2013.03.18 Reporter: PCLee. Assertions in silicon help post-silicon debug by providing observability of internal properties within a system which are.

Slides:



Advertisements
Similar presentations
Presenter : Shao-Chieh Hou VLSI Design, Automation and Test, VLSI-DAT 2007.
Advertisements

Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 31/22alt1 Lecture 31 System Test (Lecture 22alt in the Alternative Sequence) n Definition n Functional.
Apr. 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 311 Lecture 31 System Test n Definition n Functional test n Diagnostic test  Fault dictionary  Diagnostic.
EXTERNAL COMMUNICATIONS DESIGNING AN EXTERNAL 3 BYTE INTERFACE Mark Neil - Microprocessor Course 1 External Memory & I/O.
Presenter: PCLee VLSI Design, Automatic and Test, (VLSI-TSA-DAT).
Chapter 10 Input/Output Organization. Connections between a CPU and an I/O device Types of bus (Figure 10.1) –Address bus –Data bus –Control bus.
Reporter :LYWang We propose a multimedia SoC platform with a crossbar on-chip bus which can reduce the bottleneck of on-chip communication.
1/1/ / faculty of Electrical Engineering eindhoven university of technology Architectures of Digital Information Systems Part 1: Interrupts and DMA dr.ir.
I/O Unit.
Feng-Xiang Huang 2015/5/4 International Symposium Quality Electronic Design (ISQED), th M. H Neishaburi, Zeljko Zilic, McGill University, Quebec.
Programming Types of Testing.
CS-334: Computer Architecture
1 Architectural Complexity: Opening the Black Box Methods for Exposing Internal Functionality of Complex Single and Multiple Processor Systems EECC-756.
FIU Chapter 7: Input/Output Jerome Crooks Panyawat Chiamprasert
Presenter: PCLee – This paper outlines the MBAC tool for the generation of assertion checkers in hardware. We begin with a high-level presentation.
Reporter:PCLee With a significant increase in the design complexity of cores and associated communication among them, post-silicon validation.
Feng-Xiang Huang MCORE Architecture implements Real-Time Debug Port based on Nexus Consortium Specification David Ruimy Gonzales Senior Member of Technical.
Hyunbean Yi, Sungju Park, and Sandip Kundu, Fellow, IEEE IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I : REGULAR PAPERS, VOL. 57, NO. 7, JULY 2010 Reporter:
Interrupts What is an interrupt? What does an interrupt do to the “flow of control” Interrupts used to overlap computation & I/O – Examples would be console.
Feng-Xiang Huang A Low-Cost SOC Debug Platform Based on On-Chip Test Architectures.
1 Presenter: Chien-Chih Chen. 2 An Assertion Library for On- Chip White-Box Verification at Run-Time On-Chip Verification of NoCs Using Assertion Processors.
Behavioral Design Outline –Design Specification –Behavioral Design –Behavioral Specification –Hardware Description Languages –Behavioral Simulation –Behavioral.
1 Multi-Core Debug Platform for NoC-Based Systems Shan Tang and Qiang Xu EDA&Testing Laboratory.
Presenter: Jyun-Yan Li Multiprocessor System-on-Chip Profiling Architecture: Design and Implementation Po-Hui Chen, Chung-Ta King, Yuan-Ying Chang, Shau-Yin.
1 Design For Debug Using DAFCA system Gadi Glikberg 15/6/06.
Spring 07, Jan 25 ELEC 7770: Advanced VLSI Design (Agrawal) 1 ELEC 7770 Advanced VLSI Design Spring 2007 VLSI System DFT Vishwani D. Agrawal James J. Danaher.
1-1 Embedded Software Development Tools and Processes Hardware & Software Hardware – Host development system Software – Compilers, simulators etc. Target.
Presenter: PCLee Design Automation Conference, ASP-DAC '07. Asia and South Pacific.
Fundamentals of Simulation-Based Verification 1.Structure of a Testbench - stimulus, checkers, etc. 2.Observation and Assertions - automatic checking of.
Feng-Xiang Huang A Design-for-Debug (DfD) for NoC-based SoC Debugging via NoC Hyunbean Yi 1, Sungju Park 2, and Sandip Kundu 1 1 Department of Electrical.
Group 7 Jhonathan Briceño Reginal Etienne Christian Kruger Felix Martinez Dane Minott Immer S Rivera Ander Sahonero.
1 EE 587 SoC Design & Test Partha Pande School of EECS Washington State University
Cortex-M3 Debugging System
