Wrap up Xband accelerating structures review 24-25.11.2014 N. Catalan Lasheras https://indico.cern.ch/event/346988/

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Presentation transcript:

Wrap up Xband accelerating structures review N. Catalan Lasheras

Background A number of the collaborators have participated in the assembly of X-band structures – KEK/SLAC< CEA, Tsinghua University have successfully manufactured/assembled structures – PSI, CIEMAT, SINAP, Lancaster university are joining the effort Ultimately, the whole manufacturing and assembly process should be accomplished by a commercial company – To have a real estimate of the CLIC structure costs – Needs an effort towards cost- driven design Document all manufacturing procedures currently used for putting together CLIC AS – With references, scientific or historical background – Defining a quality assurance program in parallel Extract procedures for off-site manufacturing – Which steps can be let to the different establishments? – What measurement will ensure a uniform quality? Write specifications for an industry built structure N. Catalan Lasheras AS review

Goals of the review Describe/put together existing manufacturing steps – Conditions, procedures, tests, etc. Verify and agree on the procedures Bring short term modifications – To be implemented already in 2015 Propose longer term modifications, studies or R&D efforts – There will not be time for discussing all in detail but it will be most useful to have a list of potential directions to explore – In coordination with other CLIC-RF work packages N. Catalan Lasheras AS review

Participants 31 participants including outside laboratories D. Schulte, CERN/ABP PH. Lebrun, S. Stapnes, CERN/DG S. Atieh, A. Cherif, G. Favre, M. Garlache, A. Perez Fontenla, CERN/MME M. Aicheler, O. Brunner, N. Catalan Lasheras, M. Filippova, A. Grudjev, D. Gudkov, S. Lebet, A. Olyudnin, C. Rossi, A. Solodko, I. Syratchev, J. Vainola, A. Xydou, B. Woolley, W. Wuensch, CERN/RF M. Taborelli, M. Thiebert, CERN/VSC F. Toral, L. Sanchez. Ciemat, Spain T. Higo, T. Abe, KEK, Japan M. Franzi, J. Weng, SLAC, USA 23 talks plus discussions 2 long days N. Catalan Lasheras

Program of the review Introduction to the review. N. Catalan Lasheras Manufacturing workflow and status of the procedures. A. Solodko ….. Tolerances coming from alignment. D. Schulte Tolerances coming from RF. A. Grudjev Manufacturing for High-Gradient. W. Wuensch Ultra precision machining and built to cost disk optimization. S. Atieh How do we measure/accept the disks, shape. Roughness. A. Cherif ….. Review of SLAC and KEK etching procedures. J. Wang Current cleaning and etching procedures followed at CERN. M. Taborelli Heat treatment study results, burrs and roughness. A. Perez Fontenla Role of oxidation in bonding. M. Taborelli ….. Assembly and alignment procedure. M. Aicheler Cell to cell alignment on GLC structures. T. Higo Brazing/bonding sequence. S. Lebet, A. Solodko Bonding dependence from weight and roughness. A. Xydou H2 diffusion bonding against vacuum brazing. T. Higo ….. TD26CC plans from CIEMAT. L. Sanchez MTF. M. Filippova RF measurements and tuning. R. Wolf, B. Wooley Baking requirements. M. Taborelli Systematic analysis done on existing samples. A. Perez Fontenla ….. Manifolds assembly. D. Gudkov SiC to copper brazing. A. Solodko N. Catalan Lasheras

6 31-January-2013 X-band Accelerating structure Review NOVEMBER 2014 RF DESIGN ENGINEERING DESIGN (3D models, 2D drawings) QUALITY CONTROL AT FACTORY CONFORM NOT CONFORM QUALITY CONTROL AT CERN PRELIMINARY RF CHECK LEAK TIGHTNESS TEST RF CHECK AND TUNING INSTALLATION PACKAGING AND SHIPPING BRAZING OF COUPLERS, TUNING STUDS, COOLING CIRCUITS 6 Baseline manufacturing flow. A Solodko ULTRA PRECISION MACHINING ASSEMBLY OF COUPLERS (brazing, machining) DIFFUSION BONDING OF DISC STACK BAKING (vacuum 650 °C, 10 days) BAKING (vacuum 650 °C, 10 days) RF DESIGN ENGINEERING DESIGN (3D models, 2D drawings) QUALITY CONTROL AT FACTORY CONFORM NOT CONFORM QUALITY CONTROL AT CERN PRELIMINARY RF CHECK LEAK TIGHTNESS TEST RF CHECK AND TUNING INSTALLATION PACKAGING AND SHIPPING CLEANING (LIGHT ETCHING) CLEANING (LIGHT ETCHING) Add a final dimensional control

