Scanning Acoustic Microscopy Training

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Presentation transcript:

Scanning Acoustic Microscopy Training This presentation and images are copyrighted by Sonix, Inc. They may not be copied, reproduced, modified, published, uploaded, posted, transmitted, or distributed in any way, without prior written permission from Sonix. 8700 Morrissette Drive Springfield, VA 22152 tel: 703-440-0222 fax: 703-440-9512 e-mail: info@sonix.com

This presentation serves as a brief introduction into the theory and operation of scanning acoustic microscopes. Copyright Sonix, Inc

Ultrasound Inspection, Using an Acoustic Microscope… What does this thing do? Ultrasound Non-Destructive Testing Example Images Copyright Sonix, Inc

Ultrasound SONAR MEDICAL What are Ultrasonic Waves? University of California Medical Center San Francisco, California What are Ultrasonic Waves? Ultrasonic waves refer to sound waves above 20 kHz (not audible to the human ear) Copyright Sonix, Inc

Non-Destructive Testing NDT utilizes various non-invasive measurement techniques, such as ultrasonics and radiography to determine the integrity of a component, structure, or material without destroying the usefulness of the item. Copyright Sonix, Inc

Where an Acoustic Microscope is utilized. Failure Analysis Reliability Process Control Vendor Qualification Production Quality Control Research Copyright Sonix, Inc

Common Applications Plastic encapsulated IC packages Flip Chips Bonded Wafers Printed Circuit Boards Capacitors Ceramics Metallic Power Devices/Hybrids Medical Devices Material Characterization Copyright Sonix, Inc

Examples Lid seal voids Delamination BGA die attach Die Crack Copyright Sonix, Inc

Flip Chip Underfill Voids Examples Die Top Delamination Mold compound voids Flip Chip Underfill Voids Die Pad delamination Die Tilt, B-Scan Die Attach Voids Copyright Sonix, Inc

Ultrasound Inspection Theory System Components Transducers Copyright Sonix, Inc

Ultrasonic Waves Characteristics of Ultrasonic Waves Freely propagate through liquids and solids Reflect at boundaries of internal flaws and change of material Capable of being focused, straight transmission Suitable for Real-Time processing Harmless to the human body Non-destructive to material University of California Medical Center San Francisco, California Copyright Sonix, Inc

Ultrasonic Inspection Ultrasound A transducer produces a high frequency sound wave which interacts with the sample. High frequency sound waves can not propagate through air. Couplant- A material used to carry the high frequency sound waves. Water is the most common couplant for immersion testing. Inspection Modes Pulse Echo Through Transmission Transducer H2O Coupling Receive Copyright Sonix, Inc

Scanner The scanner consists of a three axis system, X, Y, and Z. The motor controller directs the movement of these axes. Z Axis Focus Y-Axis Step X-Axis Scan Copyright Sonix, Inc

Transducers Low Frequency High Frequency Long Focus Short Focus 1. Lower resolution 2. Longer focal lengths 3. Greater penetration (Thicker packages) 1. Higher resolution 2. Shorter focal lengths 3. Less penetration (Thinner packages) General rules: Ultra High Frequency (200+ MHz) for flip chips and wafers. High Frequency (50-75 MHz) for thin plastic packages. (110MHz-UHF) for flip chips. Low Frequency (15 MHz) for thicker plastic packages. Copyright Sonix, Inc

Transducer Beam Profile Depth of Field The purple region is referred to as the focal area or depth of field of the transducer beam. Copyright Sonix, Inc

Typical Transducer Selection Sample Application Transducer T/X Receiver 10 MHz w/0.75” focus PLCC, QFP, PQFP 15 MHz w/0.5” focus Power Pak 15 MHz w/0.5” focus BGA Top 50-75 MHz w/12mm focus Capacitors 75 MHz w/12mm focus TSOP 75 MHz w/12mm focus Flip Chip Underfill 110 MHz w/8mm focus Flip Chip Interconnect UHF w/ 5.9 mm focus Bonded Wafer 110 MHz w/8mm focus Bonded Wafer UHF w/ 5.9 mm focus Copyright Sonix, Inc

