Determining Optical Properties of Uranium Oxide Richard Sandberg Brigham Young University Special Thanks to Kristi Adamson, Shannon Lunt, Elke Jackson, Dr. David Allred, Nathan Orton, Mike Diehl, Dr. Steven Turley

Why study Uranium Oxide? IMAGE Satellite Mirror Project High Theoretical Reflectivity Applications: Medical Equipment Space Observation Lithography

Creating our samples. Reactive DC Magnetron Sputtering Creates a uranium oxide film We create samples with thickness of 15–30 nanometers

Characterizing Samples Why these tools? X-Ray Diffraction- thickness Atomic Force Microscopy-thickness & roughness X-Ray Photoelectric Spectroscopy- chemical state Ellipsometry- thickness & valence state

Determining Composition with XPS Peaks indicate electron binding energy Peaks shift with varying oxidation states

Ellipsometry Polarized light hits sample Reflects elliptically polarized light

Finding Constants from Ellipsometry Lorentz Oscillator models were used to extract reflectance and n and k Ellipsometry Limitations Comparison to Literature They used bulk samples, we use thin films We know our layers are hybrid of different layers

Suggestion of Band Model for UO 2 (D: Electron density of states) From Naegele et al 1976

Reflectance of Our Samples Sample 1 Sample 2 Sample 3Sample 4

Further Research Depth Profiling At-wavelength reflection measurements Monochrometer Longer time scale for oxidation

Thank you Richard Sandberg Brigham Young University Phone (801)