Www.panstanford.com Chapters 5-8 Presentation Slides for Science at the Nanoscale: An Introductory Textbook by Chin Wee Shong, Sow Chorng Haur & Andrew.

Slides:



Advertisements
Similar presentations
Scanning near-field optical microscopy (SNOM) for magneto-optics Paolo Vavassori INFM - National Research Center on nanoStructures and Biosystems at Surfaces.
Advertisements

Colloid Stability ?.
Focused ion beam (FIB) 1.Overview. 2.Ion source and optics. 3.Ion-solid interaction, damage. 4.Scanning ion beam imaging. ECE 730: Fabrication in the nanoscale:
SEM & TEM in Polymer Characterization
Fire Protection Laboratory Methods Day
Scanning Probe Microscopy
Franco-Israel Conference on Nanocharacterization Surface Electronic Characterization with SPM Sidney Cohen This presentation will probably involve audience.
Electrical Techniques MSN506 notes. Electrical characterization Electronic properties of materials are closely related to the structure of the material.
AFM-Raman and Tip Enhanced Raman studies of modern nanostructures Pavel Dorozhkin, Alexey Shchekin, Victor Bykov NT-MDT Co., Build. 167, Zelenograd Moscow,
Physical chemistry of solid surfaces
Tin Based Absorbers for Infrared Detection, Part 2 Presented By: Justin Markunas Direct energy gap group IV semiconductor alloys and quantum dot arrays.
Development of Scanning Probe Lithography (SPL)
Copyright © 2005 SRI International Introduction to Nanoscience What’s happening lately at a very, very small scale.
Scanning Electron Microscope Jamie Goings. Theory Conventional microscopes use light and glass lenses SEM uses electrons and magnetic lenses to create.
Nanomaterials & Nanotechnology
Surface Characterization by Spectroscopy and Microscopy
Basic Imaging Modes Contact mode AFM Lateral Force Microscopy ( LFM)
Introduction to scanning electron microscopy
Spectroscopic Techniques for Probing Solid Surfaces Part II of Surface Primer.
BY SANTANU PRAMANIK(09369) HITESH KUMAR GUPTA(09320) CHANDAN SINGH(09260) SCANNING ELECTRON MICROSCOPE MATERIAL SCIENCE ASSIGNMENT.
Do it with electrons !. Microscopy Structure determines properties We have discussed crystal structure (x-ray diffraction) But consider now different.
Quantum Dots: Confinement and Applications
NATSYCO. microscopy Optical microscopy Electron microscopy Scanning probe microscope.
Tools of the Nanosciences There’s plenty of room at the bottom It is my intention to offer a prize of $1,000 to the first guy who can take the information.
Zoology I Cytology, Embryology & Histology By Dr/ Alyaa Ragae Zoology Lecture Faculty of Oral and Dental Medicine Future University.
Slide # 1 SPM Probe tips CNT attached to a Si probe tip.
NANOFABRICATION -3 NOVEL PROCESSES EEE5425 Introduction to Nanotechnology1.
Principles of Nanometrology A.A About nanometrology The standardization of methods for measurement, imaging and properties recording at nanoscale.
Simple to Complex – Life’s Levels of Organization
Pages 52 to 54.  Compound Light  Visible light is used to illuminate the specimen  Glass lens bend the light to magnify the image  Magnifies up to.
Nano-Materials Characterization Yoram Shapira, EE Nano-bio-electronics Growth and Processing Characterization and Analysis Design and Modeling.
Microscopy and Measurement
