PLASMA DYNAMICS OF MICROWAVE EXCITED MICROPLASMAS IN A SUB-MILLIMETER CAVITY* Peng Tian a), Mark Denning b), Mehrnoosh Vahidpour, Randall Urdhal b) and.

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PLASMA DYNAMICS OF MICROWAVE EXCITED MICROPLASMAS IN A SUB-MILLIMETER CAVITY* Peng Tian a), Mark Denning b), Mehrnoosh Vahidpour, Randall Urdhal b) and Mark J. Kushner a) a) University of Michigan, Ann Arbor, MI USA b) Agilent Technologies, 5301 Stevens Creek Blvd, Santa Clara, CA MIPSE 2014, Ann Arbor, MI USA * Work supported by Agilent Technologies.

 Microplasma cavities  Description of model  Plasma dynamics in Ar  Pressure  Power  Plasma dynamics in Ne/Xe  Concluding Remarks AGENDA University of Michigan Institute for Plasma Science & Engr. MIPSE_2014 P.T.

MICROPLASMAS IN CAVITIES University of Michigan Institute for Plasma Science & Engr.  Microplasmas in cavities have a wide range of applications (e.g. ion/photon sources, display panels).  Excitation mechanisms and scaling laws are unclear. Ref: [1] H-J Lee, et al., J. Phys. D: Appl. Phys. 45 (2012) [2] K.S.Kim, Appl. Phys. Lett (2009) [3] Endre J. Szili, et al., Proc. SPIE 8204, Smart Nano-Micro Materials and Devices, 82042J (December 23, 2011); [1],[2] [3] MIPSE_2014 P.T.

 Rare gases and rare-gas mixtures with flow rates of 1-10 sccm through a structure ~ 2 mm wide with power of a few watts.  Confined structure enables operation at a few Torr while exhausting into near vacuum.  Microplasmas are used as VUV photon sources. LOW PRESSURE MICROPLASMA CAVITY University of Michigan Institute for Plasma Science & Engr. MIPSE_2014 P.T.

MICROPLASMA GEOMETRY  Microwave capacitively coupled plasma in a long microplasma cavity (side view)  Quartz coated electrodes.  In diffusion region, side walls are covered by dielectric.  Base Condition:  Ar, 4 Torr, 1 sccm  2.5 GHz CW power, 2 W.  Cavity width: 2 mm University of Michigan Institute for Plasma Science & Engr. CavityDiffusion RegionOrifice MIPSE_2014 P.T.

University of Michigan Institute for Plasma Science & Engr.  The Hybrid Plasma Equipment Model (HPEM) is a modular simulator that combines fluid and kinetic approaches.  Radiation transport is addressed using a spectrally resolved Monte Carlo simulation. Surface Chemistry Module HYBRID PLASMA EQUIPMENT MODEL MIPSE_2014 P.T.

 Argon Species:  Ar(3s), Ar( 1 s 2,3,4,5 ), Ar(4p), Ar(4d), Ar +, Ar 2 +, e  Electron impact excitation and super-elastic collisions between all levels.  Radiation transport for Ar( 1 s 2 ) (106 nm), Ar( 1 s 4 ) (105 nm) and Ar 2 * (121 nm). ATOMIC MODEL FOR AR University of Michigan Institute for Plasma Science & Engr. Ar(4p) Ar( 1 s 3 ) Ar + Ar( 1 s 2 ) Ar( 1 s 5 ) Ar( 1 s 4 ) Ar(3s) = 105, 106 nm Ar(4d) MIPSE_2014 P.T.

BASE CASE – e, T e, Ar( 1 s 4 ) University of Michigan Institute for Plasma Science & Engr.  Plasma density reaches cm -3, resonant state density is twice the plasma density. The plasma expands to cover the electrode, behaves like ‘normal glow’.  High energy, long mean free path electrons escape the bulk plasma in axial direction.  Ar, 4 Torr, 1 sccm, 2 W, 2.5 GHz. MIPSE_2014 P.T. Min Max

BASE CASE – IONIZATION University of Michigan Institute for Plasma Science & Engr.  Major ionization source is from bulk electrons, with the assistance of ionization by sheath accelerated secondary electrons.  Photo-ionization is considerable lower (3 orders lower than beam ionization)  Ionization is most intense at the two ends of plasma. MIPSE_2014 P.T. Min Max

BASE CASE – POWER, E-FIELD, CHARGE University of Michigan Institute for Plasma Science & Engr.  Power deposition is dominantly at sheath edge.  Electrode covering dielectric charges to produce dc bias.  Ambipolar-like electric field in the axial direction confines plasma. Charging of dielectric beyond the edge of the plasma is non- ambipolar drift of electrons. MIPSE_2014 P.T. –– + Min Max

BASE CASE – INITIAL CONDITION University of Michigan Institute for Plasma Science & Engr.  If the electrons are seeded at different position, plasma will start expansion from there.  Expansion will stop when plasma receives enough current from the dielectric to dissipate the power. Plasma will not fill the cavity at low power. MIPSE_2014 P.T. Min Max

POWER – ELECTRON DENSITY University of Michigan Institute for Plasma Science & Engr.  With increased power, plasma expands to the full length of cavity.  Plasma is confined in physical boundaries of cavity with further increase in power. 1 W ~ 12 W. MIPSE_2014 P.T. Min Max

POWER – PHOTON FLUX University of Michigan Institute for Plasma Science & Engr.  Viewing angle for photons gets larger at high as plasma approaches orifice, producing more divergence flux.  Photon power increases and saturates as input power increases, producing a decrease in efficiency.  Photon efficiency from % in Ar. MIPSE_2014 P.T. Min Max

POWER – PHOTON FLUX University of Michigan Institute for Plasma Science & Engr. MIPSE_2014 P.T. Min Max  Viewing angle for photons gets larger at high as plasma approaches orifice, producing more divergence flux.  Photon power increases and saturates as input power increases, producing a decrease in efficiency.  Photon efficiency from % in Ar.