Discussion on tolerances, UP machining, acceptance Some metrology needs to be done for all pieces including reference outside surface and shape. – Included in the acceptance tests besides visual inspection and made if necessary in b.169 lab. Action: Nuria, Anastasiya, Andrej, Ahmed Sharp edge. Machining sequence to be stated in the technical specs to chose the orientation of burrs. Action: Said. Can we accept a larger roughness in the wall? Action: Alexej Burrs, scratches, contamination and indents to be accepted if not visually detected um? Action: Andrej. Need to define acceptable burrs, scratches, contamination and indents – accepted if not visually detected um? Action: Andrej – Bonding tests on scratched disks. Action Serge Flatness should be not relaxed but measurements checked. – Measurements with the vacuum chuck to be compared with the “free state” Action Ahmed Changing R05 to 1.0 or 2.5 to be studied Action: Alexej Shall we tight the tolerance for OD to +/1um? And the shape? N. Catalan Lasheras

Surface issues for RF structures in SLAC. J. Wang Surface roughness after etching N. Catalan Lasheras Etching for removing slight contamination and fluids Not justified for diamond-turned pieces

Discussion on surface treatment No etching should be done on disks anymore. – Only solvent cleaning. – Thus no dimples should be allowed in the RF part larger than ~1um – Burrs and machining steps need to be under control Test on oxide to be prepared. XPS measurements of oxide layer growth. – Bonding cycle on oxidised samples to assess the bonding quality and the “deoxidising” capacity of the heating cycle. Action: Mauro, Serge. Handling from the reception of the disks needs to be reviewed. Action Nuria – Beware of Carbon contamination Stress relieve temperature much lower than in SLAC, KEK and CIEMAT. Is this a concern? Action Said N. Catalan Lasheras

Discussion on assembly Manual stacking applied both at CERN and KEK – Scattered measurements at CERN within +-10um but no disk-to disk data – Smooth disk to disk alignment in KEK (+- 1um) with a larger bow – Control OD of all disks upon arrival. Action Ahmed – Review geometry measurements after bonding, more points. Action Serge – Analyse all data taken during assembly. Action Serge Bonding movements seem to be under control Review procedure in the near future. Action Nuria N. Catalan Lasheras

Discussion on bonding/brazing Avoid using graphite pads in contact with diamond-machined parts Bonding dependence on weight studies – Better understanding of the measurements is required – not conclusive for real disks. Investigating flatness. Action Anastassia Vacuum brazing used at lower frequency. Single cell study In KEK. Waiting for the results No big changes in the procedure in the short term – Could be worth to study different athmosphere in electrodes New smaller tooling to avoid leaving the cleanroom. Action Serge N. Catalan Lasheras

Plans for CLIC structures: TD26CC Tuning at CERN Disc machining Parts machining Bonding Brazing Leak testing Assembly CIEMAT will manufacture a TD26CC structure according CERN procedures Scope of the collaboration

New workflow steps Manufacturing Step Main Catalogue Data: Applicable Standard  EDMS document № where the corresponding step procedure is attached Results  EDMS document № of the corresponding result report Some step data fields to be implemented individually for some steps according to table 3, column “Manufacturing step catalogue data”. Dimensional control MTF. Maria Filippova

Responsibilities MTF. Maria Filippova Write procedure After each manufacturing step: Close the MTF step Attach result file Open Non conformity in not ok Define manufacturing sequence Approve procedures Coordinate between steps Discuss and decide on NC actions

Discusion on RF measurements Use the same pins for all structures. Verify that tuning is preserved after baking – Next structure TD26_CC to be re-measured after baking Need statistical study of tuning for all structures up to know – To validate the CLIC baseline (no tuning) – To evaluate the assembly quality, No correlation found between tuning records and disks/cells geometry errors. – Possibly most errors are produced by assembly – TBC. Only one structure has been done. RF Measurements and Tunning. A. Olyunin, R. Wegner, B. Woolley

Discussion on baking According to simulations work 10 hours would be sufficient to eliminate H2 in the copper bulk. – Sample is thin (1cm) and may not be representative? Data from PSI structure seems to indicate that degassing is not that fast. – Significant reduction after 12 hours Refurbished degassing oven in building 101 has been equipped with gas analyser. Action Ivo – Data to be taken on the next cycles. TD26CC on January – With and without structure N. Catalan Lasheras

Special studies/structures Manifolds assembly. D. Gudkov Brazing of SiC on Cu. A. Solodko Manifolds assembly. D. Gudkov Crack

Conclusions Procedures are fully known and justified. Ongoing with the authors. – Need to make the point in January Very long discussions on almost every subject. Wrap-up of the workshop with all glory details tomorrow – Immediate changes, some need a verification in the followin weeks – Long term studies on manifolds, brazing, etc – Lots of changes in the way we measure and analysis Industry-ready specs need to define a clear QA Changes that may impact bonding quality will be tested in simple disks in the oven. Changes that may impact high gradient will be first tested on electrodes N. Catalan Lasheras

Thanks to all speakers! Great feedback and positive criticism! N. Catalan Lasheras AS review