Abstract The index of refraction of a material can be used to determine how light bends as the rays travel through a substance. Therefore, this property.

Slides:



Advertisements
Similar presentations
Waves (in general) sine waves are nice
Advertisements

Interferometry It deals with experimental study of the phenomenon of interference. Instruments used in this study are based on principle of interference.
Wave Nature of Light  Refraction  Interference  Young’s double slit experiment  Diffraction  Single slit diffraction  Diffraction grating.
Waveguides Part 2 Rectangular Waveguides Dielectric Waveguide
The Wave Nature of Light
Copyright © 2014 John Wiley & Sons, Inc. All rights reserved.
Physics 6C Interference of EM Waves Prepared by Vince Zaccone For Campus Learning Assistance Services at UCSB.
Chapter 24 Wave Optics.
Adjustment and use of the Michelson Interferometer School of Electronics & Applied Physics, Hefei University of Technology.
Millimeter Wave Sensor: An Overview
Chris A. Mack, Fundamental Principles of Optical Lithography, (c) Figure 3.1 Examples of typical aberrations of construction.
PA2001: Time and Energy Waves and Interference Light as a wave Fermat’s principle Reflection Refraction Thin Film.
The Hong Kong Polytechnic University Optics II----by Dr.H.Huang, Department of Applied Physics1 Interference Conditions for Interference: (i) (  2 
Physics 1402: Lecture 33 Today’s Agenda Announcements: –Midterm 2: graded after Thanks Giving –Homework 09: Friday December 4 Optics –interference.
PERFORMANCE OF THE DELPHI REFRACTOMETER IN MONITORING THE RICH RADIATORS A. Filippas 1, E. Fokitis 1, S. Maltezos 1, K. Patrinos 1, and M. Davenport 2.
Fiber Optics Defining Characteristics: Numerical Aperture Spectral Transmission Diameter.
Lecture 3 – Physical Optics
Dr. Jie ZouPHY Chapter 35 The Nature of Light and the Laws of Geometric Optics.
Newton’s Rings Another method for observing interference in light waves is to place a planoconvex lens on top of a flat glass surface, as in Figure 24.8a.
LumiCal Alignment System Status report Leszek Zawiejski, Tomasz Wojtoń, Arkadiusz Moszczyński Institute of Nuclear Physics PAN, Cracow 25th FCAL Collaboration.
Chapter 25: Interference and Diffraction
Physics 6C Interference of EM Waves Prepared by Vince Zaccone For Campus Learning Assistance Services at UCSB.
Measuring the refractive index of transparent substances using a home tool: the laser meter Romulo Ochoa, Rich Fiorillo, and Cris R. Ochoa Department of.
Chapter 30: Reflection and Refraction
Optical Fiber Communications
1© Manhattan Press (H.K.) Ltd. Reflection Refraction Refraction 12.1 Reflection and refraction Total internal reflection Total internal reflection.
Physics 4 Interference of EM Waves Prepared by Vince Zaccone For Campus Learning Assistance Services at UCSB.
Copyright © 2009 Pearson Education, Inc. Chapter 32 Light: Reflection and Refraction.
Reflection and Refraction of Light
Lecture 14 Images Chapter 34 Geometrical Optics Fermats Principle -Law of reflection -Law of Refraction Plane Mirrors and Spherical Mirrors Spherical refracting.
Light Waves. What is Light? Light is the range of frequencies of the electromagnetic spectrum that stimulate the retina of the eye.
The wave nature of light Interference Diffraction Polarization
D EDICATED S PECTROPHOTOMETER F OR L OCALIZED T RANSMITTANCE A ND R EFLECTANCE M EASUREMENTS Laetitia ABEL-TIBERINI, Frédéric LEMARQUIS, Michel LEQUIME.
Introduction to Light IN THIS LECTURE –Reflection and refraction –Index of refraction –Snell’s Law –Critical Angle –Dispersion and refractive index –Interference.
BROOKHAVEN SCIENCE ASSOCIATES BIW ’ 06 Lepton Beam Emittance Instrumentation Igor Pinayev National Synchrotron Light Source BNL, Upton, NY.
Light and Optics Chapter 22, 23. Light as an Electromagnetic wave  Light exhibits behaviors which are characteristic of both waves and particles Interference,
1. Waves and Particles 2. Interference of Waves
Overview Theory Index of Refraction and Path Length Setup and Procedure Michelson Interferometer Filming the Pressure Gauge Results Analysis Sources of.