ABC’s Of Acoustics Acoustic Reflections Acoustic Waveforms Image Display Copyright Sonix, Inc

Acoustic Properties Copyright Sonix, Inc

Sound Reflection Acoustic Material Properties density () velocity of sound in material (c) acoustic impedance (Z= c) Copyright Sonix, Inc

Sound Reflection Whenever a sudden change in acoustic impedance is encountered, like at a material boundary, a portion of sound is reflected and the remainder propagates through the boundary. Copyright Sonix, Inc

45% of the sound entering the boundary is reflected. Reflection vs. Transmission Incident Energy Transmitted Energy Water Z1 Plastic Z2 Reflected Energy Z= C Z1 =  C where: =1.00 gram/cm3 C= 1.5 x 106 Z1 = 1.5 x 106 Z2 =  C where:  =2.00 gram/cm3 C= 2.00 x 106 Z2 = 4.00 x 106 45% of the sound entering the boundary is reflected. Copyright Sonix, Inc

Measuring the reflected ultrasound can provide: Reflected Sound Information Measuring the reflected ultrasound can provide: Amplitude Information Polarity Information Time Information Copyright Sonix, Inc

ABC’s of Acoustics A-Scan- The raw ultrasonic data. It is the received RF signal from a single point (x,y). B-Scan- A line of A-scans. (Vertical cross-section) C-Scan-Data from a specified depth over the entire scan area. (Horizontal cross-section. Copyright Sonix, Inc

A-SCAN Transducer Initial Pulse Front surface Sample Interface of interest Back surface Copyright Sonix, Inc

Ultrasonic Waveforms The Black signal is commonly referred to as the initial pulse or the main bang. This signal occurs at Zero microseconds. 1 The Red signal is commonly referred to as the front surface. This represents the first interface the sound encounters. 2 The Green signal would be considered the area of interest. A data gate would be positioned over this signal or group of signals for evaluation. 1 2 The Blue signal is commonly referred to as a back wall echo or back surface. Just as the name implies it is the back or bottom of the sample. Copyright Sonix, Inc

A-SCAN + _ A-Scans provide the following information: 100% + Phase Amplitude %FSH 0% _ Phase -100% Time / Depth A-Scans provide the following information: 1. Amplitude / % of full screen height (FSH) 2. Phase / positive or negative peak 3. Time / Depth Copyright Sonix, Inc

C-SCAN IP Front surface Back surface Area of interest The red box (data gate) indicates the depth of information. Copyright Sonix, Inc

B-Scan Front surface Signal from indication Back surface Back surface The blue line (B-scan gate) represents the depth of information recorded. Back surface Front surface Signal from indication Copyright Sonix, Inc

Inspection Modes Pulse Echo Through Transmission Copyright Sonix, Inc

Inspection Modes Pulse-Echo Through Transmission Transmit Transmit & Receive Transmit Transmit & Receive Pulse-Echo - One Transducer Ultrasound reflected from the sample is used. Can determine which interface is delaminated. Requires scanning from both sides to inspect all interfaces. Provides images with high degree of spatial detail. Peak Amplitude, Time of Flight (TOF) and Phase Inversion measurement Through Transmission - Two Transducers Ultrasound transmitted through the sample is used. One Scan reveals delamination at all interfaces. No way to determine which interface is delaminated. Less spatial resolution than pulse-echo. Commonly used to verify pulse-echo results. Copyright Sonix, Inc

Inspection Modes Pulse-Echo Transmit & Receive Front Surface Back surface 1 2 Transmit & Receive 1 Front Surface Air Gap Air Gap 2 Copyright Sonix, Inc

Inspection Modes Through Transmission Transmit Receive 1 2 3 1 2 3 Copyright Sonix, Inc