Presenter : Shao-Cheih Hou Sight count : 11 ASPDAC ‘08.
Secure Embedded Processing through Hardware-assisted Run-time Monitoring Zubin Kumar.
Input/Output. Input/Output Problems Wide variety of peripherals —Delivering different amounts of data —At different speeds —In different formats All slower.
Chapter 10: Input / Output Devices Dr Mohamed Menacer Taibah University
MICROPROCESSOR INPUT/OUTPUT
Presenter: Hong-Wei Zhuang On-Chip SOC Test Platform Design Based on IEEE 1500 Standard Very Large Scale Integration (VLSI) Systems, IEEE Transactions.
Presenter : Ching-Hua Huang 2013/9/16 Visibility Enhancement for Silicon Debug Cited count : 62 Yu-Chin Hsu; Furshing Tsai; Wells Jong; Ying-Tsai Chang.
Top Level View of Computer Function and Interconnection.
Computer Architecture Lecture10: Input/output devices Piotr Bilski.
Presenter : Ching-Hua Huang 2013/7/15 A Unified Methodology for Pre-Silicon Verification and Post-Silicon Validation Citation : 15 Adir, A., Copty, S.
Using Formal Verification to Exhaustively Verify SoC Assemblies by Mark Handover Kenny Ranerup Applications Engineer ASIC Consultant Mentor Graphics Corp.
Reporter: PCLee. Although assertions are a great tool for aiding debugging in the design and implementation verification stages, their use.
Reporter :PCLee The decisions on when to acquire debug data during post-silicon validation are determined by trigger events that are programmed.
Presenter: PCLee Post-silicon validation is used to identify design errors in silicon. Its main limitation is real-time observability of the.
Dr Mohamed Menacer College of Computer Science and Engineering Taibah University CE-321: Computer.
Presenter: PCLee. Semiconductor manufacturers aim at delivering high-quality new devices within shorter times in order to gain market shares.
Test and Test Equipment Joshua Lottich CMPE /23/05.
Preeti Ranjan Panda, Anant Vishnoi, and M. Balakrishnan Proceedings of the IEEE 18th VLSI System on Chip Conference (VLSI-SoC 2010) Sept Presenter:
Feng-Xiang Huang Test Symposium(ETS), th IEEE European Ko, Ho Fai; Nicolici, Nicola; Department of Electrical and Computer Engineering,
25 April 2000 SEESCOASEESCOA STWW - Programma Evaluation of on-chip debugging techniques Deliverable D5.1 Michiel Ronsse.
ATtiny23131 A SEMINAR ON AVR MICROCONTROLLER ATtiny2313.
- 1 - ©2009 Jasper Design Automation ©2009 Jasper Design Automation JasperGold for Targeted ROI JasperGold solutions portfolio delivers competitive.
This material exempt per Department of Commerce license exception TSU Xilinx On-Chip Debug.
1 Copyright  2001 Pao-Ann Hsiung SW HW Module Outline l Introduction l Unified HW/SW Representations l HW/SW Partitioning Techniques l Integrated HW/SW.
Presenter: Shao-Chieh Hou International Database Engineering & Application Symposium (IDEAS’05)
Presenter : Shao-Chieh Hou 2012/8/27 Second ACM/IEEE International Symposium on Networks-on-Chip IEEE computer society.
Input/Output Problems Wide variety of peripherals —Delivering different amounts of data —At different speeds —In different formats All slower than CPU.
IT3002 Computer Architecture
Lecture 4 General-Purpose Input/Output NCHUEE 720A Lab Prof. Jichiang Tsai.
1 Device Controller I/O units typically consist of A mechanical component: the device itself An electronic component: the device controller or adapter.
Chapter 6 Input/Output Organization
Presentation transcript:

Reporter: PCLee

Assertions in silicon help post-silicon debug by providing observability of internal properties within a system which are otherwise hard to observe. Besides generating synthesizable assertions, they also need to be integrated in a design. In this paper we have shown how hardware assertions can be integrated in existing on-chip debug infrastructures, i.e., in a scan-based run-stop debug infrastructure and in a debug trace infrastructure. Experimental results on an industrial test SoC show that assertion based bus protocol checkers can be integrated with less than 1% additional area cost, including both the hardware assertions and the additional logic required to integrate the assertions in the SoC.

