GND HALT TDI_1 TCK TMS VREF TDO_10 Signal distribution on the JTAG cable.

Slides:

Advertisements

Similar presentations

The Embedded Compression Dump OCI Investigations.

Advertisements

Bus topology refers to a single cable that connects all the work stations, servers, printers and other devices on the network. The cable runs from one.

LBNL PIXEL IPHC 2009_06_LG1 Flex Cable Development The development of the flex cable for sensor readout and control is envisioned as a 4 stage process.

1 Service panels run from detector end to end of support tube X-section through service panels 3-D view of panels PP0 region. All services break here Patch.

The Little Buffer PCB C3 TIP GND R4 R3 R1 R3 R2 R6K J L +V 0V –V–V A D C E F A1 A3 H BRI03 TL071 C2C1.

FPGA Configuration. Introduction What is configuration? – Process for loading data into the FPGA Configuration Data Source Configuration Data Source FPGA.

LOGSYS Development Environment of Embedded Systems Tamás Raikovich Béla Fehér Péter Laczkó Budapest University of Technology and Economics Department of.

L. Greiner1HFT Hardware 09/23/2010 STAR Vertex-6 based PXL RDO board Design concept and items for discussion.

SAM7 Hardware Considerations Frederic BOYER AT91 Support Group. Version 1.0 October 2006.

PLD Technology Basics. Basic PAL Architecture DQ Q CLK OE Fuse.

Lecture 28 IEEE JTAG Boundary Scan Standard

Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 291 Lecture 29 IEEE JTAG Advanced Boundary Scan & Description Language (BSDL) n Special scan.

May 13, FNAL Hybrid Thermal Test Status  Hybrid Thermal Test Procedure  Test Results Eva Medel FNAL CMS Group June 22, 2004.

BEEKeeper Remote Management and Debugging of Large FPGA Clusters Terry Filiba Navtej Sadhal.

Uli Schäfer 1 JEM1: Status and plans Hardware status Firmware status Plans.

Real-Time Systems Design JTAG – testing and programming.

Presented by Karin Shusterman Another use of the JTAG Interface on FPGA.

David Nelson STAVE Test Electronics July 21, ATLAS STAVE Test Results Version 1 David Nelson July 21, 2008.

TAP (Test Access Port) JTAG course June 2006 Avraham Pinto.

Update on SP02 design by Victor Golovtsov & Lev Uvarov Trigger Meeting at Rice August 2002.

Guidelines for Chip DFT Based on Boundary Scan Reference to an article by Ben Bannetts By Regev Susid.

Configuration. Mirjana Stojanovic Process of loading bitstream of a design into the configuration memory. Bitstream is the transmission.

111 Target Hardware Debug ULINK2 and ULINK-ME Including Real-Time Agent.

RE-configure FPGA through JTAG ◦ Heidelberg option, needs reprogramming of Altera devices (not in this talk)  Needed for re-programming after loss of.

MS, LG, XS PXL ladder tests at IPHC, May 1-7, Preliminary Ladder Testing Results At IPHC MS, XS, LG.

CPE 169 Digital Design Laboratory Digilent Inc. Nexys Development Board.

1 EE 587 SoC Design & Test Partha Pande School of EECS Washington State University

Scan and JTAG Principles1 Scan and JTAG Principles ARM Advanced RISC Machines.

® ChipScope ILA TM Xilinx and Agilent Technologies.

XC9000 Series In-System Programming (ISP) and Manufacturing Flows Frank Toth February 20, 2000 ®

PPIB and ODMB Status Report Rice University April 19, 2013.

BS Test & Measurement Technique for Modern Semi-con devices & PCBAs.

IEEE P1687 Obstacle Course John Potter Sr. Principal Technologist

Lecture #3 Page 1 ECE 4110– Sequential Logic Design Lecture #3 Agenda 1.FPGA's 2.Lab Setup Announcements 1.No Class Monday, Labor Day Holiday 2.HW#2 assigned.

M. Szelezniak1PXL Sensor and RDO review – 06/23/2010 STAR Hardware Prototyping Status.

Lecture #3 Page 1 ECE 4110– Sequential Logic Design Lecture #3 Agenda 1.FPGA's 2.Lab Setup Announcements 1.No Class Monday, Labor Day Holiday 2.HW#2 assigned.

Leo Greiner IPHC meeting HFT PIXEL DAQ Prototype Testing.

SCSI Chapter 13. SCSI Small Computer System Interface introduced in 1979 as a means of mass storage Common SCSI devices Hard drives- Scanners Tape backup.

