Lecture 15: Scaling & Economics. CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics2 Outline  Scaling –Transistors –Interconnect –Future.

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Lecture 15: Scaling & Economics
Lecture 15: Scaling & Economics
Chapter 10: IC Technology
Presentation transcript:

Lecture 15: Scaling & Economics

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics2 Outline  Scaling –Transistors –Interconnect –Future Challenges  Economics

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics3 Moore’s Law  Recall that Moore’s Law has been driving CMOS [Moore65] Moore’s Law today Corollary: clock speeds have improved

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics4 Why?  Why more transistors per IC? –Smaller transistors –Larger dice  Why faster computers? –Smaller, faster transistors –Better microarchitecture (more IPC) –Fewer gate delays per cycle

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics5 Scaling  The only constant in VLSI is constant change  Feature size shrinks by 30% every 2-3 years –Transistors become cheaper –Transistors become faster and lower power –Wires do not improve (and may get worse)  Scale factor S –Typically –Technology nodes

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics6 Dennard Scaling  Proposed by Dennard in 1974  Also known as constant field scaling –Electric fields remain the same as features scale  Scaling assumptions –All dimensions (x, y, z => W, L, t ox ) –Voltage (V DD ) –Doping levels

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics7 Device Scaling ParameterSensitivityDennard Scaling L: Length1/S W: Width1/S t ox : gate oxide thickness1/S V DD : supply voltage1/S V t : threshold voltage1/S NA: substrate dopingS  W/(Lt ox )S I on : ON current  (V DD -V t ) 2 1/S R: effective resistanceV DD /I on 1 C: gate capacitanceWL/t ox 1/S  : gate delay RC1/S f: clock frequency 1/  S E: switching energy / gateCV DD 2 1/S 3 P: switching power / gateEf1/S 2 A: area per gateWL1/S 2 Switching power densityP/A1 Switching current densityI on /AS

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics8 Observations  Gate capacitance per micron is nearly independent of process  But ON resistance * micron improves with process  Gates get faster with scaling (good)  Dynamic power goes down with scaling (good)  Current density goes up with scaling (bad)

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics9 Example  Gate capacitance is typically about 1 fF/  m  The typical FO4 inverter delay for a process of feature size f (in nm) is about 0.5f ps  Estimate the ON resistance of a unit (4/2 ) transistor.  FO4 = 5  = 15 RC  RC = (0.5f) / 15 = (f/30) ps/nm  If W = 2f, R = 16.6 k  –Unit resistance is roughly independent of f

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics10 Real Scaling  t ox scaling has slowed since 65 nm –Limited by gate tunneling current –Gates are only about 4 atomic layers thick! –High-k dielectrics have helped continued scaling of effective oxide thickness  V DD scaling has slowed since 65 nm –SRAM cell stability at low voltage is challenging  Dennard scaling predicts cost, speed, power all improve –Below 65 nm, some designers find they must choose just two of the three

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics11 Wire Scaling  Wire cross-section –w, s, t all scale  Wire length –Local / scaled interconnect –Global interconnect Die size scaled by D c  1.1

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics12 Interconnect Scaling ParameterSensitivityScale Factor w: width1/S s: spacing1/S t: thickness1/S h: height1/S D c : die sizeDcDc R w : wire resistance/unit length1/wtS2S2 C wf : fringing capacitance / unit lengtht/s1 C wp : parallel plate capacitance / unit lengthw/h1 C w : total wire capacitance / unit lengthC wf + C wp 1 t wu : unrepeated RC delay / unit lengthRwCwRwCw S2S2 t wr : repeated RC delay / unit lengthsqrt(RCR w C w )sqrt(S) Crosstalk noisew/h1 E w : energy per bit / unit lengthC w V DD 2 1/S 2

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics13 Interconnect Delay ParameterSensitivityLocal / SemiglobalGlobal l: length1/SDcDc Unrepeated wire RC delayl 2 t wu 1S2Dc2S2Dc2 Repeated wire delaylt wr sqrt(1/S)D c sqrt(S) Energy per bitlE w 1/S 3 D c /S 2