What’s the problem:  Today’s SoC integrate more elements than before. It makes SoC becomes more complex.  Add additional design, debug support in such a complex architecture will cause more area cost. Proposed method:  How hardware assertions can be integrated in existing on-chip debug infrastructure. 。 Scan-based infrastructure 。 Trace-based infrastructure

[14-16]: Public literature. Integrate assertion processor together on a single chip. [14-16]: Public literature. Integrate assertion processor together on a single chip. Lack of detail about how to access and configure these processors. [18-21]: Commercial tool. Automate integrate assertion circuits on chip. [18-21]: Commercial tool. Automate integrate assertion circuits on chip. Dont disclose their internal work. This paper

Scan-based infrastructure:  On-chip debug events come from hardware or software breakpoints.  Off-chip debug events come from external debugger via IEEE  Hardware breakpoints is not known at design time. Stop conditions will be programmed using a debugging tool. (cost higher area) Integrate assertions in this architecture:  Assertions act as a stop event.  For more flexibility, enable and disable mechanism is needed.  The property is known at design time. (hard-coded to minimize area cost) Assertion checker enabling strategy  One assertion, one register.(cost high)  Enable or disable all assertion.(not flexible)  Groups of assertions. (trade-off between flexibility and area cost)

Two types of result of assertion:  Errors: Treat as hardware breakpoints.  Warnings: Don’t stop system, just record in debug status register. Disadvantage :  Scanning out the serial debug status register is slow.  Multiple violations of the same assertion will not be detected. The assertion should raise until debug register capture this signal.

Debug trace infrastructure:  Trace signal for more observability.  Store in trace memory or dump via UART port immediately. Integrate assertions in this architecture:  Record result of assertions in debug trace module.  The amount of assertion data that can be output for each cycle is limited. 。 Number of assertion is grater than number of output bit  The size of result is limited.

Assertion fire signal m bit Example: Priority strategy

Group k assertions into s sets. Advantages:  Multiple violating assertions are clear.

Checking target  Assertions for local properties that have been fully verified do not need to put in hardware.  Only global properties assertions are needed. Bus protocol checker for experiment is described by PSL language. And translate them into RTL by MBAC. The assertion support logic(RTL) is also ready.  AXI bus – 85 assertions  MTL bus - 25 assertions  OCP bus – 60 assertions Addition area = all assertions + assertion support logic Use both scan-based and trace-based infrastructure.

The reason for AXI assertions area increase rapidly is because of 2 of 85 assertions need more detail for checking.

Communication Bus: AXI and MTL Gate count table of AXI, AXI* and MTL bus protocol checker gate counts gate counts 80% reduce

Area of scan-based infrastructure:  14 debug control register – 257 GE  770 debug status register – GE  756 debug status register – GE (without 2 complex assertions) Area of assertion support logic: (ub: unused bit, k: # of a set, s: set) Total area cost: Total area of EN-II is 10M Ges:  The ratio of assertion checker is 3.03% and 0.76% separately. 76% reduction

This paper’s conclusion:  This paper shown how hardware assertions can integrate into existing debug infrastructure.  In scan-based architecture, IEEE TAP controller can be used to control assertions, capture results and stop system.  In trace infrastructure, problem of embedding assertions into debug trace module have solved by dynamic converter.  The additional hardware cost is low.(3.03% for all. 0.76% for omitting 2 assertions.) My conclusion:  This paper proposes method about how to integrate assertions in SoC.  Make trade-off between area cost and observability of dynamic selection can be referenced.