Review of I c variation, R c, RRR and other parameters D. Abraimov, H. W. Weijers, W. D. Markiewicz, M. Santos, J. McCallister, J. Jaroszynski, J. Jiang,

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Presentation transcript:

Review of I c variation, R c, RRR and other parameters D. Abraimov, H. W. Weijers, W. D. Markiewicz, M. Santos, J. McCallister, J. Jaroszynski, J. Jiang, J. Lu, V. Toplosky, B. Jarvis, S. Carter, Y. L. Viouchkov, and D. C. Larbalestier all NHMFL  Quality Assurance procedure for 32T project:  We are looking for compliance with our specification, which includes transport and geometrical properties of (Re)BCO tape using minimum set of measurements.  (Re)BCO coated conductor was purchased from SuperPower Inc. : 144 lengths, 60 m or 110 m each  Comparison of 4K in- field I c measured on short samples for conductors from different manufacturers This work was supported in part by the U.S. National Science Foundation under Grant No. DMR , DMR and the State of Florida. Special thanks to AMSC, Fujikura, SuNAM, SuperOx for providing samples for testing

BIIab High Jc B at 18 o to tape plane One of the major limiting factors of coil performance is sharp J c (  ) dependence in (Re)BCO The minimum I c for 32 T coil design occurs at 18 o critical angle between tape plane and magnetic field of 17 T Origins of specification for (Re)BCO conductor Xu A., et al., Superconducting Science and Technology, 23, (2010). BIIab Restriction on I c : Tape is being delivered in 110 or 60 m lengths, making joints resistance critical RRR>50 for low resistance of stabilizer in case of quench Dimensions Cu stabilizer layer should be uniform through length and width of the tape to provide mechanical stability between pancake windings and get uniform heat propagation Tape width should be uniform to avoid variations in I c and mechanical properties, difficulties in coil manufacturing 17 T Other transport properties:

Property of tape from the specificationValueUnits Minimum I c at 4.2 K, extrapolated to 17 T from I c (B) measured at 18 o angle >256A n from V~I n fit>25- Joints resistance measurements≤230  ·cm 2 Residual Resistivity Ratio of Cu (4.2 to 300 K)>50- Final conductor width4.10 ± 0.05mm Final conductor Thickness≤0.170 mm Cu Stabilizer Cross-sectional Area0.42 ± 0.01mm 2 Substrate cross-sectional Area0.20 ± 0.01mm 2 Ag layer thickness2.0 ± 0.5 mm (Re)BCO conductor specification (short list)

Current biasing: two Sorensen power supplies up to 1400 A Analog connection Current monitor: Keithley 2000 Voltage measurement: Keithley 2184A Magnet power supply: Lake Shore LS 622 LabView based program for automatic B and I bias sweeping and I c calculation I c testing system for 32 T tape characterization Oxford Instruments Superconducting 13.5 T (4.2K) magnet sample holder

Other techniques routine QA tests Nikon iNexiv VMA-2520 microscope Final conductor width Surface condition Thickness profiles Vibromet 2 Preparation cross-sections SEM visualization with Zeiss 1540 XB Cross beam Olympus Microscope BX41M-LED Total conductor thickness Cu Stabilizer cross‐sectional area Substrate cross-sectional area Simplimet 3000 Ag thickness ReBCO uniformity ab-plane orientation Transport measurements of R c, I c of lap joints in LN, self field

Additional techniques used for study properties of ReBCO tapes 16 T Quantum design PPMS for measuring in- field variable temperature angular dependence of I c and R(T); Rotator with split coil electromagnet 1T; 77K for measuring angular dependence of I c in full width tapes; YateStar system for measuring distribution of transport critical current at 77K, 0.8T

Contact resistance of lap joints

Contact resistance arranged by SP process run number Small spread within each run, but has large difference between some runs Maximum average 160 n  · cm 2 Peak maximum 230 n  · cm 2 Measurements done on standard lap joints with 80 mm overlap 80 mm 32T spec. M M have low I c (4K) and high joint resistance T=77K; SF

Measurements of in-field critical currents at fixed orientation I c (4.2K;18 o ;B)

Typical I c (B) dependence measured as field rises and decreases and current rises and decreases (LabView screenshot) No hysteresis and no damage during field sweep SP62 inner part of length (N5) Bias current measured from 200 A,  I=2 A This field dependence was measured during 39 min Depending on I c values field dependence takes 34 min – 40 min

Representative selection of I c (B) curves measured at 4.2 K with 18 o between sample plane and B. Orange horizontal line represents 256A minimum specified at 17T. B Most of measured samples have I c > 256 A; No hysteresis in increasing and decreasing field; These data have tight fit to I c ~B -  I

Progress in I c measurements: SP60 – SP207 Data arranged by NHMFL numbers – delivery time line Tapes SP65, 66, 79, 80 were sent for developing winding technique 144 lengths, 60 m or 110 m each

Histogram of I c measured at 77K, SF =130 A SD=10.5%

Histogram for I c measured at 4.2 K, 17 T, 18deg. Before we were dealing mostly with this conductor: produced with M3 machine Now we are receiving more M4 tapes suitable for top and bottom parts of the magnet M4: 16% I c variability M3: 16% of I c variability

I c (4K;17T;18 o ) data arranged as ascending SuperPower run number (we assume it as time line for each M3, M4 machine)

Same I c (4K;17T;18 o ) data as on previous slide, but arranged as ascending Observations : small difference in I c for samples from different ends; Tapes within one process have similar I c ; M4 process yields tapes with higher I c ; Uniform distribution with two steps at 270A and 480A

