Laboratoire de l’Accélérateur Linéaire (IN2P3-CNRS) Orsay, France LHCb upgrade meeting Tests tools for Analog and Digital parts  Typical acquisition sequence.

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Presentation transcript:

Laboratoire de l’Accélérateur Linéaire (IN2P3-CNRS) Orsay, France LHCb upgrade meeting Tests tools for Analog and Digital parts  Typical acquisition sequence  Basic DAQ tests and results  Tools to test Analog part  First tests with AX FPGA  Tools to test A3PE FPGA (SSO & SSI)  Conclusion : next steps Caceres Thierry Duarte Olivier

Olivier Duarte / Thierry Caceres Reminder : Typical acquisition sequence LHCb upgrade meeting 2 December 16th 2011 Write Acq Register (PC) Beginning L0 sequence Time Discret Time Beginning latency delay End of latency delay 123 Recording data in RAM (512 points) FIFO full Data readout by USB 25 ns to 65,5µs Trigger Generator  PC write start sequence bit of Acquisition (Acq) Register.  Beginning of L0 sequence.  Each trigger pulse involve pulse shape.  At the end of the latency delay recording 512 points of data (Max).  At the end of the record the system write one “end of acquisition”bit in the Acq_Register.  The PC scrutinize the Acq_Register, when the “end of acquisition” is high the PC download data with the USB interface. Write Data Ctrl

Olivier Duarte / Thierry Caceres Reminder : Basic DAQ tests LHCb upgrade meeting 3 Soft Trigger (or external) Trigger generator block Latency Trigger Generator Pulses Generator Spy FIFO (8 ADC channels) (96x512) ADC_0 (12 bits) ADC_1 (12 bits) ADC_2 (12 bits) ADC_3 (12 bits) ADC_4 (12 bits) ADC_5 (12 bits) ADC_6 (12 bits) ADC_7 (12 bits) Fixed value (Firmware) From Counters Trig ADC_7 [11] USB Interface Wr Clk 40 Mhz Latency Wr FIFO Wr FIFO All times adjustable Discret Time  Fixed data, counter and pulse stand in for ADC data from analog mezzanine December 16th 2011 A3PE

Olivier Duarte / Thierry Caceres Tools to test Analog part LHCb upgrade meeting 4 SPY_FIFO ANALOG_PULSE_ FIFO ClkUSB PATTERN_ FIFO setup_ register[8 ] setup_ register[9 ] setup_register[9] {Add 0x1C} 96 A3PE RDWR RDWR RDWR (96 x 512) (8 x 512) (96 x 512) {Add 0x1F} {Add 0x06} Buffer_FIFOs (12x8) USB wr 0 1 USB_data 8 8 USB data x 12bits 96 8 USB_data 96 December 16th bit ADC data from Analog Mezzanine (x8) Analog Pulse ( 1 per ADC Channels) Clk 40 Mhz Wr : USB Rd : USB or 40 Mhz Wr : USB or 40 Mhz Rd : USB Wr : USB Rd : USB or 40 Mhz ADC emulationSPY data Trigger for Analog  FIFO pattern  Generate digital signals  Check FPGA computations  SPY FIFO storage of processing results  ANALOG PULSE FIFO generate trigger of analog pulses

Olivier Duarte / Thierry Caceres First tests with AX FPGA LHCb upgrade meeting 5 A3PE FPGA AX FPGA Rd/Wr Register D Q Clk D Q D Q D Q Q D Q D Rd/Wr Register USB interface Bank 0 Bank 1 Bank 0 Delay Chip I2C A3PE_Clk AX_Clk AX_Clk ?? A3PE_Clk AX_Clk 1,5v < VccIOB_Var < +2,5v) VccIOB_Var 32  Reminder : ProASIC3 families are based on nonvolatile flash technology => reprogrammable The latest antifuse FPGA family => Not reprogrammable A3PE AX Idea : RAM pattern to test the A3PE IOs functioning by exchanging data between the 2 FPGA (SSO and SSI) December 16th 2011

Olivier Duarte / Thierry Caceres Tools to test A3PE FPGA (SSO & SSI) LHCb upgrade meeting 6 From_AX_ FIFO A3PE CLK_1 ClkUSB To_AX_FIFO setup_register[10 ] 32 setup_register[11 ] RegUSB 32 _q3 AX500 setup_register[11 ] 32 BUSLSB AXTOA3PE BUSMSB AXTOA3PE 32 _q2 _q_q1 {Add 0x1D} (32 x 512) {Add 0x1E} (32 x 512 ) Rd Wr Buffer_FIFOs USB_data 32 8 USB_data 8 32 USB_data 8 32 December 16th 2011 Wr Rd Idea : RAM pattern to test the A3PE IOs functioning by exchanging data between the 2 FPGA (SSO and SSI) Wr : USB Rd : USB or Clk_1 Wr : USB or Clk_1 Rd : USB  USB Rd / Wr the FIFO (To_AX and From_AX). From Delay Chip Ctrl. Wr / Rd pattern  Start / Stop and latency missing (not implemented yet) Sequence:  To_AX _FIFO Rd/Wr by USB  Start commande  Loop on to AX_FIFO until stop command  Programmable latency to capture data from To_AX_FIFO to FROM_AX_FIFO

Olivier Duarte / Thierry Caceres Conclusion LHCb upgrade meeting 7  Digital electronic is ok, several adjustment have been done (Tests with Carlos at LAL in November).  Do you have other needs of firmware to test the analog mezzanine ? ?  Started Production of third mother digital board (ready in Jannuary)  Should we considered a 8 channel prototype FEB for the end of 2012 with GBT ?  Packing is in stand by. Waiting for decision on GBT bandwith. December 16th 2011

Olivier Duarte / Thierry Caceres LHCb upgrade meeting 8 SPARE December 16th 2011

Olivier Duarte / Thierry Caceres Reminder : Basic DAQ tests results LHCb upgrade meeting 9 Fixed value 456 h (1110) Fixed value ABC h (2748) Not connected FFF h ? Counters Channel 8[11] Trigger generator block December 16th 2011

Olivier Duarte / Thierry Caceres First tests with AX FPGA LHCb upgrade meeting 10 AX FPGA D Q Clk D Q Bank 1 Bank 0 AX_Clk 1,5v < VccIOB_Var < +2,5v) VccIOB_Var 32  Reminder : ProASIC3 families are based on not volatile flash technology => reprogrammable AX is the latest antifuse FPGA family => Not reprogrammable AX programmation with Silicon Scultor

Olivier Duarte / Thierry Caceres Clock tree LHCb upgrade meeting 11