ORIFICE SIZE – ESCAPING PLASMA University of Michigan Institute for Plasma Science & Engr.  By enlarging the orifice, the plasma eventually escapes at high power. MIPSE_2014 P.T. Min Max

ORIFICE SIZE – POWER, E-FIELD University of Michigan Institute for Plasma Science & Engr.  Power deposition is focused at the orifice and edge of electrode once the plasma escapes and forms a plume. MIPSE_2014 P.T. Min Max

ORIFICE SIZE – VUV PHOTON FLUX University of Michigan Institute for Plasma Science & Engr.  VUV photon flux to observation plane increases with increasing orifice size, particularly when plume is formed.  VUV flux is not “useful” because it is highly divergent.  Efficiency increased up to 0.1 %. MIPSE_2014 P.T. Min Max

PRESSURE – ELECTRON DENSITY University of Michigan Institute for Plasma Science & Engr.  Plasma tends to be more confined at high pressure with fixed power. Current density increases with pressure, like a normal glow.  Ar, 1 W, 2.5 GHz. 0.5 – 20 Torr. MIPSE_2014 P.T. Min Max

PRESSURE – IONIZATION University of Michigan Institute for Plasma Science & Engr.  E-beam ionization is less efficient and more uniform at low pressure, due to a longer MFP for higher energy electrons.  E-beam ionization is limited close to the surfaces at high pressure. MIPSE_2014 P.T. Min Max

PRESSURE – PHOTON FLUX University of Michigan Institute for Plasma Science & Engr.  Photon power to observation plane peaks at 5 Torr.  Resonant state is increasingly quenched while flux becomes more collimated  Efficiency is still low from %. MIPSE_2014 P.T. Min Max

University of Michigan Institute for Plasma Science & Engr. Ne/Xe MIXTURE - REACTIONS Reaction Mechanism: (‘M’ is Ne or Xe) E-Impact and Recombination e + M  M* + e, e + M  M + + 2e e + M*  M + + 2e, e + M +  M* Spontaneous Emission M*  M + hv Penning Ionization, Charge exchange Ne* + Xe  Ne + Xe +, Ne + + Xe  Ne + Xe + M* + M*  M + + M Photo-Ionization hv + M  M + + e, hv + M*  M + + e Dimer Reaction M* + M +M  M 2 * + M, e + M 2 *  M e e + M 2 +  M* + M, M M  M + + 2M  Penning mixture of Ne/Xe, 4 Torr  Xenon Species:  Xe(1s 4 ), Xe(1s 3 ), Xe(1s 2 ), Xe(2p 10 ), Xe(3d 6 ), Xe(2s 5 ), Xe(3 p ), Xe 2 *, Xe +, Xe 2 +  Neon Species:  Ne(1s 2-5 ), Ne(2p), Ne 2 *, Ne +, Ne 2 +,  Photon Species:  147 nm – Xe(1s 4 ) 121 nm – Xe(1s 2 ) 173 nm – Xe 2 * 74 nm – Ne(1s 2,4 ) 84 nm – Ne 2 * MIPSE_2014 P.T.

Ne/Xe MIXTURE – ELECTRON DENSITY University of Michigan Institute for Plasma Science & Engr.  Ne/Xe=80/20, 4 Torr, 1W.  Plasma density is higher and fills cavity with Ne/Xe mixture. Penning reactions are playing an important role in expansion. MIPSE_2014 P.T. Min Max

Ne/Xe MIXTURE – Ne +, Xe +,Ne( 1 s 2,4 ),Xe( 1 s 4 ) University of Michigan Institute for Plasma Science & Engr.  Xe excited states are 3 orders of magnitude larger than for Ne.  Ne/Xe=80/20, 4 Torr, 1W, 1sccm. MIPSE_2014 P.T. Min Max

Ne/Xe MIXTURE – PHOTON FLUX University of Michigan Institute for Plasma Science & Engr.  Photon flux is dominantly due Xe due to its lower resonant energy. Ne emission is over 4 orders lower.  Photon fluxes are more efficiently generated in penning mixture. Efficiency is 5-10 times that of pure Ar. MIPSE_2014 P.T. Min Max

CONCLUDING REMARKS University of Michigan Institute for Plasma Science & Engr. MIPSE_2014 P.T.  A microwave excited micro-cavity microplasma has been computationally investigated.  Pure Ar plasmas operate in a normal-glow like mode, confined in a fraction of cavity volume when power is low.  With increasing power, plasma will expand and fill the cavity. When the orifice size is large enough at certain power, plasma will escape and form a plume.  Ar photon output efficiency is typically low, from 0.01 – 0.03 %.  Ne/Xe mixtures will increase the plasma density due to Penning reactions.  Ne/Xe VUV output efficiency is 5 – 10 times higher than that of Ar, from 0.05 – 0.5 %.

BACKUP SLIDES

 Electron Energy Distributions – Electron Monte Carlo Simulation  Phase dependent electrostatic fields  Phase dependent electromagnetic fields  Electron-electron collisions using particle-mesh algorithm  Phase resolved electron currents computed for wave equation solution.  Captures long-mean-free path and anomalous behavior.  Separate calculations for bulk and beam (secondary electrons) HPEM-EQUATIONS SOLVED -

PRESSURE – E FIELD University of Michigan Institute for Plasma Science & Engr.  Higher the pressure, more confined the plasma is. MIPSE_2014 P.T.