UCLA Nanoscale Measurement System March 18, 2005 Nanoscale Measurement System Non-confidential summary of UCLA technology available for licensing, Case.

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UCLA Nanoscale Measurement System March 18, 2005 Nanoscale Measurement System Non-confidential summary of UCLA technology available for licensing, Case reference: LA March 18, 2005 Ken Polasko Business Development Officer Office of Intellectual Property Administration (310)

Nanoscale Measurement System Markets  Force and displacement characterization tools for the nanotechnology market. Background  Construction of hybrid bio-nanosystems relies on measuring and optimizing forces and displacements at the molecular level.  The measurement of the forces and displacements involved when attaching biological material to inorganic material or micro electro mechanical systems (MEMS) is becoming an increasing import design capability. Problem  Conventional force transducers (e.g. load sensors) have been the choice for the measurement of forces however these sensors do not have the required sensitivity.  Conventional force microscopy relies on cantilever torsional modes for measuring forces along the surface plane, implying in poor visualization and sensitivity.  Optical tweezers have been the choice for the measurement of forces produced by single molecules however this techniques has limited force range (pN).

Solution  Prototype has been fabricated that can detect forces of ~ 0.2 nN and a corresponding displacement of ~ 40 nm.  The prototype incorporates a novel illumination system that permits excellent visualization of biological material.  The system design permits flexible handling of liquids.  This system fills the gap between existing tools for measuring forces associated with biological elements and purely atomic measurement systems. Nanoscale Measurement System

Technological Status ResearchDevelopmentCommercialization Discovery Technical Feasibility IntegrationPrototypeProduction Nanoscale Measurement System

Inventors and Collaborators  Professor Carlo Montemagno, Department of Bioengineering & Biomedical Engineering  Professor Jacob Schmidt, Department of Bioengineering & Biomedical Engineering  Professor Toshikazu Hamasaki, Department of Bioengineering & Biomedical Engineering  Dr. Sergio Freire, Department of Bioengineering & Biomedical Engineering Intellectual Property  Provisional patent filed Nanoscale Measurement System