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics14 Observations  Capacitance per micron is remaining constant –About 0.2 fF/  m –Roughly 1/5 of gate capacitance  Local wires are getting faster –Not quite tracking transistor improvement –But not a major problem  Global wires are getting slower –No longer possible to cross chip in one cycle

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics15 ITRS  Semiconductor Industry Association forecast –Intl. Technology Roadmap for Semiconductors

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics16 Scaling Implications  Improved Performance  Improved Cost  Interconnect Woes  Power Woes  Productivity Challenges  Physical Limits

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics17 Cost Improvement  In 2003, $0.01 bought you 100,000 transistors –Moore’s Law is still going strong [Moore03]

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics18 Interconnect Woes  SIA made a gloomy forecast in 1997 –Delay would reach minimum at 250 – 180 nm, then get worse because of wires  But… –Misleading scale –Global wires  100 kgate blocks ok [SIA97]

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics19 Reachable Radius  We can’t send a signal across a large fast chip in one cycle anymore  But the microarchitect can plan around this –Just as off-chip memory latencies were tolerated

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics20 Dynamic Power  Intel VP Patrick Gelsinger (ISSCC 2001) –If scaling continues at present pace, by 2005, high speed processors would have power density of nuclear reactor, by 2010, a rocket nozzle, and by 2015, surface of sun. –“Business as usual will not work in the future.”  Attention to power is increasing [Intel]

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics21 Static Power  V DD decreases –Save dynamic power –Protect thin gate oxides and short channels –No point in high value because of velocity sat.  V t must decrease to maintain device performance  But this causes exponential increase in OFF leakage  Major future challenge Static Dynamic [Moore03]

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics22 Productivity  Transistor count is increasing faster than designer productivity (gates / week) –Bigger design teams Up to 500 for a high-end microprocessor –More expensive design cost –Pressure to raise productivity Rely on synthesis, IP blocks –Need for good engineering managers

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics23 Physical Limits  Will Moore’s Law run out of steam? –Can’t build transistors smaller than an atom…  Many reasons have been predicted for end of scaling –Dynamic power –Subthreshold leakage, tunneling –Short channel effects –Fabrication costs –Electromigration –Interconnect delay  Rumors of demise have been exaggerated

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics24 VLSI Economics  Selling price S total –S total = C total / (1-m)  m = profit margin  C total = total cost –Nonrecurring engineering cost (NRE) –Recurring cost –Fixed cost

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics25 NRE  Engineering cost –Depends on size of design team –Include benefits, training, computers –CAD tools: Digital front end: $10K Analog front end: $100K Digital back end: $1M  Prototype manufacturing –Mask costs: $5M in 45 nm process –Test fixture and package tooling

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics26 Recurring Costs  Fabrication –Wafer cost / (Dice per wafer * Yield) –Wafer cost: $500 - $3000 –Dice per wafer: –Yield: Y = e -AD For small A, Y  1, cost proportional to area For large A, Y  0, cost increases exponentially  Packaging  Test

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics27 Fixed Costs  Data sheets and application notes  Marketing and advertising  Yield analysis

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics28 Example  You want to start a company to build a wireless communications chip. How much venture capital must you raise?  Because you are smarter than everyone else, you can get away with a small team in just two years: –Seven digital designers –Three analog designers –Five support personnel

CMOS VLSI DesignCMOS VLSI Design 4th Ed. 15: Scaling and Economics29 Solution  Digital designers: –$70k salary –$30k overhead –$10k computer –$10k CAD tools –Total: $120k * 7 = $840k  Analog designers –$100k salary –$30k overhead –$10k computer –$100k CAD tools –Total: $240k * 3 = $720k  Support staff –$45k salary –$20k overhead –$5k computer –Total: $70k * 5 = $350k  Fabrication –Back-end tools: $1M –Masks: $5M –Total: $6M / year  Summary –2 $7.91M / year –$16M design & prototype