David Nelson STAVE Test Electronics July 1, ATLAS STAVE Test Electronics Preliminary V3 Presented by David Nelson

STAVE Test Electronics July 1, STAVE Test System Block Diagram LCLS I/O BOARD POWER STAVE INTERFACE BOARD USB/ Ethernet Communications Host to LCLS board – USB 12Mbit, 10BASE-T, 100BASE-T Ethernet LCLS I/O board to STAVE interface LVDS CMOS – 160Mbit, 320Mbit 6 Command, 3 clock signals to STAVE interface 30 data from STAVE interface, 40 in future STAVE interface board to STAVE – Differential LVDS – 320Mbit 6 Command, 3 clock signals to STAVE interface 30 hybrid channels, easily upgraded to 40 hybrid channels from STAVE interface Power HOST CPU STAVE CMD/ CLK DATA CMD/ CLK DATA

David Nelson STAVE Test Electronics July 1, LCLS I/O Board using Xilinx FX40 FPGA CMD FIFO 2K*16b USB INTERFACE USB Or Ethernet DATA BUFFERS 30*1K*16b FSM FSM(s) 0-29 Channel 0-29 Deserializers Command 0-5 Serializers FSM & CLK STAVE INTERFACE BOARD Configuration Register RESET

David Nelson STAVE Test Electronics July 1, STAVE Interface Board – CMOS to LVDS Command CLK LCLS I/O BOARD ATCA Connector Power STAVE Connector LVDS Channel Data

David Nelson STAVE Test Electronics July 1, LCLS I/O Board using Xilinx FX40 FPGA

David Nelson STAVE Test Electronics July 1, XILINX FX each 18Kb memory blocks, we need 32 Arrangements 1K * 18b, 2K * 9b, 512 * 36b Memory can be grouped into larger blocks such as 32Kb without additional logic FIFO Random access 500MHz PowerPC 405 – Two each Features 450MHz 16KB instruction cache 16KB data cache Can be used for such things as histogram processing. Would not be to process at 160/320MHz clock rates 448 I/O pins Built in serializer/deserializer logic in all I/O pins FF1152 package for FX40, FX60, FX100 Any of the these three devices can be loaded on board.

David Nelson STAVE Test Electronics July 1, LCLS I/O Board Configuration Register Configuration Register 32 bits, write/read Sets STAVE clock frequency Sets clock polarity for incoming data Adjust clock delay in 1ns steps for outgoing commands and incoming data Select data histogram What other options??

David Nelson STAVE Test Electronics July 1, LCLS I/O Board Command FIFO Command FIFO, Figure 1 1K x 32b Maximum Control Command fields 1, 2, 3 & 5 are encoded into 4 bits Command field of 0 flags end of buffer Data field for cal pulse is delay count in clock cycles Cmd Enable linearly selects any or all Command drivers to STAVE Figure 1

David Nelson STAVE Test Electronics July 1, LCLS I/O Board Channel Deserializer(s) 1 K * 16b Histogram Buffer Channel 0 FSM Channel 0 Deserializer Channel 0 1 K * 16b Histogram Buffer Channel 29 FSM Channel 29 Deserializer Channel 29 **** **************** ************

David Nelson STAVE Test Electronics July 1, LCLS I/O Board Channel Histograms STAVE Organization 30 channels 6 chips per channel 128 strips per chip 768 strips per channel Each strip is assigned one location in the 1K*16b memory Sequence Clear all histogram memory buffers Issue triggers from Cmd FIFO Read, modify, write each time a hit is found. This takes 3 clock cycles

David Nelson STAVE Test Electronics July 1, LCLS I/O Board Channel Histogram Processing Time calculations for processing 1000 triggers Loading Cmd buffer 2K*16*6MHz = 5mS 6MHz is throughput of USB Executing MHz 1000*(35+(64*17*7) )+ 131 = 164mS Readout one 1000 trigger scan 30*768*16*6MHz = 60mS Total time for 1000 triggers is 5mS+164mS+60mS = 229mS Total time for 20 threshold settings is 20 * 229mS = 4.58S