Logic simulator and fault diagnosis Fan Wang Dept. of Electrical & Computer Engineering Auburn University ELEC7250 Term Project Spring 06’

Slides:



Advertisements
Similar presentations
DAT2343 Basic Logic Gates © Alan T. Pinck / Algonquin College; 2003.
Advertisements

Based on text by S. Mourad "Priciples of Electronic Systems" Digital Testing: Design Representation and Fault Detection
10/4-6/05ELEC / Lecture 111 ELEC / (Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic Circuits.
16/04/20151 Hardware Descriptive Languages these notes are taken from Mano’s book It can represent: Truth Table Boolean Expression Diagrams of gates and.
ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES Logic Simulation.
4/20/2006 ELEC7250 Project: Grimes 1 Logic Simulator for Hierarchical Bench Hillary Grimes III – Term Project ELEC 7250 – Spring 2006.
A Diagnostic Test Generation System Yu Zhang Vishwani D. Agrawal Auburn University, Auburn, Alabama USA Nov. 3rdITC
Copyright 2001, Agrawal & BushnellDay-1 PM Lecture 4a1 Design for Testability Theory and Practice Lecture 4a: Simulation n What is simulation? n Design.
Parallel Pattern Single Fault Propagation for Combinational Circuits VLSI Testing (ELEC 7250) Submitted by Blessil George, Jyothi Chimakurthy and Malinky.
Dominance Fault Collapsing - Alok Doshi ELEC 7250 Spring 2004.
4/27/2006 ELEC7250: White 1 ELEC7250 VLSI Testing: Final Project Andrew White.
4/26/05Han: ELEC72501 Department of Electrical and Computer Engineering Auburn University, AL K.Han Development of Parallel Distributed Computing System.
4/25/2006 ELEC7250: Hill 1 Brad Hill ELEC 7250 Logic Simulator.
Copyright 2001, Agrawal & BushnellDay-1 PM Lecture 61 Design for Testability Theory and Practice Lecture 6: Combinational ATPG n ATPG problem n Example.
4/20/2006ELEC7250: Alexander 1 LOGIC SIMULATION AND FAULT DIAGNOSIS BY JINS DAVIS ALEXANDER ELEC 7250 PRESENTATION.
ELEC 7250 Term Project Presentation Khushboo Sheth Department of Electrical and Computer Engineering Auburn University, Auburn, AL.
Computability and Complexity 32-1 Computability and Complexity Andrei Bulatov Boolean Circuits.
Feb 2, '06, updated Mar 23, '06ELEC Project, Presentation, Paper 1 ELEC VLSI Testing Spring 2006 Class Project Class Presentation Term.
Spring 08, Mar 27 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Fault Simulation Vishwani D. Agrawal James J.
Spring 07, Mar 8 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 Timing Verification and Optimization Vishwani D.
1 Reconvergent Fanout Analysis of Bounded Gate Delay Faults Dept. of ECE, Auburn University Auburn, AL Master’s Defense Hillary Grimes Thesis Advisor:
04/25/2006 ELEC 7250 Final Project: Jie Qin 1 Logic Simulator for Combinational Circuit Jie Qin Dept. of Electrical and Computer Engineering Auburn University,
Dominance Fault Collapsing Lu Yuanlin ECE Dept. Auburn University.
Logic Simulation 2 Outline –Timing Models –Simulation Algorithms Goal –Understand timing models –Understand simulation algorithms Reading –Gate-Level Simulation.
Dominance Fault Collapsing of Combinational Circuits By Kalpesh Shetye & Kapil Gore ELEC 7250, Spring 2004.
Spring 08, Feb 6 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Timing Verification and Optimization Vishwani D.
Spring 08, Apr 8 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2008 Combinational Circuit ATPG Vishwani D. Agrawal.
Unit II Test Generation
VLSI Testing Lecture 7: Combinational ATPG
ECE 2372 Modern Digital System Design
TOPIC : Types of fault simulation
MBSat Satisfiability Program and Heuristics Brief Overview VLSI Testing B Marc Boulé April 2001 McGill University Electrical and Computer Engineering.
ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTES Logic Modeling.
TESTING OF COMBINATIONAL LOGIC CIRCUITS
Gates and Logic Dr John Cowell phones off (please)
Dominance Fault Collapsing 1 VLSI TESTING PROJECT Dominance Fault Collapsing Anandshankar Mudlapur Arun Balaji Kannan Muthu Balaji Ramkumar Muthu Balan.
1 Carry Lookahead Logic Carry Generate Gi = Ai Bi must generate carry when A = B = 1 Carry Propagate Pi = Ai xor Bi carry in will equal carry out here.
Abdul-Rahman Elshafei – ID  Introduction  SLAT & iSTAT  Multiplet Scoring  Matching Passing Tests  Matching Complex Failures  Multiplet.
Manufacture Testing of Digital Circuits
A New ATPG Algorithm for 21 st Century: The wojoRithm John Sunwoo Electrical & Computer Engineering Auburn University, AL.
Combinational Logic Design. 2 Combinational Circuits A combinational logic circuit has: ♦ A set of m Boolean inputs, ♦ A set of n Boolean outputs ♦ n.
Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects Fei Wang 1,2, Yu Hu 1, Huawei Li 1, Xiaowei Li 1, Jing Ye 1,2 1 Key Laboratory.
TOPIC : Fault detection and fault redundancy UNIT 2 : Fault modeling Module 2.3 Fault redundancy and Fault collapsing.
How does a Computer Add ? Logic Gates within chips: AND Gate A B Output OR Gate A B Output A B A B
Copyright 2001, Agrawal & BushnellLecture 6:Fault Simulation1 VLSI Testing Lecture 6: Fault Simulation Dr. Vishwani D. Agrawal James J. Danaher Professor.
Combinational Logic Design. 2 Combinational Circuits A combinational logic circuit has: ♦ A set of m Boolean inputs, ♦ A set of n Boolean outputs ♦ n.
On the Relation Between Simulation-based and SAT-based Diagnosis CMPE 58Q Giray Kömürcü Boğaziçi University.
1 Digital Logic Design (41-135) Chapter 6 Combinational Circuit Building Blocks Younglok Kim Dept. of Electrical Engineering Sogang University Spring 2006.
VLSI Testing Lecture 5: Logic Simulation
VLSI Testing Lecture 5: Logic Simulation
Vishwani D. Agrawal Department of ECE, Auburn University
VLSI Testing Lecture 6: Fault Simulation
CS137: Electronic Design Automation
Lecture 7 Fault Simulation
VLSI Testing Lecture 6: Fault Simulation
VLSI Testing Lecture 7: Combinational ATPG
ELEC Digital Logic Circuits Fall 2014 Logic Testing (Chapter 12)
COMBINATIONAL LOGIC.
Vishwani D. Agrawal James J. Danaher Professor
Automatic Test Generation for Combinational Circuits
ELEC-7250 VLSI Testing Scan Design Implementation on ISCAS ’89 Benchmark Circuits – s1423 and s1512 Completed by: Jonathan Harris.
VLSI Testing Lecture 8: Sequential ATPG
A New ATPG Algorithm for 21st Century: The wojoRithm
Fault Models, Fault Simulation and Test Generation
VLSI Testing Lecture 7: Combinational ATPG
Automatic Test Pattern Generation
Veeraraghavan Ramamurthy
VLSI Testing Lecture 4: Testability Analysis
ELEC Digital Logic Circuits Fall 2015 Logic Testing (Chapter 12)
Digital Logic Design Basics Combinational Circuits Sequential Circuits.
Presentation transcript:

