ECFA Meeting, Valencia – November 8, 20061 First TimePix tests at CERN David Attié ECFA Meeting – Valencia – 8 November 2006.

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Presentation transcript:

ECFA Meeting, Valencia – November 8, First TimePix tests at CERN David Attié ECFA Meeting – Valencia – 8 November 2006

ECFA Meeting, Valencia – November 8, Introduction TimePix Proposal: November develop - produceMedipix2  TimePix - test TimePix test at CERN ~ November 2006 Medipix2 TimePix

ECFA Meeting, Valencia – November 8, TimePix measurements * Chip design was submitted to foundry on the beginning of July * 12 wafers arrived at CERN 2nd week of September * Modifications in the Medipix readout system (~1 week): “Timepix-Medisoft” version of the software MUROS2 firmware updated (thanks to Hans Verkoojen, Nikhef) * Preliminary TimePix characterization has been done on-wafer using the Medipix2 probing card in the DSF clean room facility at CERN

ECFA Meeting, Valencia – November 8, Test procedures for TimePix * Alignment monitor (moving platform + microscope) to position the chip * Readout using probing bench + MUROS2  Classification (A, B, C, …) * Software used : Medisoft 4.x Analogic tests (ANIN) -TOT mode - MEDIPIX mode Digital tests using calibration of DACs * Check the current supply (~200 mA/chip) and ID chip

ECFA Meeting, Valencia – November 8, Test procedures for TimePix * Alignment monitor (moving platform + microscope) to position the chip * Readout using probing card of Medipix2 + MUROS2  Classification (A, B, C, …) * Software used : Medisoft 4.x Analogic tests (ANIN) -TOT mode - MEDIPIX mode Digital tests using calibration of DACs * Check the current supply (~200 mA/chip) and ID chip

ECFA Meeting, Valencia – November 8, ―PreampOut Pixel measurement From 2 special pixels at the bottom of the matrix we can measure: - preampOut - discOut - internal Ref_Clk - counter clock State Machine of the counter Modes (P0, P1) - Medipix (0, 0) - TOT(0, 1) - TimePix-1hit(1, 0) - TimePix(1, 1) work as expected in simulations No visible coupling of the Ref_Clk signal into the analog signals (preampOut and discOut) ―Thr ―Shutter ―discOut ―CounterClk TimePix-1hit mode (P0=0; P1=1) TOT mode (P0=1; P1=0) TimePix mode (P0=1; P1=0)

ECFA Meeting, Valencia – November 8, TimePix DACs Some DACs show a non-monotonic curve Non- Monotonic DACs are: - Preamp - Disc - BufferA - BufferB Problem may be related to the latching of the DACs register The midrange value (code =127) is always stable (1 complete wafer) These DACs are unchanged under normal operating conditions

ECFA Meeting, Valencia – November 8, TimePix chip classification Classification of a tested chip: Class A: no dead column Class B: 1 dead column Class C: 2 dead columns Class D: more than 2 dead columns Class E: bad DACs Class F: bad digital test, no communication, etc…  dead chip 14 mm

ECFA Meeting, Valencia – November 8, First TimePix test Wafer #14: A5FWQTX Tested by Xavier Llopart (CERN)

ECFA Meeting, Valencia – November 8, First TimePix test Wafer #15: AQFWTPX Tested by: - David Attié (CEA/Saclay) - Uwe Renz (Freiburg)

ECFA Meeting, Valencia – November 8, Future development Medipix2/ TimePix Micromegas + Mini-chamber SiTPC endplate + Large Prototype 55  m pixels Direct X-ray conversion selection of window in energy 13-bit counter per pixel no ExB effect good for 2-track separation high gain very fast electron signal on the anode plane very small ion feedback in the space cheap robust and easy to implement

ECFA Meeting, Valencia – November 8, Next steps First test of a Medipix2 + Micromegas in the gas Improve the gas mixture (“non-sparking” state) Medipix2  TimePix readout chip  LP endplate M. RIALLOT (DAPNIA/SEDI)

ECFA Meeting, Valencia – November 8, Metallic box of 24 cm x 14 cm x 6 cm size Box design M. RIALLOT (DAPNIA/SEDI)

ECFA Meeting, Valencia – November 8, Mini-chamber for the Medipix2/TimePix chip Field cage Box Micromegas mesh Medipix2 readout chip M. RIALLOT (DAPNIA/SEDI) Windows for X-rays source Windows for  source 6 cm 2.5 cm Design plan:

ECFA Meeting, Valencia – November 8, Conclusions * 2 wafers and half have been tested at CERN * ~ 50 % of class A ~ 20 % of class B ~ 30 % of class C/D/E/F * Test to be continued in the next weeks * First test beam in DESY right now with Medipix/TimePix * CEA/Nikhef: test in gas chamber in the next months with Medipix/TimePix NIKHEFMaximilien Chefdeville, Martin Fransen, Harry van der Graaf, Jan Timmermans, Jan Visschers é, CEA/Saclay/David Attié, Dan Burke DAPNIAPaul Colas, Arnoud Giganon, Yannis Giomataris Univ. Twente/Jurriaan Schmitz, Cora Salm, Mesa+ Victor Blanco Carballo, Sander Smits CERNMichael Campbell, Erik Heine Xavi Llopart Thanks to: Wim Gotink Joop Rovenkamp Marc Riallot