CMOS Image Sensor Design. M. Wäny Nov EMVA Standard 1288 Standard for Measurement and Presentation of Specifications for Machine Vision Sensors and Cameras

CMOS Image Sensor Design. M. Wäny Nov Agenda Motivation Goals Approach Current state & Outlook Brief presentation of first released module

CMOS Image Sensor Design. M. Wäny Nov Motivation EMVA Standardization Working Group launched in February 2004 Aim is to increase transparency of image sensor & camera specifications Existing standards from broadcasting industry not suitable for describing performance of image giving systems in machine vision applications Well-defined standards will increase transparency for customers, prevent unfair comparison of specification sheets, reduce support time, facilitate selection of the “right” camera or image sensor Increase credibility of the industry

CMOS Image Sensor Design. M. Wäny Nov Participating companies The standardization working group is open to all who constructively participate Apply for registration at or to

CMOS Image Sensor Design. M. Wäny Nov Goals Elaborate a recommendation for a specification parameter set with clearly defined physical definitions of each parameter Elaborate a measurement guideline for each of the recommended parameters Provide information for understanding the implication of the recommended parameters to the performance of machine vision systems and guidelines for conversion of the parameter to other definition systems

CMOS Image Sensor Design. M. Wäny Nov Approach Modular standard framework  New modules are to complete the standard rather than to replace previous versions Module 1 Sensitivity Quantum efficiency Dynamic range Spatial and temporal noise Over all system gain Module 2 Linearity Artifacts Defect pixels Module 3 Color Module X More to follow The modular approach protects investment in measurement equipment, processes and education

CMOS Image Sensor Design. M. Wäny Nov Current State First Module released in August 2005 Logo is available at Full Standard available at Companies “self certify” standard compliance First cameras characterized according to the standard at vision PCO: pco.1600; pco.2000; pco.4000 BASLER: A102f; A311f; A312f; A60xf; A631f; A641f

CMOS Image Sensor Design. M. Wäny Nov Content of the Standard Basic Information: This section delivers general information and information regarding the operation point at which data is acquired. Vendor name Model name Type of data presented: Typical; Guaranteed; Guaranteed over life time[1][1] Sensor type (CCD; CMOS; CID etc...) Sensor diagonal in [mm]; Indication of lens category to be used [inch] Resolution; Pixel size (width x height in [µm]) Readout type (CCD only) ; Transfer type (CCD only); Shutter type (CMOS only); Global; Rolling Overlap capabilities; (readout of frame n and exposure of frame n+1 can happen at the same time). Maximum frame rate at the given operation point. (no change of settings permitted) Others (Interface Type etc..)

CMOS Image Sensor Design. M. Wäny Nov Content of Module 1 Camera Mathematical Model Parameters Parameter Identification Description of Mathematical model

CMOS Image Sensor Design. M. Wäny Nov Content of Module 1 Continued Illumination Setup from Module 1  Homogenous illumination  Without lens  F-number 8  Definition of temperature measurements Measurement Setup

CMOS Image Sensor Design. M. Wäny Nov The photon transfer method Acquire series of images at increasing number of integrated photons (by variation of the integration time) Represent mean value and temporal noise over # photons Permits to determine each parameter independently [DN] [#p~] Image mean [DN] [#p~]  .tem p Content of Module 1 Continued

CMOS Image Sensor Design. M. Wäny Nov The photon transfer method Measured Quantities  Mean of the gray values (How much light generates how much signal)  Variance of the temporal distribution of the gray values (How much temporal noise do we have at what signal level)

CMOS Image Sensor Design. M. Wäny Nov The photon transfer method Derived Quantities  Overall system gain (Responsivity of the sensor/camera)  Total Quantum efficiency (QE including FF, glass ML etc..)  Full well capacity (How many electrons are needed for the saturation signal)  Absolute Sensitivity (How much light equals the read noise)  Dynamic input Range

CMOS Image Sensor Design. M. Wäny Nov The spectrogram method Compute and plot a row and column FFT of the image at 3 illuminations (dark; 50%saturation; 90% saturation) Extract spatial noise performance from spectrogram. Permits to get more insight in FPN and temporal noise performance then bare figures. Content of the Module 1 Continued

CMOS Image Sensor Design. M. Wäny Nov The spectrogram method Derived Quantities  Standard deviation of the spatial offset noise referenced to electrons in [e-]. (Total FPN at a given light level)  Standard deviation of the spatial gain noise in [%]. (Total gain noise “PRNU”)  Signal to Noise Ratio (SNR including all noise contributions)

CMOS Image Sensor Design. M. Wäny Nov Data Presentation Describe data presentation  Present all data in physical units  Refer data to photons  Present raw data and extracted parameters Permits the user to check matching of the model to the data and pick parameters relevant to their application

CMOS Image Sensor Design. M. Wäny Nov Thank you for your attention Current standard draft Join the working group: Acknowledgements: Dr. F. Dirks; Dr. G. Holst; All members of the 1288 Workinggroup Contact: Martin Wäny AWAIBA Lda. Madeira Technopolo Funchal Madeira /