 Speed of light (in vacuum) Foucault’s experiment.
Light Waves. What is Light? Light is the range of frequencies of the electromagnetic spectrum that stimulate the retina of the eye.
Spectrophotometry.
Higher Physics – Unit Refraction of Light.
1/10 Tatsuya KUME Mechanical Engineering Center, High Energy Accelerator Research Organization (KEK) ATF2-IN2P3-KEK kick-off meeting (Oct. 10, 2006) Phase.
The Wave Nature of Light
Lecture 24 Interference of Light.
Fundamental of Optical Engineering Lecture 9.  The amount of light reflected when a beam moves from one media to another can be reduced by placing a.
Physics 1C Lecture 27A. Interference Treating light as a particle (geometrical optics) helped us to understand how images are formed by lenses and mirrors.
Sunlight, as the rainbow shows us, is a composite
Fiber Optics.
Refraction The bending of light due to a change in speed.
Chapter 26 The Refraction of Light: Lenses and Optical Instruments.
Light and Optics  The Electromagnetic Spectrum  Interference, Diffraction, and Polarization Wave Properties of Light.
 FT-IR stands for Fourier Transform Infrared, the preferred method of infrared spectroscopy. In infrared spectroscopy, IR radiation is passed through.
UV/VIS SPECTROSCOPY.
17. Electromagnetic waves
Characterizing Optics with White-Light Interferometry
OPTICAL FIBRE BASED ON MODES (OR) MODE TYPES
Interference of EM Waves
INTERFERENCE.
Interference Introduction to Optics Coherent source
PRISMS – one of the e.g. of optical instrumentation
Interference.
1. Waves and Particles 2. Interference of Waves
Chapter 35 The concept of optical interference is critical to understanding many natural phenomena, ranging from color shifting in butterfly wings to intensity.
Instrumentation for UV and visible absorption
Dispersive Comb-Spectrum Interferometer: Metrological Characterization
Unit 2 Particles and Waves Interference
OPTICAL FIBER AND ITS APPLICATIONS
Presentation transcript:

Abstract The index of refraction of a material can be used to determine how light bends as the rays travel through a substance. Therefore, this property is key to optical research. Currently, refractive index measurements are performed primarily with refractrometric instruments. These instruments measure the angle of refraction of light through a material. The refractive index is then determined using Snell’s law. However, the instruments require careful calibration if the researcher seeks to measure refractive index over a wide spectral range with high accuracy and precision. Furthermore, refractometers can only be used for measurements of liquid, gel, and thin solid samples. Analysis of bulk polymer samples is not possible. To confront these restrictions, a low-coherence Michelson interferometric method has been developed to measure the refractive index of bulk samples over the 400nm to 1600 nm spectral range. The accuracy and precision of this new method has been demonstrated by carrying out measurements for the following glass and polymer samples: fused silica, BK7 glass, Borofloat glass, magnesium fluoride, polycarbonate, poly(methyl methacrylate), and polystyrene bulk samples 1. Introduction The analysis of bulk polymer samples is important to those interested in “all-optical” networking for high-bandwidth transmission media. While the presently used single-mode silica fibers do possess high transmission windows centered at the near-infrared communication wavelengths (850nm, 1300nm, and 1550 nm), the use of silica in local area networks (LAN) is unrealistic due to the numerous couplings that exist between the backbone wide area network and the desktop user. The use of polymer-based multimode fibers in place of silica would be advantageous for several reasons. Primarily, polymers are more flexible, and larger diameter fibers could be manufactured for easier coupling in LAN environments. Furthermore, polymers can be fabricated at low costs. However, research and development of optical polymers is currently hindered due to the restrictions of refractometer instruments. The bandwidth capacity of bulk polymers in the visible and near-infrared spectral range is difficult to characterize with presently available methods 2-4. However, an apparatus for interferometric measurements of refractive index dispersion in polymers can achieve what the refractometers cannot. Experimental Setup The schematic of the Michelson interferometric apparatus for measuring refractive index is shown in Figure 1 below. Light from a Xenon arc-lamp is directed through a monochromator in order to achieve the desired wavelengths in the visible and near-infrared spectral region. From this point, the light travels through a Michelson interferometer where one mirror is fixed, and the other mirror is translated with the help of a precision motorized translation stage. Alongside the monochromatic light, light from a frequency-stabilized Helium- Neon (HeNe) laser is also directed through the interferometer to act as a length standard for defining the