Presenter: Hong-Wei Zhuang On-Chip SOC Test Platform Design Based on IEEE 1500 Standard Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (Volume:18, Issue: 7 ) Kuen-Jong Lee, Tong-Yu Hsieh, Ching-Yao Chang,Yu-Ting Hong, and Wen-Cheng Huang

IEEE 1500 Standard defines a standard test interface for embedded cores of a system-on-a-chip (SOC) to simplify the test problems. In this paper we present a systematic method to employ this standard in a SOC test platform so as to carry out on-chip at-speed testing for embedded SOC cores without using expensive external automatic test equipment. The cores that can be handled include scan-based logic cores, BIST based memory cores, BIST-based mixed-signal devices, and hierarchical cores. All required test control signals for these cores can be generated on-chip by a single centralized test access mechanism (TAM) controller. These control signals along with test data formatted in a single buffer are transferred to the cores via a dedicated test bus, which facilitates parallel core testing. 2

A number of design techniques, including on-chip comparison, direct memory access, hierarchical core test architecture, and hierarchical test bus design, are also employed to enhance the efficiency of the test platform. A sample SOC equipped with the test platform has been designed. Experimental results on both FPGA prototyping and real chip implementation confirm that the test platform can efficiently execute all test procedures and effectively identify potential defect(s) in the target circuit(s). 3

As SOC designs become more and more complex, requirements for ATE to accurately and efficiently test various types of cores have drastically increased the SOC test cost. external automatic test equipment (ATE)  provide test stimuli as well as collect test responses through chip I/O pins 4

5 using pure software [7] using pure software [7] On-Chip SOC Test Platform Design Based on IEEE 1500 Standard On-Chip SOC Test Platform Design Based on IEEE 1500 Standard usually difficult to achieve high fault converge require extensive use of external automatic test equipment (ATE) [4],[5],[6] require extensive use of external automatic test equipment (ATE) [4],[5],[6] increased the SOC test cost using software together with some extra hardware [8-10] using software together with some extra hardware [8-10] core is wrapped by an IEEE 1500 wrapper [10] core is wrapped by an IEEE 1500 wrapper [10]

PROPOSED SOC TEST PLATFORM  TAMC : a test access mechanism controller  TAPC : a test access port controller (TAPC) for each 1500 core 6

test platform generates a set of control signals that can be shared by and 1500 standards so as to reduce the extra area overhead. test bus can be specially configured in a multiple-level hierarchy so as to reduce the loading of the test bus. TAMC provides a parallel-to-serial mechanism to deliver test patterns from memory to scan chains of cores and a serial-to- parallel mechanism to transfer the test results from the cores to the TAMC 7

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Control Unit  TAMC according to the setup information provided by the embedded processor and issues proper signals for test control. Memory Access Unit  This unit generates the addresses for the memory to be accessed via a number of counters Wrapper Control Unit  This unit generates the control signals for each wrapper according to the setup information stored in the internal data registers of the TAMC. Comparator  An XOR-based comparator is designated to verify test results in TAMC Shift Buffers  Due to the format difference between the data obtained 。 parallel-in-serial-out operations for test pattern application 。 serial-in-parallel-out operations for test response collection 9

Scan-Based Testing Hierarchical Testing Memory BIST 10

Area overhead Test time Compare with other methods 11

The wrappers require 3.721% of the processor and core The test platform requires additional 1.384% 12

All test operations are completed with test cycles, which is only approximately s when the system clock runs at 80 MHz 13

at-speed testing is achieved no extra test pins are required no signal distortion problem exists through chip I/O pins the requirement of external ATE is minimized carry out all core test procedures test control signals can be generated on-chip test buffers can be shared by all cores Hierarchical core testing can be supported test bus loading problem can be resolved both static and dynamic parameter analyses for analog or mixed-signal devices can be done on-chip. 14

This paper help me known that SOC test platform We can faster to test on chip SOC than before 15