Mg 2 NiH 4 thin films synthesis results
Main goals: hydrogenation of Mg 2 Ni thin films in high hydrogen pressure and temperature (p,T); analysis of Mg 2 Ni films after hydrogenation (p,T) using XRD and SEM methods.
Parameters of hydrogenation Pressure – 8 bar Temperature – °C Hydrogenation duration – 1 hours
Mg 2 Ni films after plasma hydrogenation (p,T) XRD diffractogram of Mg 2 Ni film after hydrogenation SEM micrograph of of Mg 2 Ni film after hydrogenation
Mg 2 Ni films after plasma hydrogenation (p,T) XRD diffractogram of Mg 2 Ni film after hydrogenation SEM micrograph of of Mg 2 Ni film after hydrogenation
Mg 2 Ni films after plasma hydrogenation (p,T) XRD diffractogram of Mg 2 Ni film after hydrogenation SEM micrograph of of Mg 2 Ni film after hydrogenation
Mg 2 Ni films after plasma hydrogenation (p,T) XRD diffractogram of Mg 2 Ni film after hydrogenation SEM micrograph of Mg 2 Ni film after hydrogenation
Mg 2 Ni films after plasma hydrogenation (p,T) XRD diffractogram of Mg 2 Ni film after hydrogenation SEM micrograph of Mg 2 Ni film after hydrogenation
Mg 2 Ni films after plasma hydrogenation (p,T) XRD diffractogram of Mg 2 Ni film after hydrogenation SEM micrograph of Mg 2 Ni film after hydrogenation
Mg 2 Ni films after plasma hydrogenation (p,T) XRD diffractogram of Mg 2 Ni film after hydrogenation SEM micrograph of Mg 2 Ni film after hydrogenation
Conclusions 1-4 µm nanocrystalline Mg 2 Ni thin film was successfully formatted using magnetron sputtering; After the hydrogenation of Mg 2 Ni thin films in hydrogen atmosphere, in high pressure and high temperature, Mg 2 NiH 4 thin films were successfully formed. SEM analysis shows that after hydrogenation formation of the “bubbles” in the Mg 2 NiH 4 thin films are observed.