Figure 2. 1in X 1in, 2-layer FR4 capacitance test board (left) top view, (right) bottom view. Figure 1. Recommended test setup for measuring capacitance.

Figure 3. Open-circuit response of a 518-Ω capacitance test setup. Figure 4. Measuring the time constant using the 63% method.

Figure 5. Improper implementation of the 63% method for measuring the time constant. Because the time constant is approximately equal to the rise-time, measuring the time constant from the point when the voltage (yellow) starts to rise will introduce significant error. Figure 6. Correct implementation of the 63% method for measuring the time constant. Method 1Method 2..

Figure 7. Resulting error in measuring capacitance.

Figure 9. 1in X 1in, 2-layer FR4 inductance test board (left) top view, (right) bottom view. R1: 33 Ω R2: 18 Ω Figure 8. Test setup for measuring inductance.

Figure 12. Inductor voltage decay when the time constant is comparable to the rise time. Rise time is measured based on the 37% method. Figure 13. Resulting error in measuring inductance.