Essence Duality Awareness in Information System Interaction with Physical and Cyber Environments Yaniv Mordecai, Technion, Haifa, Israel Prof. Dov Dori, MIT, Cambridge MA, USA; Technion, Haifa, Israel

Primary Goal Provide formalism and semantics to understand, capture, and analyze Physical-Informatical Essence Duality (PIED), its occurrence, and its implications in system models. March th Industrial Engineering & Management Conference - IEM

Physical-Informatical Essence Duality (PIED) entity The existence of an entity as original-physical embodiment – the original-physical embodiment of the entity, and representational- informatical manifestation – the (set of) representational- informatical manifestation(s) of the entity, as held by agent(s) and sub- system(s) interacting with it. March th Industrial Engineering & Management Conference - IEM

Mirror Mirror on the Wall, Do you even detect me at all?! March th Industrial Engineering & Management Conference - IEM

Cyber-Physical Systems Systems that include a virtual segment and a physical segment – interwoven and interacting with each other. Informational processes affecting real-world occurrences – and vice-versa. Trying to accomplish virtual and physical goals alike. Modern information systems perceived as segments of larger-scale cyber-physical systems. Handling and control of assets, resources, and objectives – not only actors. Paradigm shift from “bubble” software systems to embedded software controlled systems. March th Industrial Engineering & Management Conference - IEM

Background The role of informatical manifestations of "real-world" entities – a fundamental challenge of Cybernetics and Informatics (Kolin 2010). Info—Data Duality (Bar-Hillel & Carnap 1953) Info—Matter (Hayles 1999) Epistemic Information (Mizzaro 2001) Open Software System Modeling (Hayes, Jackson & Jones, 2003) Physical—Cyber duality of the Natural world (Wang, Kinsner, and Zhang 2009) March th Industrial Engineering & Management Conference - IEM

Challenges in PIED Modeling Acknowledge PIED in cognitive processes. Describe the environment as perceived by the system. Capture extent of mutual system-environment effects. Knowledge base: What the system needs to know, thinks, knows, and thinks it knows. Model knowledge base effect on decisions, reactions, actions, and interactions. Capture and assess the potential damage of mismatched, incoherent agent conceptions on the real state of external entities to system performance. March th Industrial Engineering & Management Conference - IEM

Applicable Domains Cyber defense Cyber-medicine Ballistic Missile Defense Air Traffic Control Autonomous Vehicles Robotics Biological Systems And various other cyber-physical applications and risk- related settings. March th Industrial Engineering & Management Conference - IEM

Modeling Paradigms UML and SysML lack the means to capture PIED. – Actors ~ external (Use Case Diagrams) – Classes ~ internal (Class & Component diagrams) – Actors not associated with Classes. Subsystems rarely defined as actors of other subsystems. Assets, resources, and objectives have no representation as external entities (actors?!) March th Industrial Engineering & Management Conference - IEM

Use Case Diagram UML Issues March th Industrial Engineering & Management Conference - IEM Use Case Attributes Class Methods Actor Class Diagram

Sequence Diagrams – the hope for UML or part of the problem? March th Industrial Engineering & Management Conference - IEM

Object-Process Methodology (OPM) (Dori, 2002) (ISO PAS 19450) March th Industrial Engineering & Management Conference - IEM Object Object Exists states Has states Processes Modified by Processes Process Process Occurs Objects Modifies Objects

Object-Process Methodology A comprehensive systems engineering paradigm with a compact formal language for modeling, communicating, documenting, engineering, and lifecycle support of complex, multi-disciplinary systems. Based on simultaneous representation of structure (via stateful objects) and behavior (via processes) Bi-modal: the single model is expressed in both graphics and natural language text. March th Industrial Engineering & Management Conference - IEM

PIED-Aware Modeling Integrating PIED notions into system models. Inherent treatment of misconception anomalies and failures. Constant reconciliation of representations and comparison with the original. Representation-based system-entity interaction modeling. March th Industrial Engineering & Management Conference - IEM

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Subsystem-Entity Model-Based Interaction Systems interact with their environment. The environment consists of entities. The system consists of subsystems / agents. Subsystems interact with entities. Systems contain a model of the environment. The model consists of representations of environmental entities. Each subsystem has its own model of the environment March th Industrial Engineering & Management Conference - IEM

OPM – Structural Relations March th Industrial Engineering & Management Conference - IEM

Distinctive Properties for Dualistic Modeling March th Industrial Engineering & Management Conference - IEM Affiliation Affiliation denotes the entity as either original and environmental, or representational and systemic. Essence Essence denotes the entity as either physical or informatical.

OPM Procedural Links March th Industrial Engineering & Management Conference - IEM

Object-Process Oriented Epistemic Logic Formalism (1) E: entity. R(E): entity’s representation. X: recognition of existence. S: Perceived State. (2) (3) (4) (5) March th Industrial Engineering & Management Conference - IEM

PIED-Aware Modeling March th Industrial Engineering & Management Conference - IEM The five main processes: – Entity Acquisition – Representation Generating – Representation-Based Interaction – Outcomes Analysis – Representation Improvement

PIED-Aware Modeling March th Industrial Engineering & Management Conference - IEM

Summary PIED – Physical-Informatical Essence Duality. Challenges and Gaps in PIED Modeling. Applicable domains. OPM Semantics and Formalism for PIED Modeling. March th Industrial Engineering & Management Conference - IEM

Thanks! Yaniv Mordecai,