Input Resistor and any Input Diode 1106 : any Input Resistor and any Threshold 1074 : any Input Resistor and any Output Sum 1386 : any Input Resistor and any Comparator Switching 3126 : any Input Resistor and any Half Efficiency Point Search 8881 : P power supply and N power supply 6820 : P power supply and BLR of power supply 7322 : P power supply and any Input Diode 7586 : P power supply and any Threshold 7295 : P power supply and any Output Sum 8398 : P power supply and any Comparator Switching 9593 : P power supply and any Half Efficiency Point Search 6893 : N power supply and BLR of power supply 7220 : N power supply and any Input Diode 7560 : N power supply and any Threshold 7679 : N power supply and any Output Sum 8493 : N power supply and any Comparator Switching 9348 : N power supply and any Half Efficiency Point Search 6099 : BLR of power supply and any Input Diode 6420 : BLR of power supply and any Threshold 6278 : BLR of power supply and any Output Sum 6876 : BLR of power supply and any Comparator Switching 7162 : BLR of power supply and any Half Efficiency Point Search 6799 : Any input Diode and any Threshold 6517 : Any input Diode and any Output Sum 7324 : Any input Diode and any Comparator Switching 9549 : Any input Diode and any Half Efficiency Point Search 7145 : Any Threshold and any Output Sum 7849 : Any Threshold and any Comparator Switching 8441 : Any Threshold and any Half Efficiency Point Search 8233 : Any Output Sum and any Comparator Switching 8795 : Any Output Sum and any Half Efficiency Point Search : Any Comparator Switching and any Half Efficiency Point Search

ATLAS TRT R. Van Berg, Sept. 2, Zero Injected Charge

ATLAS TRT R. Van Berg, Sept. 2, ~ 5 fC Injected Charge

ATLAS TRT R. Van Berg, Sept. 2, Found Half Efficiency Points

ATLAS TRT R. Van Berg, Sept. 2, Zero Charge Deviations – Worst Channel from Average

ATLAS TRT R. Van Berg, Sept. 2, ~5 fC Deviations

ATLAS TRT R. Van Berg, Sept. 2, fC Channel Offsets

ATLAS TRT R. Van Berg, Sept. 2, fC Matching After Prelim Cuts V V

ATLAS TRT R. Van Berg, Sept. 2, ~30 fC Matching After Prelim Cuts +/ V

ATLAS TRT R. Van Berg, Sept. 2, ASDBLR Summary 139,000 chips tested About 59,000, 53 % pass all cuts –Except – No tests for shorted test capacitors (see Mitch’s talk) –Maybe a few percent more good chips remaining in “bad” group (tester errors) Enough for A / B / C / Barrel plus 10% spare boards – NO SPARE REPLACEMENT CHIPS

ATLAS TRT R. Van Berg, Sept. 2, S(M)ummary II Need to understand / test / etc. shorted test capacitor effect Need to develop bad chip replacement strategy for board repairs Need to sort and pack up chips (still work for the Exatron and it’s friends)