PROBE CARD INTEGRATION IN pALPIDEfs TEST SYSTEM ALICE | ITS-MFT Mini-Week | 11.03.2014 | Markus Keil.

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Presentation transcript:

PROBE CARD INTEGRATION IN pALPIDEfs TEST SYSTEM ALICE | ITS-MFT Mini-Week | | Markus Keil

pALPIDEfs TEST SYSTEM Standard configuration: Composed of DAQ board and chip carrier Chip carrier only DUT and de-coupling DAQ board contains USB interface, FPGA, ADCs for current measurements … ALICE© | ITS-MFT Mini-Week | | M. Keil2

PROBE CARD INTEGRATION Simplicity of chip carrier allows to easily substitute it with a probe card In the standard setup the chip carrier is connected directly to the PCIe connector, however extender cables are available. This would enable us to do all tests available on the test system also on the probe station without increasing the complexity of the probe card: Complete tests of chip functionality: communication, register tests, digital and analogue injections, threshold scans … Current and voltage measurements: Supply currents, monitoring currents or voltages of on-chip DACs Only requirement: implement (simple) carrier schematics and PCIe connector on probe card Already implemented in latest version of schematics; to be submitted this week ALICE© | ITS-MFT Mini-Week | | M. Keil3