12th International Workshop on Piezoresponse Force Microscopy (PFM): Theory, Techniques, and Applications Achievement Significance Details Multiple breakthroughs.

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12th International Workshop on Piezoresponse Force Microscopy (PFM): Theory, Techniques, and Applications Achievement Significance Details Multiple breakthroughs in practice and theory of PFM have recently been achieved in research groups worldwide. The CNMS has led an international workshop as a forum and a development platform for these developments. This workshop provided an in- depth description of recent advances in PFM and offered laboratory demonstrations designed for advanced practitioners. Ultimately, the workshop built a network of PFM specialists and promoted rapid dissemination of theoretical knowledge, experimental protocols, and novel technique development. With the rapid technological development and growing interdisciplinary use of atomic force microscopy, intradisciplinary idea exchange is vital. Meetings like the PFM workshop serve as a beacon for students and PIs to explore theoretical and practical solutions to their scientific problems, along with providing fertile ground for starting and strengthening collaborations which continue through our user program. This workshop was comprised of seminars by discipline experts focusing on principles, cantilever dynamics, contact dynamics, resolution theory and data interpretation. Discussions were coupled with hands on lab demonstrations, including vector PFM, high-frequency PFM, band-excitation and dual frequency resonance tracking imaging, switching spectroscopy PFM and PFM in liquids and vacuum. Applications of PFM for domain imaging, nucleation center mapping, and polarization dynamics in thin films and capacitor structures in ferroelectrics along with electromechanical probing of biological materials, electroactive polymers, and soft- condensed matter were described, demonstrated and discussed.