We are getting two types of conductors from different SuperPower Inc. machines with averaged lift factors 2.21 (M3) and 3.36 (M4)

M3 =283 A;  / M4 =450 A;  / No dramatic changes in  values. Interpretation: pinning mechanism is probably similar for low I c and high I c tapes

Standard deviation 5.7% At 77K; SF just few tapes have relative spread above 10% End to end relative variation of I c (77K; SF)

At 4.2K in-field more tapes have relative spread above 10% End to end relative variation of I c (4K; 17T; 18 o ) Standard deviation 9.6%

Same I c (4K;17T;18 o ) data as on previous slide, but arranged as ascending Observations : small difference in I c for samples from different ends; Tapes within one process have similar I c ; M4 process yields tapes with higher I c ; Uniform distribution with two steps at 270A and 480A

SP64 innerSP60 inner SEM images of ReBCO surface: Larger and irregularly shaped grains on SP60; more needle like grains for SP62-64; staircase like surface for SP60, but flat surface for SP61-64 After etching Cu and Ag

Ag ReBCO SEM cross-section of M4 SP129 SEM cross-section of M3 SP159 Ag ReBCO Different thickness for M3 and M4 machines

Ascending plot with ReBCO thicknesses

77K self-field critical current vs. ReBCO thickness dependence

M3 M4 4K in-field critical current density vs. ReBCO thickness dependence

Testing geometrical tolerances

Thickness profiles measured with Nikon microscope All profiles are nearly the same Optical image of typical cross section (SP 60 inner)

Width distributions for SP60 – SP64 tapes are within specification We noticed considerable improvement of tape width uniformity, which eliminates substantial part of variations in I c and mechanical properties.

Conductor width variation

Total thickness measured with micrometer

Cu area for SP tapes

RRR of stabilizer – parallel connection of Ag and Cu layers RRR meets the specification

Comparison of 4K in- field I c for conductors from different manufacturers

Comparison I c (4K; B) for tapes from different manufacturers measured up to 31.2T Orientation : field perpendicular to tape plane B

Comparison of I c (4K;B) in ReBCO conductors in-field up to 13.5T T=4K I c (B) measured in OX II Max. field is 13.5T Close to SP average SP Min. Ic

Comparison of conductor performances at 4.2K up to 13.5T Measured in OX II using up to 4 Sorensen DSC8-350E

ManufacturerMaterial  at BIIc  at 18deg. SuperPowerReBCO SuNAMReBCO0.6; ; 0.68 SuperOxReBCO0.54; ; 0.59 FujikuraReBCO0.641; AMSCReBCO0.74 SumitomoBi ; OP processedBi round d=1.38mm0.33 OP processedBi-2212 d=1.154 mm0.27; 0.26; OP processedBi-2212 d=0.688 mm0.27 Comparison of  values

Comparison of conductor performances at 4.2K Measured in OX II using up to 4 Sorensen DSC8-350E

X2 X1.5 X1 Difference in anisotropy

Comprehensive analysis of various tape properties is necessary for building reliable magnet. I c measured in specific field orientation at 4.2K is important for predicting coil performance, not testing at self-field 77 K; J c (B, 4K, 18 o ) did not dropped as ReBCO thickness got 60% increase in M4 tapes; Transport and geometrical properties of commercially available (Re)BCO conductor from SuperPower Inc. are not perfect but sufficient for making 32 T user magnet; Among ReBCO conductors SuperPower Inc. and Fujikura have largest I c (4K, B); Tapes from SuperOx show smallest among ReBCO CC  and smallest I c anisotropy; Conclusions:

How to choose operating current after measuring I c in about 0.03% % of the conductor at 4K in-field? Assume that the distribution shown in experimental histogram is “universal” through every tape from the set SP60-SP124. Here is simple statistical model: I c (x) generated with Gaussian distribution in 6000 point; min I c taken for virtual tapes Based on standard deviation of I c relative difference 9.35% Assume that minimum size of I c non-uniformity is about 1 cm for 60m long tape

B I I c (4K, 17T, BIIc) with I c (77K, SF) for selected tapes Anti-correlation All tapes from M3 machine

Relation between  values and I c (4K, 17T, BIIc) For tapes with higher I c we observe larger  values I c ~B - 

(6.6%) Ratio I c (4K, 17T, 18 o ) / I c (4K, 17T, BIIc) has low spread from tape to tape Interpretation: Angular dependence of I c has small variation BIIc and 18 o orientations measured on different samples

Normalized R vs. T for samples from “inner” part of spools Measurements: Temperature range 300K – 89K; SF; Transport measurements were done with PPMS; 3-2 samples were measured simultaneously on one pack; Excitation current 10  A;  T near transition 0.025K Aim: By calculating T c from electric resistivity measurements find why I c at SF; 77K for SP60 differs from one for SP61-64

For inner region: Very narrow T c spread and sharp transition for SP61- 64; Samples from SP60 have wider and variable transition region. Some SP60 samples have up to 3 “knee” R vs. T for samples from “inner” part of spools “inner” means that sample was cut from inner part of spool arrived from SP

bulk critical temperature T c defined as maximum of dR/dT Striking difference between SP60 and SP61-64 SP60 contains several phases with different T c ranging from 90.7K to 91.8K Peaks of dR/dT: Interpretation:  SP60 has non-uniform composition with multiple (Re)BCO phases;  SP have variable through length oxygen doping