Logic simulator and fault diagnosis Fan Wang Dept. of Electrical & Computer Engineering Auburn University ELEC7250 Term Project Spring 06’

Motivations Write a compiler for the hierarchical bench format. Write a logic simulator for combinational circuit Attempt to diagnose the design error

Compiler For hierarchical bench format, the compiler can flatten it Compiler can use flattened netlist to generate the simulation table For convenience, this part is implemented by Matlab. Simulation table Example (generated by matlab) INPUT: 0 INPUT: 1 INPUT: 2 OUTPUT: 15 OUTPUT: 16 Gatetype: XOR Gatename: XOR1 Fanin_List: 2 1 Fanout_List: FA_1_1 /***************************/ Gatetype: AND Gatename: AND1 Fanin_List: 1 2 Fanout_List: FA_1_2 /***************************/ Gatetype: AND Gatename: AND2 Fanin_List: 0 FA_1_1 Fanout_List: FA_1_3 /***************************/ Gatetype: XOR Gatename: XOR2 Fanin_List: FA_1_1 0 Fanout_List: 3 /***************************/

Logic Simulation 1.Read vector to the PI 2.Initialize all the PO, Internal nodes as unknown states (-1). 3.Propagate the value from PI to PO. F or each unknown internal node, search all file until it gets value. If all the PO get value, step 3 end. F or each unknown internal node, search all file until it gets value. If all the PO get value, step 3 end. 4.Repeat 1 to get the next vector. * Implemented by C program

Logic Simulation (Cont.)

Some Comments on logic simulator  The search based algorithm: 1.Time complexity is O( ), N: the number of gates. The worst case is, all gates are list in reverse order. The time complexity is The depth of circuit x The depth of circuit x 2. The levelization of the circuit, the time complexity will the same as the logic simulation based search based algorithm  Better algorithm can be used: link list based algorithm

Diagnosis (Sensitized Path Segmentation + PO trace back) Check PO, see whether the PO get values as expected If error happens: 1. trace back from the error PO to PI to check the paths (PATH 1). 1. trace back from the error PO to PI to check the paths (PATH 1). 2. check which path is sensitized by the vector from PI to PO (PATH 2). 2. check which path is sensitized by the vector from PI to PO (PATH 2). The error is on the path : PATH 1 PATH2 * Not for multiple fault diagnosis

Design error: OR --> AND !! (PI) (PO Good Value) (PO Good Value) (PO Bad Value) (PO Bad Value) V V V V p3 p1 * Based on 4 vectors: error is on p3 p2 p1 Sensitized path segmentation and1 or1 and2 xor1 p2

Thanks!