Tools of Science The Microscope.  An instrument that can form an enlarged image of an object.  Visible light is passed through the specimen and through.
1 The nanoscale ‘Nano’ is the unit prefix representing 10 –9. Some common unit prefixes.
NANO 225 Micro/Nanofabrication Characterization: Scanning Probe Microscopy 1.
AFM. The cantilever holder The cantilever dimensions Tip position.
Chapters 1-4 Presentation Slides for Science at the Nanoscale: An Introductory Textbook by Chin Wee Shong, Sow Chorng Haur & Andrew.
Tutorial 4 Derek Wright Wednesday, February 9 th, 2005.
Tao Yuan, Jingzhou Xu, and Xicheng Zhang Rensselaer Polytechnic Institute, Troy, New York Scanning THz Emission Microscope Abstract A THz image system.
TEM charcaterization Basic modes – Bright field microscopy – Dark field Microscopy –STEM – EDAX – EELS.
NANO 225 Micro/NanoFabrication Electron Microscopes 1.
Chapter 4-15 Grain boundaries: are boundaries between crystals. are produced by the solidification process, for example. have a change in crystal orientation.
Common scanning probe modes
Scanning Probe Microscopy Colin Folta Matt Hense ME381R 11/30/04.
Today –Homework #4 Due –Scanning Probe Microscopy, Optical Spectroscopy –11 am NanoLab Tour Tomorrow –Fill out project outline –Quiz #3 in regular classroom.
5 kV  = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV  = 0.12 nm.
Engr College of Engineering Engineering Education Innovation Center Engr 1182 Nano Pre-Lab Demolding Rev: 20XXMMDD, InitialsPresentation Short.
Figure 3.1. Schematic showing all major components of an SPM. In this example, feedback is used to move the sensor vertically to maintain a constant signal.
NIRT/GOALI: SELF ASSEMBLY AT ELECTRONIC AND PHOTONIC SCALES S.M. Lindsay (PI) Hao Yan (Co-PI) Rudy Diaz (Co-PI) Devens Gust (Co-PI) Shreya Battacharyya,
Ferroelectric Nanolithography Extended to Flexible Substrates Dawn A. Bonnell, University of Pennsylvania, DMR Recent advances in materials synthesis.
Characterization of Nanomaterials…
SEM Scanning Electron Microscope
Lecture 6: Microscopy II PHYS 430/603 material Laszlo Takacs UMBC Department of Physics.
Chapter 1 Section 4 Tools and Techniques (specifically microscopes) p
Mesoscopic physics and nanotechnology
Physical Pharmacy 2 COLLOID: ELECTRICAL DOUBLE LAYER Kausar Ahmad
Questions/Problems on SEM microcharacterization Explain why Field Emission Gun (FEG) SEM is preferred in SEM? How is a contrast generated in an SEM? What.
3.052 Nanomechanics of Materials and Biomaterials Prof. Christine Ortiz DMSE, RM Phone : (617) WWW :
Controlled fabrication and optical properties of one-dimensional SiGe nanostructures Zilong Wu, Hui Lei, Zhenyang Zhong Introduction Controlled Si and.
Do it with electrons !. Microscopy Structure determines properties We have discussed crystal structure (x-ray diffraction) But consider now different.
METHODOLOGY Nanotechnology Prof. Dr. Abdul Majid Department of Physics
Presentation on SEM (Scanning of Electron Microscope) Represented by:-Ravi Kumar Roll:- (BT/ME/1601/006)
Molecular spectroscopy and reaction dynamics Group III
Scanning Probe Microscopy: Atomic Force Microscope
Laboratory equipment Lecture (3).
Scanning Tunneling Microscopy
Do it with electrons !.
Nanocharacterization (III)
Nanocharacterization (II)
Types of Microscopy Type Probe Technique Best Resolution Penetration
Presentation transcript:

Chapters 5-8 Presentation Slides for Science at the Nanoscale: An Introductory Textbook by Chin Wee Shong, Sow Chorng Haur & Andrew T. S. Wee National University of Singapore ISBN: Hardcover August pages More information at

Chapter 5

Name Abbrev. Sci. Unit Representative objects with this size scale metre m 100 Height of a 7-year-old child. deci- dm 10 −1 Size of our palm. centi- cm 10 −2 Length of a bee. milli- mm 10 −3 Thickness of ordinary paperclip. micro- μm 10 −6 Size of typical dust particles. nano- nm 10 −9 The diametre of a C60 molecule is about 1 nm. pico- pm 10 −12 Radius of a Hydrogen Atom is about 23 pm. femto- fm 10 −15 Size of a typical nucleus of an atom is 10 fm. atto- am 10 −18 Estimated size of an electron. Just how small is nano?

Percentage of surface atoms 1 cm 3 gold cube 1 cm Total number of atoms ~ 5.9  Number of surface atoms ~ 1.2  % of surface atoms to total atoms ~ 2  nm 3 gold cube Unit cell length of gold ~ 0.4 nm Approximately 2.5 fcc units Total number of atoms ~ 108 Number of surface atoms ~ 84 % of surface atoms to total atoms ~ 78 Percentage of Surface Atoms

Surface Relaxation and Restructuring In surface relaxation, atoms in the surface layer may shift inwardly or laterally (c) (a) d 12 = d bulk d bulk (b) d 12 < d bulk d bulk dangling bonds Dangling bonds may combine to form strained bonds between themselves, the surface layer is restructured with different bond lengths and/or angles. Surface Relaxation and Restructuring

Sintering and Ostwald ripening Sintering : the individual nanostructures change their shapes when they combine with each other, and this often results in a polycrystalline material Ostwald ripening produces a single uniform structure with the larger nanostructures growing at the expense of the smaller ones Sintering and Oswald ripening

Catalysis at the Nanoscale With kind permission from Springer Science Business Media: J.Phys. D, Atomic Resolution electron microscopy of small metal clustes, 19, 293 (1991), J.-O. Boyin and J.- O. Malm. Copyright © 1991, Springer Berlin/Heldelberg. Catalysis at the Nanoscale

The electrical double layer Stern layer : the fairly immobile layer of ions that adhere strongly to the particle surface Guoy layer : a diffuse layer of oppositely charged mobile ions that are attracted to the first layer The electrical double layer

The theory is developed by B. Derjaguin and L. Landau, and independently E. Verwey and J.T.G. Overbeek. DLVO potential DLVO Potential

Surfactants Surfactants

AOT-water-isooctane system AOT-water-isooctane system

Chapter 6

Schematic of the energy bands

Energy distribution functions

Band structure of a semiconductor at different temperatures Band structure of a semiconductor at different temperatures

Spherical volume of radius R encompassing a number of possible states

The functions f(E) and g c (E) The functions of f(E) and g c (E)

Density of states for 3D, 2D, 1D, and 0D structures Density of States

One-dimensional density of states

GaAs/AlGaAs/GaAs heterostructure Band diagram, i.e. the energy of the conduction band. The dashed line is the Fermi energy Cross-section through the heterostructure grown by MBE with nearly atomically sharp interfaces

Ballistic conductance

Electronic properties of a quantum dot

Energy level diagram Energy level diagram of the single electron transistor

Chapter 7

Variation of Gibbs energy during the nucleation process

The nucleation and growth processes

Effect of capping molecule CdS nanocrystals produced with (a) higher and (b) lower amounts of the capping molecule hexadecylamine

STM images of α-sexithiophene (6T) molecules adsorb on Ag(111) surface Self-assembly of mono- and bi-layer of 6T to form nanostripes Self-assembly of C 60 onto the 6T bilayer patterns

Self-assembled monolayers (SAMs)

Close-packed Assembly SEM images showing close-packed assembly of micron-sized nanoparticles

Capillary actions between particles

Chapter 8

Optical microscope

The Rayleigh criterion

Scanning Electron Microscope

Light beam profile vs electron beam profile

Main components of a SEM

Electron gun (a) a thermionic electron gun (b) a field emission electron gun

Electron trajectory Spiral trajectory of an electron passing through the electromagnetic lens in a SEM Magnetic field profile generated by a typical electromagnet used in SEM and the focusing effect of the magnetic field on the electron beam

Detectable signals generated when an energetic electron beam is incident on a thick sample

Transmission Electron Microscope (TEM)

Detectable signals generated when an energetic electron beam is incident on a thin sample

Scanning Tunneling Microscope

A UHV STM System Close-up of STM sample stage and tip

STM image of Si(111)-(7 × 7)

STM operation (b) Constant current (a) Constant-height

Energy band diagrams of the STM tip (a) (a) without any voltage bias

Energy band diagrams of the STM tip (b) (b) when the tip is negatively biased with respect to the sample

Energy band diagrams of the STM tip (c) (c) when the tip is positively biased with respect to the sample

Atomic Force Microscope Image of the cantilever and probe tip

Various detection modes of AFM

Optical Tweezer

Laser beam profile passing through the microsphere

Optical trapping of an array of microspheres