Focusing Sound Copyright Sonix, Inc

Focusing the Transducer Too Close 1 Too Far Focused 3 Too Close Focused 2 2 2 1 Too Far 3 Focusing an ultrasonic transducer is similar to focusing an optical microscope. When optimum focus is reached the signal will reach a maximum peak. (See the A-scans images to the left) Copyright Sonix, Inc

*The ultrasound is focused on the surface of the penny. De-focused-- too close Water path 28% 1. Note the time in microseconds of the signal at the different focus locations. (Red arrow) 2. Also note the amplitude of the signal. (white box) When the signal is not in focus the amplitude is lower compared to that of correct focus. Correct focus 85% De-focused-- too far 33% Copyright Sonix, Inc *The ultrasound is focused on the surface of the penny.

De-Focused - Too Far Away Focusing Sound De-Focused - Too Close Focused on Die De-Focused - Too Far Away Amplitude = 42% Time =10.5 us Amplitude = 82% Time = 14.5 us Amplitude = 55% Time = 18.5 us Copyright Sonix, Inc

Practical Application Digital Oscilloscope Front Surface Follower Data Gates Copyright Sonix, Inc

Digital Oscilloscope Multiple Echoes Initial pulse 1st Echo 2nd Echo 3rd Echo The 1st set of echoes is the area of interest, gate placement will be on this group. Multiple Echoes Copyright Sonix, Inc

Highest Amplitude signal Gates Gates are used to collect information at desired interfaces within the sample. The gate is placed over the signal or signals of interest. The absolute value of the highest amplitude signal which breaks the gate threshold within the gated region is recorded. (Figure 1) If no signal breaks the gate threshold no data is recorded. (Figure 2) Signal amplitude can be increased or decreased by adjusting gain. Gate Threshold 1 Highest Amplitude signal 2 No data recorded Copyright Sonix, Inc

Practical Application Image Data Peak Amplitude Time of Flight (TOF) Phase Inversion Copyright Sonix, Inc

Peak Amplitude Peak amplitude imaging is used when defects result in changes in the amount or strength of ultrasound reflected. It is the most common type of imaging technique. Copyright Sonix, Inc

Signal height is measured in absolute value for Peak Amplitude images. 100 78 75 X1 50 25 Signal height is measured in absolute value for Peak Amplitude images. Amplitude 78% Copyright Sonix, Inc

Time Of Flight Time of Flight (TOF) imaging works by measuring changes in the time it take sound to reflect off a particular interface. Most commonly used to measure die tilting. Copyright Sonix, Inc

Time Of Flight 1 X2 X1 2 Time of Flight images provide a relative depth within a sample. Structures which appear white or light gray are closer to the surface of the sample. Structures which appear darker shades of gray or black are deeper within sample. The peak signal for location 1 occurs at 14.2 microseconds (light gray) while the peak signal for location 2 occurs at 14.6 microseconds (dark gray). Copyright Sonix, Inc

Peak Amplitude vs. TOF Amplitude =73% Time =14.2 microseconds Time of Flight X2 X2 X1 X1 Amplitude =73% Time =14.2 microseconds Amplitude =67% Time =14.6 microseconds Copyright Sonix, Inc

Phase Inversion Phase Inversion imaging is used when defects cause changes in polarity (phase) of the signal. Most commonly used for top and back side imaging of plastic encapsulated devices. Do not use phase inversion imaging for flip chip, bonded wafer or die attach imaging. Copyright Sonix, Inc

Phase Inversion Normal Phase Inverted Copyright Sonix, Inc

Phase Gate X Sonix uses a proprietary algorithm to detect phase inversion. This method is independent of signal amplitude as long as the signal is not saturated (100% screen height). RED X Yellow X Copyright Sonix, Inc

Image Comparison & Correlation Through Transmission Peak Amplitude Image of Die Top Phase Inversion Image of Die Top Peak Amplitude Image of Die Attach Copyright Sonix, Inc