13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres1 Pixel integrated stave concepts Valencia 2007 SLHC workshop.

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Presentation transcript:

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres1 Pixel integrated stave concepts Valencia 2007 SLHC workshop

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres2 Introduction We now have modules on staves, how is the integrated stave approach different? What are the schemes that have been proposed? –Common requirements for the active elements How much material or CHF can be saved?

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres3 Module on stave vs. integrated stave Present modules are fully functional detectors complete with control chip and cable Present stave is purely mechanical In an integrated stave approach electrical services are combined with the mechanics, and what is loaded on this is not a stand-alone item. Consensus emerging to move control functions to end of stave (stave control chip) and to load “bare modules” (all silicon flip chip assemblies on stave).

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres4 88mm 37.5mm 24.4mm SCC powerSCC data Examples from BL workshop SP stave example (not maximally integrated) Fully integrated stave Monolithic structure

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres5 Single chip vs. multi-chip bare module 3D sensor processing has introduced the possibility of active edges as a natural byproduct. –But active edges can also be implemented on planar sensors If active edges are used, multi-flip chip assembly is an unnecessary complication at non-trivial added cost –There is no acceptance to be gained by using a big sensor tile vs. smaller active edge tiles –Sensor production and flip chip are cheaper for single-chip assemblies than multi-chip assemblies, if nothing else because the yield is higher in both cases.

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres6 Shingling along Z Mechanical structures proposed at BL workshop all showed flat surfaces (maybe not intended as final, but nevertheless)=> no shingling along Z This helps thermal performance and manufacturability Active edges (or 2-sided staves) are required to avoid shingling and preserve full acceptance.

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres7 Assembly flow simplification Wafer probe Bump deposition, Thin and dice Chip probe/select 16-to-1 Flip chip Bare module probe Module assembly Module full test Stave/sector test Stave/sector assembly rework NOW SIMPLER wafer probe 1-to-1 flip-chip SC module full probe Stave/sector assembly Stave/sector test Higher level of integration at IC stage: no separate “module control chip” More standard and higher yield 1 to 1 bump bonding: no need for ultra high KGD yield. Bump deposition, Thin and dice Toss bad ones

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres8 Outer layers 3-D sensors and therefore active edges apply naturally to B-Layer But many advantages of active edges are more important for outer layers, where cost is critical: –Cost savings from using single chip modules and no shingling –Simplified assembly flow (faster and cheaper) Integrated stave using SC modules is therefore a good model for entire detector –Readout modularity needs to be studied for outer layers. Full development of active edges even for planar sensors in important for pixel upgrade!

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres9 The integrated stave conceptual parts (examples can be replaced by equivalent function) Signal cable with 24 flaps before lamination. Could also be multiple cables. End of stave card could be built-in Stave controller chip goes here Al power planes added to signal cable. May contain DC-DC converters at a few points, or serial power taps. Mechanical support with cooling. Combine all the above and test. Then add SC modules. Tab wraps around and is w-bonded to SC module

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres10 End of stave card I/O 24 40MHz clock 40MHz clock bar 40MHz command 40MHz command bar 160MHz data 160MHz data bar Clock fanout End of stave card Traces on flex~15m miniature coax to PP2 40MHz clock 1GHz command 2GHz data LV power (eg) command De-serializer 2 Data serializers Power at “HV” DC-DC 4-12 HV bias groups 4-12 HV bias groups 3 Muxed NTCs Twisted pairs NTC mux

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres11 NTCs for independent monitoring AND safety A interlock V DCS next Mux Sense IC NTC1 NTC2 NTC3 NTCn     

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres12 Material savings Items no longer used: –Module control chip –Module pigtail connectors –Shingled carbon surface Lighter items –Power conductors Less massive if SP or DC-DC Or could tolerate larger Vdrop if DCDC placed at ends of stave. –Mechanical structure See mechanics pixel talk Thu. New developments not central to integrated stave New items needed –DC-DC (unless placed only at ends) or SP signal level shifters & control. Want even more reductions? –See monolithic structures tomorrow.

13 Dec. 2007Switched Capacitor DCDC Update --- M. Garcia-Sciveres13 Conclusion Many ideas, but prototyping is needed to understand details. Good start on mechanical items (see tomorrow) Not much done on passive electrical components.