Testing results of PXL RDO board JTAG daisy chain

Older Ethernet Standards Do Not Use Hubs or Switches Daisy-Chain Layouts 10Base5 –10 Mbps, Baseband, 500 meters per segment (daisy chain) 10Base2 –10 Mbps,

ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS Boundary Scan.

Leo Greiner PIXEL Hardware meeting HFT PIXEL detector LVDS Data Path Testing.

April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view.

CARDIAC meeting – 30 Sept 05 M3R3-M5R3-M5R4 FEE status.

-Network topology is the layout of the connection between the computers. -It is also known as the pattern in which computers.

A+ Guide to Managing and Maintaining Your PC Fifth Edition Chapter 22 All About SCSI.

CCB to OH Interface M.Matveev Rice University November 12,

(612) Slide No: 1 RDM CONFIDENTIAL Intuitive Circuit controller PR0650 CCT.

CCB to OH Interface M.Matveev Rice University February 22,

© Copyright 2010 Xilinx ML605 MultiBoot Design May 2010 © Copyright 2010 Xilinx XTP043.

October 12th 2005 ICALEPCS 2005D.Charlet The SPECS field bus  Global description  Module description Master Slave Mezzanine  Implementation  Link development.

DHH Status Igor Konorov TUM, Physics Department, E18 PXD DAQ workshop Münzenberg –June 9-10, 2011.

SYSTEM-LEVEL TEST TECHNIQUES INTRODUCTION In the 1970s, the in-circuit testing (ICT) method appeared. In the 1970s, the in-circuit testing (ICT) method.

全面推开营业税改征增值税试点政策培训. 什么是营改增？ “营改增”中的“营”指的是营业税，“ 增”指的是增值税。对大多数企业来说，增值税所带来的税负远低于营业税。减税本身就是积极的财政政策。营改增所实现的减税，不仅规模大、范围广，它本质上是一种“结构性减税”，从而构成“结构性改革”攻坚战中的实招。

The AMchip on the AMBoard Saverio Citraro PhD Student University of Pisa & I.N.F.N. Pisa.

AMC13 T1 Rev 2 Preliminary Design Review E. Hazen Boston University

A High-Speed and High-Capacity Single-Chip Copper Crossbar

COP Interface Requirements

Connection btw FE and Merger

Firmware Structure Alireza Kokabi Mohsen Khakzad Friday 9 October 2015

XC Developed for a Better ISP Solution

6. Terminations.

Is it no problem to use like that?

FMC adapter status Luis Miguel Jara Casas 5/09/2017.

JTAG and Multi-ICE National Taiwan University

CPE/EE 428/528 VLSI Design II – Intro to Testing (Part 3)

CPLD Product Applications

Task 1 You are going to use the Makey Makey arrow inputs to create a joystick / games controller. Step 1: Connect Makey.

CSC Muon Sorter Status Tests Plans M.Matveev August 21, 2003.

Presentation transcript:

GND HALT TDI_1 TCK TMS VREF TDO_10 Signal distribution on the JTAG cable

We will try the buffer solution first, and if it doesn’t work, try one cut cable. GND HALT TDI_1 TCK TMS VREF TDO_10 SN74LVC126A Cut here VREF GND Using driver for TCK and TMS Results (2 iterations): all 10 boards are found. Successful configuration of boards 1, 4, 5, 6, 8, 9 Failure to configure boards 2, 3, 10 Using Xilinx USB programmer

Cut here Place patch here 3 shorter JTAG cable solution with drops of 3, 3, 4 each fed with a Xilinx programmer. All 3 cables the same. Using a shorter JTAG daisy chain cable (4 boards) JTAG recommended termination in place. All boards configure all times for 4 boards All boards configure all times for 3 boards (end board bypassed with switch) Using Xilinx USB programmer

Cut here Place patch here 2 shorter JTAG cable solution with drops of 5 boards each fed with a Xilinx programmer. Using a shorter JTAG daisy chain cable (5 boards and no termination) 3 tries – all configure all times Using Xilinx USB programmer NOTE: initial try in this configuration did not work well as the cable used was damaged (by cutting the traces to be used for the driver test) and the traces could not be reliably repaired. This cable did not work with termination attached.

The five drop daisy chain works reliably. We have fabricated three 5-drop daisy chain cables from the rest of the flex cables fabricated for the run. The operating configuration will consist of two 5-drop JTAG daisy chain cables driven with Xilinx USB JTAG programmers. We will bring the Digilent JTAG programmers (10) and the adapter boards as a backup. Conclusions