Pt/PNZT/Pt Data using Precision Premier Piezoelectric Displacement Results of Measuring Pt/PNZT/Pt Capacitor on Seiko Instruments SPA400 AFM. Radiant Technologies,

Slides:



Advertisements
Similar presentations
The Important Thing About By. The Important Thing About ******** The important thing about ***** is *****. It is true s/he can *****, *****, and *****.
Advertisements

Measuring Magnetoelectric Strain
Piezoelectric Characterization in an AFM Joe T. Evans, Jr, Radiant Technologies, Inc.
Ion beam assisted deposition of thin films on solid and nonrigid substrates I.S.Tashlykov, S.M.Baraishuk Belarusian State Pedagogical University,
Testing Ferroelectric and Piezoelectric Samples in an AFM Radiant Technologies, Inc April 22, 2004.
Characterizing Non-linear Materials Joe T. Evans, Radiant Technologies, Inc. January 16,
Dielectric Properties of Ceramic Thin Films Mara Howell Materials Science and Engineering Junior, Purdue University Professor Kvam, Research Advisor.
Electro-Ceramics Lab. Preparation and electrical properties of (Ba 1-x,Sr x )(Ti 1-y,Zr y )O 3 thin films for application at high density DRAM thin films.
Dielectric and Piezoelectric Properties of Epitaxial Ferroelectric Bilayers Alexei Y. Grigoriev, University of Tulsa, DMR Thermodynamic theory.
Ferroelectric Ceramics
nanocellulose for piezoelectric materials
Alloy Thin Films by Multi-Target Sputtering Karla L. Perez MSE/REU Final Presentation Adv. Prof. King and Prof. Dayananda August 5, 2004.
HIGH CYCLE FATIGUE DELAMINATION MEASUREMENT AND GROWTH PREDICTION
Instrumental Chemistry CHAPTER 5 SIGNALS AND NOISE.
Key Capacitor Specifications
3D Reflectometry Module for DHM Measurement of (semi-)transparent patterned depositions and liquids This module is unique in optical microscopy for 3D.
Some Applications of Ferroelectric Ceramics 1.Capacitors 2. Ferroelectric Thin Films 2.1 Ferroelectric Memories 2.2 Electro-Optic Applications Thin.
Statistics Chapter 9. Statistics Statistics, the collection, tabulation, analysis, interpretation, and presentation of numerical data, provide a viable.
Magneto-Electric Test Procedure A Charge-Based Magneto- Electric Test Procedure Scott P. Chapman & Joseph T. Evans, Jr. Radiant Technologies, Inc. Aug.
Introduction The traditional method for actuating microengineered structures using PZT has been to use bulk PZT bonded to the structure in question. Work.
Stamp deformation during nanopattern thermal imprinting on a double-curved substrate Jiri Cech a, Alexander Bruun Christiansen a, Rafael Josef Taboryski.
Creative Research Initiatives Seoul National University Center for Near-field Atom-Photon Technology Yongho Seo Wonho Jhe School of Physics and Center.
NANO 225 Micro/Nanofabrication Characterization: Scanning Probe Microscopy 1.
Femtosecond laser fabrication of metamaterials for high frequency devices Marian Zamfirescu *a), Razvan Dabu *, Marius Dumitru *, George Sajin **, Florea.
1 Class: Bio MEMS Components and System Teacher : Professor Hsu Name: Po Yuan Cheng ID: MA0R0204.
Develop (K 0.5 Na 0.5 )NbO 3 Lead-Free Ferroelectric Thin Films by the RF Sputtering Technique Hsiu-Hsien Su.
Electro-Ceramics Lab. Electrical Properties of SrBi 2 Ta 2 O 9 Thin Films Prepared by r.f. magnetron sputtering Electro-ceramics laboratory Department.
1 - 1 © 2001 Prentice-Hall, Inc. Statistics for Business and Economics Statistics, Data, & Statistical Thinking Chapter 1.
Tunable Passive Devices Keith Tang Supervisor: Sorin Voinigescu.
SNS COLLEGE OF ENGINEERING Department of ECE Subject RF AND MICROWAVE ENGINEERING Topic RF BASICS COMPONENTS Prepared By T.GAYATHRI AP/ECE.
Superconductor/Manganite Bilayer Thin Films in Cross Section Isaac Brown
… atomic force microscopy image of … Title: “ Sicily cell ” Submitted by: Author name Affiliation: Institute, city, country? Instrument: AFM XXXX Description:
Copyright © 2014 by Mosby, an imprint of Elsevier Inc.
Introduction to Quantitative Reasoning Unit 0 Applications of Advanced Mathematics.
Summary of presentation Introduction of the dissertation.
Absolute Displacement Calibration for Atomic Force Microscopy
Radiant Technologies, Inc. Ferroelectric Test & Technology
NVMTS 2012, Oct 31st – 2nd Nov, Singapore
Date of download: 10/23/2017 Copyright © ASME. All rights reserved.
Mr. Chandrahas D. Golghate
Chapter 25 Integrated Circuits.
Characterisation of the back-etched stack
Materials and Devices for Neural Systems and Interfaces
Scanning Probe Microscopy History
Agronomic Spatial Variability and Resolution
Binary Resonant Wings Joe Evans, Naomi Montross, Gerald Salazar
Radiant Technologies, Inc. March 29, 2018
Scanning Probe Microscopy History
Regression Computer Print Out
Cost of Test for Non-Linear Materials
Radiant Technologies, Inc. Ferroelectric Test & Technology
MICROPHONES Secondary transducer:
Agronomic Spatial Variability and Resolution
Chapter 3: Averages and Variation
Case Report Template: Your Title Can Go Here
Agronomic Spatial Variability and Resolution
Gauss's Law and Boundary Conditions

Dislocations in Thin Films of Ferroic Oxides
Case Report Template: Your Title Can Go Here
Atomic Force Microscope
Instrumental Chemistry
Case Report Template: Your Title Can Go Here
C.2.10 Sample Questions.
C.2.8 Sample Questions.
C.2.8 Sample Questions.
Fig. 2 CdS thin films with three different shapes.
Test Requirements for Commercial PiezoMEMS
Binary Resonant Wings Joe Evans, Naomi Montross, Gerald Salazar
PiezoMEMS Foundry to Support Research Projects
Presentation transcript:

Pt/PNZT/Pt Data using Precision Premier Piezoelectric Displacement Results of Measuring Pt/PNZT/Pt Capacitor on Seiko Instruments SPA400 AFM. Radiant Technologies, Inc. August 7, 2001

Pt/PNZT/Pt Data using Precision Premier Sample Description Capacitor Area:12µ x 12µ Construction: Pt/PNZT/Pt Composition:4/20/80 PNbZT PNZT Thickness:1µm

Pt/PNZT/Pt Data using Precision Premier Displacement at 40V Displacement measured at 40Vwith a measurement period of 1 second.

Pt/PNZT/Pt Data using Precision Premier Displacement at 40V Displacement loop averaged 10 times.

Pt/PNZT/Pt Data using Precision Premier Nested Displacement Loops Displacement measured at 40V, 30V, 20V, and 10V. Measurement period is 1 second.

Pt/PNZT/Pt Data using Precision Premier Conclusion Precision Premier integrates with the Seiko Instruments AFM family to collect displacement measurements of thin ferroelectric films. The 1µm thick Radiant 4/20/80 PNbZT film displaced 23Å at 40V giving the film a d 33 value of The measured value is the not the true d 33 value of the film due to strong clamping by the substrate. Piezoelectric fatigue, frequency response, and imprint can also be measured using the Vision software.