Deformation measurement by compton alignment Satoru Takahashi, Nagoya Univ. OPERA emulsion workshop
Procedure of compton alignment for large area global alignment by X-ray mark division small area and local alignment with compton tracks for each area –unit area:5*5mm 2 CS pl1 CS pl2
PH>=10 dr<150μm dθ<0.4rad signal : 35.5 significance : 27.8 shift vector: 10.80, peak# : 37 Area:119 (11, 9) mean : 1.49 RMS : 1.28 BG#/(6×6)μm 2 position displacement ev : , CS : 2-20, KCl : 14h
Area:000 (0, 0) signal : 12.7 significance : 11.4 shift parameter: -2.12, 0.97 Area: 050 (2, 4) signal : significance : shift parameter: Area:150 (6, 12) signal : significance : shift parameter: Area:100 (4, 8) signal : significance : shift parameter:
shift vector map Shift vector shows X-ray mark alignment error and deformation.
shift vector distribution Mean [micron] : 3.4, -4.8 : X-ray mark alignment error RMS [micron] : 3.9, 2.6 : deformation Max [micron] : 13.8 : maximum position displacement due to X-ray alignment error and deformation
differential vector map RMS : 0.32um/mm
ev : , CS : 6-9, KCl : 14h Mean [micron] : -4.3, RMS [micron] : 4.2, 5.4 Max [micron] : 26.7
0.30[micron/mm]
ev : , CS : 5-9, KCl : 14h Mean [micron] : -2.9, 11.0 RMS [micron] : 4.3, 7.8 Max [micron] : 31.5
0.33[micron/mm]
ev : , CS : 12-7, KCl : 4h Mean [micron] : 5.6, 2.7 RMS [micron] : 3.5, 2.1 Max [micron] : 12.6
0.30[micron/mm]
Summary X-ray alignment error [micron] : (4.8, 11.1) deformation [micron] : (4.0, 4.5) maximum position displacement [micron] : , 11.1 (RMS) 4.0, 4.5 (average) 31.5 (Max.)