mirror displacement. The optical sample is placed in one arm of the interferometer so that it eclipses approximately one-half of the monochromatic light beam 1. Figure 1: Schematic of the Michelson Interferometric Apparatus. Figure 2: Interference Trace for Magnesium Fluoride at λ = 790 nm Data for the interference intensities of the arc-lamp and the HeNe laser are collected while the movable mirror is translated over the appropriate range. Three interference wave packets are observed for arc- lamp interference versus mirror displacement as shown in Figure 2 below. The first packet corresponds to light that passed through the sample, reflected off the fixed mirror in the interferometer, and then passed through the sample again. The middle packet corresponds to light that passed through the sample only once on its round trip. The last packet corresponds to light that never passed through the sample but was still reflected off the fixed mirror. Only the first and last packets are required to calculate the refractive index of a material. Interferometric Measurements of Refractive Index Dispersion in Polymers over the Visible and Near-Infrared Spectral Range Sarah Caudill and W. Tandy Grubbs, Department of Chemistry, Stetson University Unit 6035, DeLand, FL 32720, , Results Interferometric determinations of refractive index, n, are based on the expression n = p/l where l is the thickness of the optical sample, and p is the distance the monochromatic light would have to travel in a vacuum in order to simulate the passage of the light through the sample. Interferometry determines the distance, Δp, between the two interference wave packets. The expression Δp /l determines the refractive index of the sample relative to air. The refractive index of air can be assumed to be one for most practical applications. Therefore, if one is added to Δp /l, then the refractive index of the sample is obtained 1. For this project, a variation on the above idea was used. For each interference trace, the refractive index was found using the expression: where l is the thickness of the sample in µm, N is the number of light-to-dark fringe cycles that are measured in the HeNe interference scan between the maxima of the two wave packets in the arc-lamp interference scan, and the factor of corresponds to the wavelength of the HeNe laser in µm 1. Two sources of error must be minimized during this analysis. The thickness of the sample is measured with a caliper, yielding an accuracy out to four decimal places. The other source of error involves the precision in measuring Δp, the displacement between the two interference packets. The precision in this measurement is limited by two factors: the error in locating the maximum interference fringe on each packet (see Figure 3) and the error in measuring the mirror displacement between the two limits. A computer program is used to accurately find the maximum in each interference packet. The packets are Gaussian in shape, so a Gaussian curve is fit to each packet in order to more accurately locate the maximum. The error in the mirror displacement is minimized by defining the displacement relative to the number of fringes that are collected in the computer from the HeNe laser interference signal 1. Figure 3: Expanded view of the first packet in Figure 2. A Gaussian curve is fit to this shape to minimize error in finding the maximum. Data was collected for the inorganic and polymer optics over the wavelength range 400nm - 900nm and in some cases 400nm – 1600nm. Normal dispersion for a given material can be written in terms of the empirical Cauchy formula 1 : The coefficients of this equation were found for each material using the experimentally determined interferometric refractive index data at each corresponding wavelength. A plot of n versus λ can be constructed for each material, and the Cauchy equation can be used to generate an empirical fit to the data as shown in Figure 4. Figure 4: Variation in n over the wavelength range nm for a bulk polycarbonate sample. Conclusion A new method for measuring the refractive index and refractive index dispersion of bulk samples has been demonstrated. Calibration is not needed each time a measurement is taken at a new wavelength. This method may soon facilitate the creation of polymer-based optics for use in LAN environments. Acknowledgements This research was funded by the National Science Foundation (DMR ). Thanks to Dr. W. Tandy Grubbs and the chemistry department at Stetson University for the opportunity to participate in this project. References 1. Caudill, Sarah E., Jen-Chou Wang, and W. Tandy Grubbs. “Interferometric Measurementsof Refractive Index Dispersion in Polymers over the Visible and Near-Infrared Spectral Range,” to be submitted to the Journal of Applied Polymer Science, Chowdhury, J. Chem. Eng. 1987, 94, Zubia, J.; Arrue, J. IEEE Proceedings in Optoelectronics 1997, 144, Garito, A. F.; Wang, J.; Gao, R. Science 1998, 281, 962. Experimental Setup (cont.)Results (cont.)